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Generalization of the Lambertian Model,
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And:
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See also Visual Appearance of Matte Surfaces.
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9107
Earlier:
DARPA90(185-212).
An attempt to unify geometric and physical optical properties to
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AI(59), No. 1-2, January 1993, pp. 95-101.
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9301
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9111
Earlier:
Determining Reflectance Parameters Using Range and
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ICCV90(12-20).
IEEE DOI
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And:
CMU-CS-TR-90-106, February 1990.
Shading from Shape. Almost the inverse of the standard problem.
Recovery of reflectance from isolated object from a single image
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Sato, Y.,
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9611
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Earlier:
Reflectance Analysis for 3D Computer Graphics,
CMU-CS-TR-95-146, June 1995.
PS File.
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SIGGraph-97(379-388). August 1997.
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And:
MfR01(Chapter II-4).
120 color images and 12 range images to computer
Torrance-Sparrow (
See also Polarization, Direction Distribution, and Off-Specular Peak Phenomena in Light Reflected from Roughened Surfaces. ) parameters.
Recovered parameters for textured objects.
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3D Shape and Reflectance Morphing,
CMU-CS-TR-96-168, September 1996.
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9609
Sato, I.[Imari],
Sato, Y.[Yoichi],
Ikeuchi, K.[Katsushi],
Illumination from shadows,
PAMI(25), No. 3, March 2003, pp. 290-300.
IEEE DOI
0301
BibRef
Earlier:
Illumination Distribution from Shadows,
CVPR99(I: 306-312).
IEEE DOI
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And:
MfR01(Chapter II-7).
Illumination from radiance distribution in shadow cast by known object
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Sato, I.,
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Ikeuchi, K.,
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0110
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Sato, I.,
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Sato, Y.,
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PBMCV95(SESSION 6)
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PS File.
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9701
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Generation of Shading-off in Images by Extrapolation of
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GMIP(58), No. 4, July 1996, pp. 314-333.
9609
For rendering of shading images in graphics, Use Lipschitz functions
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Graphics.
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A
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9608
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PDF File.
9509
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9611
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9803
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Identification of Illuminant and Object Colors:
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9807
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Accurate Calculation of the Irradiance of Optical Images,
OptEng(37), No. 10, October 1998, pp. 2768-2771.
9810
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Improved Diffuse Reflection Models for Computer Vision,
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9810
Koenderink, J.J.[Jan J.],
van Doorn, A.J.[Andrea J.],
Dana, K.J.[Kristin J.],
Nayar, S.K.[Shree K.],
Bidirectional Reflection Distribution Function of Thoroughly Pitted
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9904
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Bidirectional Reflection Distribution Function Expressed
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Springer DOI Scattering characteristics of textured materials.
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Gong, P.,
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9909
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Separating Reflections and Lighting Using Independent Components
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CVPR99(I: 262-267).
IEEE DOI
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9900
Lucht, W.,
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0606
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PR(33), No. 1, January 2000, pp. 161-171.
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0005
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Kim, T.E.,
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ICIP97(III: 416-419).
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9700
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3-D shape recovery of hybrid reflectance surface using indirect diffuse
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ICIP95(II: 354-357).
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9510
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0105
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0201
Simultaneous recovery of multiple illuminants and albedo given known
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ECCV02(III: 163 ff.).
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Lambertian Reflectance and Linear Subspaces,
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IEEE DOI
0301
BibRef
Earlier:
ICCV01(II: 383-390).
IEEE DOI
0106
See also What Is the Set of Images of an Object Under All Possible Illumination Conditions. Set of all Lambertian functions with distant light souces lies close to a
9D linear subspace. So it can be approximated by a low dimensional linear
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Face recognition applications.
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atmospheric radiation
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Walthall, C.L.,
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Zhao, J.L.[Jia-Li],
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Elsevier DOI
0308
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Viggh, H.E.M.,
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RSE(88), No. 3, December 2003, pp. 221-232.
Elsevier DOI
0401
Bidirectional Reflectance Distribution Function (BDRF).
If a robust estimation is sought, the LMedS method can be adopted for
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di Girolamo, L.[Larry],
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0401
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Rautiainen, M.[Miina],
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0401
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Susaki, J.[Junichi],
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0401
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Osadchy, M.[Margarita],
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Efficient detection under varying illumination conditions and image
plane rotations,
CVIU(93), No. 3, March 2004, pp. 245-259.
Elsevier DOI
0402
BibRef
Earlier:
Image Detection Under Varying Illumination and Pose,
ICCV01(II: 668-673).
IEEE DOI
0106
Detect Lambertian objects. Model illumination variations from a
small set of training examples.
BibRef
Pont, S.C.[Sylvia C.],
Koenderink, J.J.[Jan J.],
Reflectance from locally glossy thoroughly pitted surfaces,
CVIU(98), No. 2, May 2005, pp. 211-222.
Elsevier DOI
0501
Reflectance is linear combination of specular and diffuse.
BibRef
Hara, K.[Kenji],
Nishino, K.[Ko],
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Light Source Position and Reflectance Estimation from a Single View
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IEEE Abstract.
0501
BibRef
Earlier:
Determining reflectance and light position from a single image without
distant illumination assumption,
ICCV03(560-567).
IEEE DOI
0311
See also Mixture of Spherical Distributions for Single-View Relighting.
BibRef
Lombardi, S.[Stephen],
Nishino, K.[Ko],
Reflectance and Illumination Recovery in the Wild,
PAMI(38), No. 1, January 2016, pp. 129-141.
IEEE DOI
1601
BibRef
Earlier:
Reflectance and Natural Illumination from a Single Image,
ECCV12(VI: 582-595).
Springer DOI
1210
Analytical models
BibRef
Hara, K.[Kenji],
Nishino, K.[Ko],
Ikeuchi, K.[Katsushi],
Mixture of Spherical Distributions for Single-View Relighting,
PAMI(30), No. 1, January 2008, pp. 25-35.
IEEE DOI
0711
See also Light Source Position and Reflectance Estimation from a Single View without the Distant Illumination Assumption. Estimating the illumination of a scene and the reflectance property
of an object from single view images.
BibRef
Hara, K.[Kenji],
Nishino, K.[Ko],
Variational estimation of inhomogeneous specular reflectance and
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JOSA-A(28), No. 2, February 2011, pp. 136-146.
WWW Link.
1102
BibRef
Earlier:
Illumination and spatially varying specular reflectance from a single
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CVPR09(619-626).
IEEE DOI
0906
BibRef
Kawakami, R.[Rei],
Tan, R.T.[Robby T.],
Ikeuchi, K.[Katsushi],
Estimate surface color from changing illumination,
CREST05(100-106).
WWW Link.
0505
BibRef
Ragheb, H.[Hossein],
Hancock, E.R.[Edwin R.],
Testing new variants of the Beckmann-Kirchhoff model against radiance
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CVIU(102), No. 2, May 2006, pp. 145-168.
Elsevier DOI
0605
BibRef
Earlier:
Surface radiance: empirical data against model predictions,
ICIP04(IV: 2689-2692).
IEEE DOI
0505
Kirchhoff scattering theory; Rough surface reflectance; Beckmann model;
BRDF data; Scattered radiance; Fresnel coefficient; Subsurface scattering
BibRef
Ragheb, H.,
Robles-Kelly, A.,
Hancock, E.R.,
Testing reflectance models against radiance data,
3DPVT04(880-887).
IEEE DOI
0412
BibRef
Robles-Kelly, A.,
Hancock, E.R.,
Estimating the surface radiance function from single images,
3DPVT04(494-501).
IEEE DOI
0412
BibRef
Mercier, B.[Bruno],
Meneveaux, D.[Daniel],
Fournier, A.[Alain],
A Framework for Automatically Recovering Object Shape, Reflectance and
Light Sources from Calibrated Images,
IJCV(73), No. 1, June 2007, pp. 77-93.
Springer DOI
0702
BibRef
Sato, I.[Imari],
Okabe, T.[Takahiro],
Sato, Y.[Yoichi],
Appearance Sampling of Real Objects for Variable Illumination,
IJCV(75), No. 1, October 2007, pp. 29-48.
Springer DOI
0709
See also Spherical harmonics vs. Haar wavelets: Basis for Recovering Illumination from Cast Shadows.
See also Face Recognition Under Varying Illumination Based on MAP Estimation Incorporating Correlation Between Surface Points.
BibRef
Sato, I.[Imari],
Okabe, T.[Takahiro],
Yu, Q.[Qiong],
Sato, Y.[Yoichi],
Shape Reconstruction Based on Similarity in Radiance Changes under
Varying Illumination,
ICCV07(1-8).
IEEE DOI
0710
BibRef
Sato, I.[Imari],
Okabe, T.[Takahiro],
Sato, Y.[Yoichi],
Ikeuchi, K.[Katsushi],
Using Extended Light Sources for Modeling Object Appearance under
Varying Illumination,
ICCV05(I: 325-332).
IEEE DOI
0510
Extended light source to model.
BibRef
Maeda, K.,
Okabe, T.,
Acquiring multispectral light transport using multi-primary DLP
projector,
IPTA16(1-6)
IEEE DOI
1703
image processing
BibRef
Chandra, K.[Kartik],
Healey, G.[Glenn],
Reflectance recovery for airborne sensor images of 3D scenes,
JOSA-A(24), No. 4, April 2007, pp. 957-966.
WWW Link.
0801
BibRef
Jin, H.L.[Hai-Lin],
Cremers, D.[Daniel],
Wang, D.J.[De-Jun],
Prados, E.[Emmanuel],
Yezzi, A.J.[Anthony J.],
Soatto, S.[Stefano],
3-D Reconstruction of Shaded Objects from Multiple Images Under Unknown
Illumination,
IJCV(76), No. 3, March 2008, pp. 245-256.
Springer DOI
0801
Shape, albedo, and light configuration from multiple images.
See also Estimation of 3D surface shape and smooth radiance from 2D images: A Level Set Approach.
BibRef
Xu, S.,
Wallace, A.M.,
Recovering surface reflectance and multiple light locations and
intensities from image data,
PRL(29), No. 11, 1 August 2008, pp. 1639-1647.
Elsevier DOI
0804
Illuminant estimation; Surface reflectance recovery; Photorealistic rendering
BibRef
Li, S.Y.[Shi-Ying],
Manabe, Y.[Yoshitsugu],
Chihara, K.[Kunihiro],
Accurately estimating reflectance parameters for color and gloss
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CVIU(113), No. 2, February 2009, pp. 308-316.
Elsevier DOI
0901
Diffuse reflectance; Specular reflectance; Color reproduction;
Gloss reproduction; Surface roughness; High dynamic range; Spectral image
BibRef
Abed, F.M.[Farhad Moghareh],
Amirshahi, S.H.[Seyed Hossein],
Abed, M.R.M.[Mohammad Reza Moghareh],
Reconstruction of reflectance data using an interpolation technique,
JOSA-A(26), No. 3, March 2009, pp. 613-624.
WWW Link.
0903
BibRef
Biswas, S.[Soma],
Aggarwal, G.[Gaurav],
Chellappa, R.[Rama],
Robust Estimation of Albedo for Illumination-invariant Matching and
Shape Recovery,
PAMI(31), No. 5, May 2009, pp. 884-899.
IEEE DOI
0903
BibRef
Earlier:
ICCV07(1-8).
IEEE DOI
0710
BibRef
Biswas, S.[Soma],
Chellappa, R.[Rama],
Pose-robust albedo estimation from a single image,
CVPR10(2683-2690).
IEEE DOI
1006
BibRef
Stephen, H.,
Ahmad, S.,
Piechota, T.C.,
Land Surface Brightness Temperature Modeling Using Solar Insolation,
GeoRS(48), No. 1, January 2010, pp. 491-498.
IEEE DOI
1001
BibRef
Quaife, T.,
Lewis, P.,
Temporal Constraints on Linear BRDF Model Parameters,
GeoRS(48), No. 5, May 2010, pp. 2445-2450.
IEEE DOI
1006
Bidirectional Reflectance Distribution Function.
BibRef
Ghosh, A.[Abhijeet],
Heidrich, W.[Wolfgang],
Achutha, S.[Shruthi],
O'Toole, M.[Matthew],
A Basis Illumination Approach to BRDF Measurement,
IJCV(90), No. 2, November 2010, pp. 183-197.
WWW Link.
1011
BibRef
Earlier: A1, A3, A2, A4:
BRDF Acquisition with Basis Illumination,
ICCV07(1-8).
IEEE DOI
0710
Award, Marr Prize, HM. bidirectional reflectance distribution functions.
Surface reflectance estimation.
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IEEE DOI
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And:
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1009
BRDF; Analytical BRDF; Parameter estimation; Branch and bound; Global
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Kong, N.,
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1110
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1107
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Earlier:
Joint Image GMM and Shading MAP Estimation,
ICPR10(1360-1363).
IEEE DOI
1008
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Elsevier DOI
1310
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And:
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ICIP13(2034-2038)
IEEE DOI
1402
BibRef
Earlier:
On the Recovery of Shape and Reflectance from a Single Multispectral
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DICTA11(572-578).
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Light; reflection parameters; shape.
Hyperspectral imaging
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Image reconstruction techniques
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Discriminative Illumination: Per-Pixel Classification of Raw
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IEEE DOI
1312
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Earlier: A2, A1:
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Computational illumination;appearance modeling;material classification
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Image reconstruction techniques
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The Role of Spatial Information in Disentangling the
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IEEE DOI
1403
Atmosphere
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1407
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Libonati, R.,
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Land-Surface Emissivity Retrieval in MSG-SEVIRI TIR Channels Using
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1407
atmospheric boundary layer
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1410
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Fast Spectral Reflectance Recovery Using DLP Projector,
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1411
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1011
Award, ACCV, Student.
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1412
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Qu, Y.[Ying],
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Li, X.W.[Xiao-Wen],
Mapping Surface Broadband Albedo from Satellite Observations:
A Review of Literatures on Algorithms and Products,
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DOI Link
1502
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Luo, T.,
Shen, J.,
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Accurate Normal and Reflectance Recovery Using Energy Optimization,
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1502
Estimation
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1504
Landsat
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1507
Association of BRDF with surface reflectance.
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Metrology
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Separating Reflective and Fluorescent Components Using High Frequency
Illumination in the Spectral Domain,
PAMI(38), No. 5, May 2016, pp. 965-978.
IEEE DOI
1604
BibRef
Earlier:
ICCV13(457-464)
IEEE DOI
1403
fluorescence
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Fu, Y.[Ying],
Lam, A.[Antony],
Sato, I.[Imari],
Okabe, T.[Takahiro],
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Absorption
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Fu, Y.[Ying],
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Kobashi, Y.[Yasuyuki],
Sato, I.[Imari],
Okabe, T.[Takahiro],
Sato, Y.[Yoichi],
Reflectance and Fluorescent Spectra Recovery Based on Fluorescent
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CVPR14(2171-2178)
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1409
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Lam, A.[Antony],
Subpa-Asa, A.[Art],
Sato, I.[Imari],
Okabe, T.[Takahiro],
Sato, Y.[Yoichi],
Spectral Imaging Using Basis Lights,
BMVC13(xx-yy).
DOI Link
1402
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Ogawa, T.[Takahiro],
Igarashi, Y.[Yuta],
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NMF-Based Spectral Reflectance Estimation From Image Pairs Including
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CirSysVideo(26), No. 5, May 2016, pp. 855-867.
IEEE DOI
1605
BibRef
Earlier: A2, A1, A3:
Spectral reflectance estimation from visible light components and
near-infrared components,
ICIP13(2388-2392)
IEEE DOI
1402
Approximation methods.
Spectral reflectance estimation
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Heikkinen, V.[Ville],
Camara, C.[Clara],
Hirvonen, T.[Tapani],
Penttinen, N.[Niko],
Spectral imaging using consumer-level devices and kernel-based
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Image reconstruction techniques.
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A Recursive Born Approach to Nonlinear Inverse Scattering,
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1608
approximation theory
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A Plug-and-Play Priors Approach for Solving Nonlinear Imaging Inverse
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SPLetters(24), No. 12, December 2017, pp. 1872-1876.
IEEE DOI
1712
Computational modeling, Imaging, Inverse problems,
Iterative methods, Mathematical model, Noise measurement,
plug-and-play priors (PPP)
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Eckhard, T.[Timo],
Frei, B.[Bernhard],
Klammer, M.[Maximilian],
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Improved estimation of reflectance spectra by utilizing prior
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JOSA-A(33), No. 7, July 2016, pp. 1370-1376.
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1608
Image reconstruction techniques
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Veltkamp, R.C.[Remco C.],
Water detection through spatio-temporal invariant descriptors,
CVIU(154), No. 1, 2017, pp. 182-191.
Elsevier DOI
1612
Water detection in video. Reflections.
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Dal Corso, A.[Alessandro],
Frisvad, J.R.[Jeppe Revall],
Mosegaard, J.[Jesper],
Bærentzen, J.A.[J. Andreas],
Interactive directional subsurface scattering and transport of emergent
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Springer DOI
1702
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Wen, J.G.[Jian-Guang],
Dou, B.C.[Bao-Cheng],
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Liu, Q.[Qiang],
Qinhuo, L.[Liu],
Forward a Small-Timescale BRDF/Albedo by Multisensor Combined BRDF
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GeoRS(55), No. 2, February 2017, pp. 683-697.
IEEE DOI
1702
albedo
From 4 sensors.
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Husi, L.[Letu],
Zhao, T.J.[Tian-Jie],
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Xiong, C.[Chuan],
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Effect of Solar-Cloud-Satellite Geometry on Land Surface Shortwave
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1708
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Pitard, G.[Gilles],
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Pillet, M.[Maurice],
Discrete Modal Decomposition: a new approach for the reflectance
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MVA(28), No. 5-6, August 2017, pp. 607-621.
Springer DOI
1708
BibRef
Pitard, G.[Gilles],
Le Goïc, G.[Gaëtan],
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Favrelière, H.[Hugues],
Pillet, M.,
George, S.,
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Reflectance-based surface saliency,
ICIP17(445-449)
IEEE DOI
1803
Estimation, Image reconstruction, Imaging, Rough surfaces, Shape,
Surface reconstruction, DMD, RTI, Saliency, Surface appearance
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Hui, Z.[Zhuo],
Sankaranarayanan, A.C.,
Shape and Spatially-Varying Reflectance Estimation from Virtual
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PAMI(39), No. 10, October 2017, pp. 2060-2073.
IEEE DOI
1709
BibRef
Earlier:
A Dictionary-Based Approach for Estimating Shape and
Spatially-Varying Reflectance,
ICCP15(1-9)
IEEE DOI
1511
Computational modeling, Estimation, Inverse problems,
Lighting, Optimization, Shape, Photometric stereo,
dictionaries, spatially varying BRDF
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Okabe, T.[Takaaki],
Okuda, M.[Masahiro],
Computationally Efficient Reflectance Estimation for Hyperspectral
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IEICE(E100-D), No. 9, September 2017, pp. 2253-2256.
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Hadwin, P.J.[Paul J.],
Sipkens, T.A.[Timothy A.],
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Daun, K.J.[Kyle J.],
Kalman filter approach for uncertainty quantification in
time-resolved laser-induced incandescence,
JOSA-A(35), No. 3, March 2018, pp. 386-396.
DOI Link
1804
Probability theory, stochastic processes, and statistics,
Inverse problems, Spectroscopy
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Radkevich, A.[Alexander],
A Method of Retrieving BRDF from Surface-Reflected Radiance Using
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1805
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Georgoulis, S.[Stamatios],
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Van Gool, L.J.[Luc J.],
Tuytelaars, T.[Tinne],
Reflectance and Natural Illumination from Single-Material Specular
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PAMI(40), No. 8, August 2018, pp. 1932-1947.
IEEE DOI
1807
Lighting, Shape, Training,
Two dimensional displays, Reflectance maps,
specular shading
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Ritschel, T.[Tobias],
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Tuytelaars, T.[Tinne],
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What is Around the Camera?,
ICCV17(5180-5188)
IEEE DOI
1802
From foreground and background, material, lighting, reflections, etc.
cameras, camera, foreground object, learning-based approach,
material properties, multiple reflectance maps,
Shape
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Zhuravleva, T.[Tatiana],
Nasrtdinov, I.[Ilmir],
Simulation of Bidirectional Reflectance in Broken Clouds: From
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DOI Link
1810
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Wierzbicki, D.[Damian],
Kedzierski, M.[Michal],
Fryskowska, A.[Anna],
Jasinski, J.[Janusz],
Quality Assessment of the Bidirectional Reflectance Distribution
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RS(10), No. 9, 2018, pp. xx-yy.
DOI Link
1810
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Mélou, J.[Jean],
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Castan, F.[Fabien],
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Variational Reflectance Estimation from Multi-view Images,
JMIV(60), No. 9, November 2018, pp. 1527-1546.
Springer DOI
1810
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Zhang, H.[Hu],
Jiao, Z.[Ziti],
Chen, L.[Lei],
Dong, Y.D.[Ya-Dong],
Zhang, X.N.[Xiao-Ning],
Lian, Y.[Yi],
Qian, D.[Da],
Cui, T.J.[Tie-Jun],
Quantifying the Reflectance Anisotropy Effect on Albedo Retrieval
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RS(10), No. 10, 2018, pp. xx-yy.
DOI Link
1811
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Zhang, H.[Hu],
Zhao, M.Z.[Meng-Zhuo],
Jiao, Z.[Ziti],
Lian, Y.[Yi],
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Cui, L.[Lei],
Zhang, X.N.[Xiao-Ning],
Liu, Y.[Yan],
Dong, Y.D.[Ya-Dong],
Qian, D.[Da],
Wang, Y.T.[Yi-Ting],
Li, J.[Juan],
Cui, T.J.[Tie-Jun],
Reflectance Anisotropy from MODIS for Albedo Retrieval from a Single
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RS(14), No. 15, 2022, pp. xx-yy.
DOI Link
2208
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Cao, C.[Chang],
Lee, X.[Xuhui],
Muhlhausen, J.[Joseph],
Bonneau, L.[Laurent],
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Measuring Landscape Albedo Using Unmanned Aerial Vehicles,
RS(10), No. 11, 2018, pp. xx-yy.
DOI Link
1812
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Verrelst, J.[Jochem],
Caicedo, J.P.R.[Juan Pablo Rivera],
Vicent, J.[Jorge],
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Approximating Empirical Surface Reflectance Data through Emulation:
Opportunities for Synthetic Scene Generation,
RS(11), No. 2, 2019, pp. xx-yy.
DOI Link
1902
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Stotko, P.[Patrick],
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Albedo estimation for real-time 3D reconstruction using RGB-D and IR
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PandRS(150), 2019, pp. 213-225.
Elsevier DOI
1903
Real-time, Reconstruction, Textures, Reflectance,
Image segmentation, Infrared
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Sukhova, E.[Ekaterina],
Sukhov, V.[Vladimir],
Analysis of Light-Induced Changes in the Photochemical Reflectance
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RS(11), No. 7, 2019, pp. xx-yy.
DOI Link
1904
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Sukhov, V.[Vladimir],
Sukhova, E.[Ekaterina],
Khlopkov, A.[Andrey],
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Ryabkova, A.[Anastasiia],
Telnykh, A.[Alexander],
Sergeeva, E.[Ekaterina],
Vodeneev, V.[Vladimir],
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Proximal Imaging of Changes in Photochemical Reflectance Index in
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RS(13), No. 9, 2021, pp. xx-yy.
DOI Link
2105
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Castorena, J.,
Computational Mapping of the Ground Reflectivity With Laser Scanners,
IP(28), No. 9, Sep. 2019, pp. 4288-4298.
IEEE DOI
1908
cartography, geophysical image processing, image colour analysis,
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edge guided reconstruction
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Stern, A.J.[Alan J.],
Evaluation of Incident Light Sensors on Unmanned Aircraft for
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1911
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Zeng, X.Z.[Xiang-Zhao],
Li, C.R.[Chuan-Rong],
The Influence of Heterogeneity on Lunar Irradiance Based on
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1911
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He, W.W.[Wei-Wei],
Wu, K.[Kuijun],
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The Radiative Transfer Characteristics of the O2 Infrared Atmospheric
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1912
Hyperspectral imaging, Gaussian processes, Cameras, Training, Color,
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Adaptive spectral reflectance recovery using spatio-spectral support
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ICIP14(664-668)
IEEE DOI
1502
Computer vision
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Li, S.[Shuang],
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Hashimoto, H.[Hirofumi],
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Yao, J.[Jing],
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First Provisional Land Surface Reflectance Product from Geostationary
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RS(11), No. 24, 2019, pp. xx-yy.
DOI Link
1912
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Zhan, C.[Chuan],
Allan, R.P.[Richard P.],
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Evaluation of Five Satellite Top-of-Atmosphere Albedo Products over
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1912
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Hao, D.,
Wen, J.,
Xiao, Q.,
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Tang, Y.,
An Improved Topography-Coupled Kernel-Driven Model for Land Surface
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GeoRS(58), No. 4, April 2020, pp. 2833-2847.
IEEE DOI
2004
Anisotropic reflectance, composite sloping terrain,
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Fujiwara, H.[Hiroshi],
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2004
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Zhang, G.,
Zhou, H.,
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Wang, J.,
Wan, H.,
Forecasting Time Series Albedo Using NARnet Based on EEMD
Decomposition,
GeoRS(58), No. 5, May 2020, pp. 3544-3557.
IEEE DOI
2005
Albedo, ensemble empirical mode decomposition (EEMD),
nonlinear autoregressive neural network (NARnet), time series
BibRef
Wu, X.,
Wen, J.,
Xiao, Q.,
You, D.,
Upscaling of Single-Site-Based Measurements for Validation of
Long-Term Coarse-Pixel Albedo Products,
GeoRS(58), No. 5, May 2020, pp. 3411-3425.
IEEE DOI
2005
Heterogeneous sites, sparse networks, spatial mismatch, upscaling, validation
BibRef
Wang, Y.[Yang],
Hu, X.Q.[Xiu-Qing],
Chen, L.[Lin],
Huang, Y.[Yu],
Li, Z.F.[Zhan-Feng],
Wang, S.R.[Shu-Rong],
Zhang, P.[Peng],
Wu, R.H.[Rong-Hua],
Zhang, L.[Lu],
Wang, W.[Wei],
Comparison of the Lunar Models Using the Hyper-Spectral Imager
Observations in Lijiang, China,
RS(12), No. 11, 2020, pp. xx-yy.
DOI Link
2006
BibRef
Xu, X.[Xi],
Asawa, T.[Takashi],
Kobayashi, H.[Hideki],
Narrow-to-Broadband Conversion for Albedo Estimation on Urban
Surfaces by UAV-Based Multispectral Camera,
RS(12), No. 14, 2020, pp. xx-yy.
DOI Link
2007
BibRef
Yang, J.M.[Jun-Ming],
Yao, Y.J.[Yun-Jun],
Wei, Y.X.[Yong-Xia],
Zhang, Y.[Yuhu],
Jia, K.[Kun],
Zhang, X.T.[Xiao-Tong],
Shang, K.[Ke],
Bei, X.Y.[Xiang-Yi],
Guo, X.Z.[Xiao-Zheng],
A Robust Method for Generating High-Spatiotemporal-Resolution Surface
Reflectance by Fusing MODIS and Landsat Data,
RS(12), No. 14, 2020, pp. xx-yy.
DOI Link
2007
BibRef
Blasinski, H.[Henryk],
Farrell, J.[Joyce],
Wandell, B.,
Simultaneous Surface Reflectance and Fluorescence Spectra Estimation,
IP(29), 2020, pp. 8791-8804.
IEEE DOI
2009
Estimation, Photonics, Cameras, Optimization, Light sources,
Fluorescence, Reflectance and fluorescence spectra recovery,
inverse problems
BibRef
Blasinski, H.[Henryk],
Breneman, J.[John],
Farrell, J.[Joyce],
A model for estimating spectral properties of water from RGB images,
ICIP14(610-614)
IEEE DOI
1502
Absorption
BibRef
Fujiwara, T.[Takumi],
Takeuchi, W.[Wataru],
Simulation of Sentinel-2 Bottom of Atmosphere Reflectance Using
Shadow Parameters on a Deciduous Forest in Thailand,
IJGI(9), No. 10, 2020, pp. xx-yy.
DOI Link
2010
BibRef
You, D.,
Wen, J.,
Liu, Q.,
Zhang, Y.,
Tang, Y.,
Liu, Q.,
Xie, H.,
The Component-Spectra-Parameterized Angular and Spectral
Kernel-Driven Model: A Potential Solution for Global BRDF/Albedo
Retrieval From Multisensor Satellite Data,
GeoRS(58), No. 12, December 2020, pp. 8674-8688.
IEEE DOI
2012
Soil, Amplitude shift keying, Kernel, Scattering, Vegetation mapping,
Land surface, Data models, Albedo,
multisensor satellite data
BibRef
Li, Y.[Yuan],
Zhang, Y.[Yong],
Rong, Z.G.[Zhi-Guo],
Wang, W.[Wei],
Xie, D.[Dan],
A Novel Microfacet Cosine Linear Kernel-Driven Bidirectional
Reflectance Distribution Function Model,
GeoRS(59), No. 7, July 2021, pp. 5879-5890.
IEEE DOI
2106
Geometry, Radio frequency, Data models, Calibration,
Computational modeling, Azimuth, Satellites,
Ross-Li model
BibRef
Asano, Y.[Yuta],
Zheng, Y.Q.[Yin-Qiang],
Nishino, K.[Ko],
Sato, I.[Imari],
Depth Sensing by Near-Infrared Light Absorption in Water,
PAMI(43), No. 8, August 2021, pp. 2611-2622.
IEEE DOI
2107
BibRef
Earlier:
Shape from Water: Bispectral Light Absorption for Depth Recovery,
ECCV16(VI: 635-649).
Springer DOI
1611
Absorption, Shape, Cameras, Optical surface waves, Surface texture,
Optical imaging, Depth recovery, light absorption, multispectral imaging.
BibRef
Zhang, H.[Hang],
Dana, K.[Kristin],
Nishino, K.[Ko],
Friction from Reflectance: Deep Reflectance Codes for Predicting
Physical Surface Properties from One-Shot In-Field Reflectance,
ECCV16(IV: 808-824).
Springer DOI
1611
BibRef
Wang, Z.[Zhe],
Zhou, H.M.[Hong-Min],
Wan, H.[Huawei],
Wang, Q.[Qian],
Fan, W.R.[Wen-Rui],
Ma, W.[Wu],
Wang, J.[Jindi],
Identifying Spatial and Temporal Characteristics of Land Surface
Albedo Using GF-1 WFV Data,
RS(13), No. 20, 2021, pp. xx-yy.
DOI Link
2110
BibRef
Hess, M.[Marcel],
Wilhelm, T.[Thorsten],
Wöhler, C.[Christian],
Wohlfarth, K.[Kay],
Uncertainty Introduced by Darkening Agents in the Lunar Regolith:
An Unmixing Perspective,
RS(13), No. 22, 2021, pp. xx-yy.
DOI Link
2112
BibRef
Zhang, X.N.[Xiao-Ning],
Jiao, Z.[Ziti],
Zhao, C.[Changsen],
Guo, J.[Jing],
Zhu, Z.D.[Zi-Dong],
Liu, Z.G.[Zhi-Gang],
Dong, Y.D.[Ya-Dong],
Yin, S.Y.[Si-Yang],
Zhang, H.[Hu],
Cui, L.[Lei],
Li, S.[Sijie],
Tong, Y.D.[Yi-Dong],
Wang, C.X.[Chen-Xia],
Evaluation of BRDF Information Retrieved from Time-Series Multiangle
Data of the Himawari-8 AHI,
RS(14), No. 1, 2022, pp. xx-yy.
DOI Link
2201
From single viewing angle, geostationary satellite.
BibRef
Haefner, B.[Bjoern],
Green, S.[Simon],
Oursland, A.[Alan],
Andersen, D.[Daniel],
Goesele, M.[Michael],
Cremers, D.[Daniel],
Newcombe, R.[Richard],
Whelan, T.[Thomas],
Recovering Real-World Reflectance Properties and Shading From HDR
Imagery,
3DV21(1075-1084)
IEEE DOI
2201
Geometry, Reflectivity, Surface reconstruction,
Monte Carlo methods, Lighting, Ray tracing, Appearance, BRDF, Specular,
Shading
BibRef
Li, J.C.[Ji-Chun],
Pang, G.J.[Guo-Jin],
Wang, X.J.[Xue-Jia],
Liu, F.[Fei],
Zhang, Y.T.[Yu-Ting],
Spatiotemporal Dynamics of Land Surface Albedo and Its Influencing
Factors in the Qilian Mountains, Northeastern Tibetan Plateau,
RS(14), No. 8, 2022, pp. xx-yy.
DOI Link
2205
BibRef
Cao, X.[Xu],
Waechter, M.[Michael],
Shi, B.X.[Bo-Xin],
Gao, Y.[Ye],
Zheng, B.[Bo],
Okura, F.[Fumio],
Matsushita, Y.[Yasuyuki],
Shape and Albedo Recovery by Your Phone using Stereoscopic Flash and
No-Flash Photography,
IJCV(130), No. 6, June 2022, pp. 1403-1415.
Springer DOI
2207
BibRef
Earlier: A1, A2, A3, A4, A5, A7, Only:
Stereoscopic Flash and No-Flash Photography for Shape and Albedo
Recovery,
CVPR20(3427-3436)
IEEE DOI
2008
Shape, Lighting, Cameras, Harmonic analysis, Photography, Robustness
BibRef
Chen, Z.[Zhe],
Nobuhara, S.[Shohei],
Nishino, K.[Ko],
Invertible Neural BRDF for Object Inverse Rendering,
PAMI(44), No. 12, December 2022, pp. 9380-9395.
IEEE DOI
2212
BibRef
Earlier:
ECCV20(V:767-783).
Springer DOI
2011
Lighting, Estimation, Rendering (computer graphics), Geometry,
Computational modeling, Analytical models, Neural networks,
illumination estimation
BibRef
Okawa, H.[Hiroki],
Shimano, M.[Mihoko],
Asano, Y.[Yuta],
Bise, R.[Ryoma],
Nishino, K.[Ko],
Sato, I.[Imari],
Estimation of Wetness and Color from a Single Multispectral Image,
PAMI(44), No. 12, December 2022, pp. 8740-8753.
IEEE DOI
2212
BibRef
Earlier: A2, A1, A3, A4, A5, A6:
Wetness and Color from a Single Multispectral Image,
CVPR17(321-329)
IEEE DOI
1711
Sea surface, Image color analysis, Optical surface waves,
Absorption, Liquids, Light scattering, spectral sharpening.
Absorption, Surface, waves.
BibRef
Claverie, M.[Martin],
Evaluation of surface reflectance bandpass adjustment techniques,
PandRS(198), 2023, pp. 210-222.
Elsevier DOI
2304
Spectral bands, Spectral adjustment,
Relative spectral response (RSR), Surface reflectance, Virtual constellation
BibRef
Tarasenkov, M.V.[Mikhail V.],
Belov, V.V.[Vladimir V.],
Engel, M.V.[Marina V.],
Zimovaya, A.V.[Anna V.],
Zonov, M.N.[Matvei N.],
Bogdanova, A.S.[Alexandra S.],
Algorithm for the Reconstruction of the Ground Surface Reflectance in
the Visible and Near IR Ranges from MODIS Satellite Data with
Allowance for the Influence of Ground Surface Inhomogeneity on the
Adjacency Effect and of Multiple Radiation Reflection,
RS(15), No. 10, 2023, pp. xx-yy.
DOI Link
2306
BibRef
Addari, G.[Gianmarco],
Guillemaut, J.Y.[Jean-Yves],
A Family of Approaches for Full 3D Reconstruction of Objects with
Complex Surface Reflectance,
IJCV(131), No. 9, September 2023, pp. 2243-2266.
Springer DOI
2308
BibRef
Zhao, H.J.[Hui-Jie],
Wang, Z.W.[Zi-Wei],
Jia, G.R.[Guo-Rui],
Tian, J.[Jia],
Jin, S.L.[Shu-Liang],
Liang, S.E.[Shun-Eng],
Liu, Y.[Yumeng],
The Impact and Correction of Sensitive Environmental Factors on
Spectral Reflectance Measured In Situ,
RS(15), No. 22, 2023, pp. 5332.
DOI Link
2311
BibRef
Gao, H.L.[Hai-Liang],
Wang, Q.Q.[Qian-Qian],
Gu, X.F.[Xing-Fa],
Yang, J.[Jian],
Liu, Q.Y.[Qi-Yue],
Tao, Z.[Zui],
Qiu, X.C.[Xing-Chen],
Zhang, W.[Wei],
Shi, X.[Xinda],
Zhao, X.F.[Xiao-Fei],
Study on Surface Reflectance Sampling Method and Uncertainty Based on
Airborne Hyperspectral Images,
RS(15), No. 21, 2023, pp. 5090.
DOI Link
2311
BibRef
Yu, Y.[Yao],
Pu, F.L.[Fang-Ling],
Chen, H.J.[Hong-Jia],
Tang, R.[Rui],
Li, J.W.[Jin-Wen],
Xu, X.[Xin],
Night vision self-supervised Reflectance-Aware Depth Estimation based
on reflectance,
JVCIR(97), 2023, pp. 103962.
Elsevier DOI
2312
Monocular depth estimation, Reflectance extraction, Night vision
BibRef
Shrestha, M.[Mahesh],
Mann, J.[Joshua],
Maddox, E.[Emily],
Robbins, T.[Terry],
Irwin, J.[Jeffrey],
Kropuenske, T.[Travis],
Helder, D.[Dennis],
Implementing a Dual-Spectrometer Approach for Improved Surface
Reflectance Estimation,
RS(15), No. 23, 2023, pp. 5451.
DOI Link
2312
BibRef
Ran, Y.H.[Yan-Hong],
Song, S.[Shalei],
Hou, X.[Xiaxia],
Chen, Y.X.[Yu-Xuan],
Chen, Z.W.[Zhen-Wei],
Gong, W.[Wei],
Multi-echo hyperspectral reflectance extraction method based on full
waveform hyperspectral LiDAR,
PandRS(207), 2024, pp. 43-56.
Elsevier DOI
2401
Full waveform hyperspectral LiDAR,
Backscattering cross-sectional area, Multi-echo reflectance, LESS
BibRef
Huo, D.[Dong],
Wang, J.[Jian],
Qian, Y.M.[Yi-Ming],
Yang, Y.H.[Yee-Hong],
Learning to Recover Spectral Reflectance From RGB Images,
IP(33), 2024, pp. 3174-3186.
IEEE DOI Code:
WWW Link.
2405
Reflectivity, Lighting, Task analysis, Image reconstruction,
Training, Testing, Hyperspectral imaging, meta-auxiliary learning
BibRef
Zhu, Q.[Qinyu],
Xu, C.[Can],
Zhao, S.L.[Shuai-Long],
Tao, X.F.[Xue-Feng],
Zhang, Y.S.[Ya-Sheng],
Tao, H.C.[Hai-Cheng],
Wang, X.[Xia],
Fang, Y.Q.[Yu-Qiang],
A Space Object Optical Scattering Characteristics Analysis Model
Based on Augmented Implicit Neural Representation,
RS(16), No. 17, 2024, pp. 3316.
DOI Link
2409
BibRef
Yamashita, K.[Kohei],
Nobuhara, S.[Shohei],
Nishino, K.[Ko],
DeepShaRM: Multi-View Shape and Reflectance Map Recovery Under
Unknown Lighting,
3DV24(761-769)
IEEE DOI
2408
Reflectivity, Geometry, Shape, Lighting, Estimation, Robustness,
3D Reconstruction, Physics-Based Vision, Inverse Rendering, Reflectance Map
BibRef
Brahimi, M.[Mohammed],
Haefner, B.[Bjoern],
Yenamandra, T.[Tarun],
Goldluecke, B.[Bastian],
Cremers, D.[Daniel],
SupeRVol: Super-Resolution Shape and Reflectance Estimation in
Inverse Volume Rendering,
WACV24(3127-3137)
IEEE DOI
2404
Reflectivity, Training, Geometry, Solid modeling, Shape,
Superresolution, Algorithms, 3D computer vision
BibRef
Zhang, Y.J.[You-Jia],
Xu, T.[Teng],
Yu, J.Q.[Jun-Qing],
Ye, Y.T.[Yu-Teng],
Jing, Y.Q.[Yan-Qing],
Wang, J.[Junle],
Yu, J.Y.[Jing-Yi],
Yang, W.[Wei],
NeMF: Inverse Volume Rendering with Neural Microflake Field,
ICCV23(22862-22872)
IEEE DOI Code:
WWW Link.
2401
Physical attributes of viewd object.
BibRef
Yao, M.[Mingde],
Huang, J.[Jie],
Jin, X.[Xin],
Xu, R.K.[Rui-Kang],
Zhou, S.L.[Sheng-Long],
Zhou, M.[Man],
Xiong, Z.W.[Zhi-Wei],
Generalized Lightness Adaptation with Channel Selective Normalization,
ICCV23(10634-10645)
IEEE DOI Code:
WWW Link.
2401
BibRef
Wu, H.Q.[Hao-Qian],
Hu, Z.P.[Zhi-Peng],
Li, L.[Lincheng],
Zhang, Y.Q.[Yong-Qiang],
Fan, C.J.[Chang-Jie],
Yu, X.[Xin],
NeFII: Inverse Rendering for Reflectance Decomposition with
Near-Field Indirect Illumination,
CVPR23(4295-4304)
IEEE DOI
2309
BibRef
Dai, S.F.[Shu-Fan],
Cao, Y.J.[Yang-Jie],
Duan, P.S.[Peng-Song],
Chen, X.F.[Xian-Fu],
SRes-NeRF: Improved Neural Radiance Fields for Realism and Accuracy of
Specular Reflections,
MMMod23(I: 306-317).
Springer DOI
2304
BibRef
Kizel, F.,
Vidro, Y.,
Bidirectional Reflectance Distribution Function (BRDF) of Mixed Pixels,
ISPRS21(B3-2021: 195-200).
DOI Link
2201
BibRef
Thul, D.,
Tsiminaki, V.,
Ladický, L.[Lubor],
Pollefeys, M.[Marc],
Precomputed Radiance Transfer for Reflectance and Lighting Estimation,
3DV20(1147-1156)
IEEE DOI
2102
Lighting, Reflectivity, Harmonic analysis, Mathematical model,
Geometry, Image color analysis, Surface reconstruction, glossiness
BibRef
Lyu, S.,
Huang, C.,
Hou, M.,
Reflectance Reconstruction of Hyperspectral Image Based on Gaussian
Surface Fitting,
ISPRS20(B3:1365-1369).
DOI Link
2012
BibRef
Boss, M.[Mark],
Braun, R.[Raphael],
Jampani, V.[Varun],
Barron, J.T.[Jonathan T.],
Liu, C.[Ce],
Lensch, H.P.A.[Hendrik P.A.],
NeRD: Neural Reflectance Decomposition from Image Collections,
ICCV21(12664-12674)
IEEE DOI
2203
Reflectivity, Shape, Computational modeling, Lighting,
Rendering (computer graphics),
3D from multiview and other sensors
BibRef
Boss, M.,
Jampani, V.,
Kim, K.,
Lensch, H.P.A.,
Kautz, J.,
Two-Shot Spatially-Varying BRDF and Shape Estimation,
CVPR20(3981-3990)
IEEE DOI
2008
Shape, Estimation, Lighting, Task analysis, Machine learning,
Optimization
BibRef
Schmitt, C.,
Donné, S.,
Riegler, G.,
Koltun, V.,
Geiger, A.,
On Joint Estimation of Pose, Geometry and svBRDF From a Handheld
Scanner,
CVPR20(3490-3500)
IEEE DOI
2008
Geometry, Cameras, Estimation,
Optimization, Surface reconstruction, Image reconstruction
BibRef
Innmann, M.,
Süßmuth, J.,
Stamminger, M.,
BRDF-Reconstruction in Photogrammetry Studio Setups,
WACV20(3346-3354)
IEEE DOI
2006
Lighting, Image reconstruction, Light sources, Geometry, Cameras,
Image color analysis, Pipelines
BibRef
Kaya, B.,
Timofte, R.,
Self-Supervised 2D Image to 3D Shape Translation with Disentangled
Representations,
3DV20(1039-1048)
IEEE DOI
2102
Shape, Image reconstruction, Training,
Image synthesis, Task analysis,
2D to 3D translation
BibRef
Kaya, B.,
Can, Y.B.,
Timofte, R.,
Towards Spectral Estimation from a Single RGB Image in the Wild,
AIM19(3546-3555)
IEEE DOI
2004
cameras, convolutional neural nets, image colour analysis,
image motion analysis, image reconstruction, image sensors,
spectral estimation
BibRef
Tsai, C.Y.[Chia-Yin],
Sankaranarayanan, A.C.[Aswin C.],
Gkioulekas, I.[Ioannis],
Beyond Volumetric Albedo:
A Surface Optimization Framework for Non-Line-Of-Sight Imaging,
CVPR19(1545-1555).
IEEE DOI
2002
BibRef
Berdou, G.,
Shrestha, S.,
Hahn, M.,
Integration of Sentinel-2 and Landsat-8 Data for Surface Reflectance
Time-series Analysis,
SMPR19(205-210).
DOI Link
1912
BibRef
Bode, L.,
Merzbach, S.,
Stotko, P.,
Weinmann, M.,
Klein, R.,
Real-Time Multi-Material Reflectance Reconstruction for Large-Scale
Scenes Under Uncontrolled Illumination from RGB-D Image Sequences,
3DV19(709-718)
IEEE DOI
1911
Lighting, Real-time systems, Image reconstruction, Geometry,
Estimation, Surface reconstruction, Image color analysis,
Spatially Varying Reflectance
BibRef
Lyngby, R.A.[Rasmus Ahrenkiel],
Matthiassen, J.B.[Jannik Boll],
Frisvad, J.R.[Jeppe Revall],
Dahl, A.B.[Anders Bjorholm],
Aanæs, H.[Henrik],
Using a Robotic Arm for Measuring BRDFs,
SCIA19(184-196).
Springer DOI
1906
BibRef
Vidaurre, R.,
Casas, D.,
Garcés, E.,
Lopez-Moreno, J.,
BRDF Estimation of Complex Materials with Nested Learning,
WACV19(1347-1356)
IEEE DOI
1904
image classification, image colour analysis, image resolution,
learning (artificial intelligence), neural nets,
Deep learning
BibRef
Pistellato, M.,
Cosmo, L.,
Bergamasco, F.,
Gasparetto, A.,
Albarelli, A.,
Adaptive Albedo Compensation for Accurate Phase-Shift Coding,
ICPR18(2450-2455)
IEEE DOI
1812
Surface reconstruction, Lasers, Convolution,
Cameras, Image reconstruction, Geometry
BibRef
Aksoy, Y.[Yagiz],
Kim, C.[Changil],
Kellnhofer, P.[Petr],
Paris, S.[Sylvain],
Elgharib, M.[Mohamed],
Pollefeys, M.[Marc],
Matusik, W.[Wojciech],
A Dataset of Flash and Ambient Illumination Pairs from the Crowd,
ECCV18(IX: 644-660).
Springer DOI
1810
Dataset, Illumination.
BibRef
Li, Z.Q.[Zheng-Qin],
Sunkavalli, K.[Kalyan],
Chandraker, M.[Manmohan],
Materials for Masses: SVBRDF Acquisition with a Single Mobile Phone
Image,
ECCV18(III: 74-90).
Springer DOI
1810
BibRef
Meder, J.[Julian],
Brüderlin, B.[Beat],
Hemispherical Gaussians for Accurate Light Integration,
ICCVG18(3-15).
Springer DOI
1810
BibRef
Tongbuasirilai, T.[Tanaboon],
Unger, J.[Jonas],
Kurt, M.[Murat],
Efficient BRDF Sampling Using Projected Deviation Vector
Parameterization,
BxDF17(153-158)
IEEE DOI
1802
Cameras, Image reconstruction, Light sources, Shape,
Standards,
BibRef
Stiebel, T.,
Merhof, D.,
The Importance of Smoothness Constraints on Spectral Object
Reflectances when Modeling Metamer Mismatching,
CVPV17(2985-2992)
IEEE DOI
1802
BibRef
Luongo, A.,
Falster, V.,
Doest, M.B.,
Li, D.,
Regi, F.,
Zhang, Y.,
Modeling the Anisotropic Reflectance of a Surface with Microstructure
Engineered to Obtain Visible Contrast After Rotation,
BxDF17(159-165)
IEEE DOI
1802
Microstructure, Optical surface waves, Predictive models,
Rough surfaces, Surface roughness, Surface treatment, Surface waves
BibRef
Hui, Z.,
Sunkavalli, K.,
Lee, J.Y.,
Hadap, S.,
Wang, J.,
Sankaranarayanan, A.C.,
Reflectance Capture Using Univariate Sampling of BRDFs,
ICCV17(5372-5380)
IEEE DOI
1802
cameras, estimation theory, image capture, image reconstruction,
mobile computing, reflectivity, sampling methods,
Shape
BibRef
Gu, J.[Jian],
Chen, H.M.[Hui-Min],
An algorithm of spectral reflectance function reconstruction without
sample training can integrate prior information,
ICIVC17(541-544)
IEEE DOI
1708
Algorithm design and analysis, Cameras, Image color analysis,
Image reconstruction, Ink, Reflectivity, Training, color detection,
prior information, sample training, spectral reflectance reconstruction.
BibRef
Khan, H.A.[Haris Ahmad],
Thomas, J.B.[Jean Baptiste],
Hardeberg, J.Y.[Jon Yngve],
Multispectral Constancy Based on Spectral Adaptation Transform,
SCIA17(II: 459-470).
Springer DOI
1706
BibRef
Le Moan, S.[Steven],
How to predict lightness variations from one illuminant to another?,
ICVNZ16(1-5)
IEEE DOI
1701
Correlation
BibRef
Gkioulekas, I.[Ioannis],
Levin, A.[Anat],
Zickler, T.E.[Todd E.],
An Evaluation of Computational Imaging Techniques for Heterogeneous
Inverse Scattering,
ECCV16(III: 685-701).
Springer DOI
1611
Internal scattering.
BibRef
Georgoulis, S.,
Vanweddingen, V.,
Proesmans, M.,
van Gool, L.J.,
A Gaussian Process Latent Variable Model for BRDF Inference,
ICCV15(3559-3567)
IEEE DOI
1602
Cameras
BibRef
Fyffe, G.,
Debevec, P.,
Single-Shot Reflectance Measurement from Polarized Color Gradient
Illumination,
ICCP15(1-10)
IEEE DOI
1511
albedo
BibRef
Riess, C.[Christian],
Pfaller, S.[Sven],
Angelopoulou, E.[Elli],
Reflectance Normalization in Illumination-Based Image Manipulation
Detection,
BioFor15(3-10).
Springer DOI
1511
BibRef
Haindl, M.[Michal],
Mikeš, S.[Stanislav],
Kudo, M.[Mineichi],
Unsupervised Surface Reflectance Field Multi-Segmenter,
CAIP15(I:261-273).
Springer DOI
1511
BibRef
Filip, J.[Jirí],
Somol, P.[Petr],
Materials Classification Using Sparse Gray-Scale Bidirectional
Reflectance Measurements,
CAIP15(II:289-299).
Springer DOI
1511
BibRef
Weinmann, M.[Michael],
Klein, R.[Reinhard],
Material Recognition for Efficient Acquisition of Geometry and
Reflectance,
CVPV14(321-333).
Springer DOI
1504
BibRef
Miyashita, L.[Leo],
Watanabe, Y.[Yoshihiro],
Ishikawa, M.[Masatoshi],
Rapid SVBRDF Measurement by Algebraic Solution Based on Adaptive
Illumination,
3DV14(232-239)
IEEE DOI
1503
Adaptive systems
BibRef
Weinmann, M.[Michael],
Gall, J.[Juergen],
Klein, R.[Reinhard],
Material Classification Based on Training Data Synthesized Using a BTF
Database,
ECCV14(III: 156-171).
Springer DOI
1408
Synthesize training data for materials under different light and viewing
conditions.
BibRef
Nöll, T.[Tobias],
Köhler, J.[Johannes],
Stricker, D.[Didier],
Robust and Accurate Non-parametric Estimation of Reflectance Using
Basis Decomposition and Correction Functions,
ECCV14(II: 376-391).
Springer DOI
1408
BibRef
Zheng, Y.Q.[Yin-Qiang],
Sato, I.[Imari],
Sato, Y.[Yoichi],
Spectra Estimation of Fluorescent and Reflective Scenes by Using
Ordinary Illuminants,
ECCV14(V: 188-202).
Springer DOI
1408
BibRef
Kobayashi, Y.,
Morimoto, T.,
Sato, I.,
Mukaigawa, Y.,
Ikeuchi, K.,
BRDF Estimation of Structural Color Object by Using Hyper Spectral
Image,
CVPV13(915-922)
IEEE DOI
1403
image colour analysis
BibRef
Yacoob, Y.[Yaser],
Matching Dry to Wet Materials,
ICCV13(2952-2959)
IEEE DOI
1403
Dry surfaces; Wet surfaces; spectral absorption
BibRef
Achar, S.[Supreeth],
Nuske, S.T.[Stephen T.],
Narasimhan, S.G.[Srinivasa G.],
Compensating for Motion during Direct-Global Separation,
ICCV13(1481-1488)
IEEE DOI
1403
direct and global components of radiance.
BibRef
Zhou, P.[Peng],
Yu, L.[Li],
Zhong, G.[Gang],
The non-Lambertian reflection in plenoptic sampling,
ICIP13(2154-2157)
IEEE DOI
1402
BRDF; Phong BRDF; Plenoptic sampling; non-Lambertian; spectrum analysis
BibRef
Iiyama, M.[Masaaki],
Miki, S.[Shohei],
Funatomi, T.[Takuya],
Minoh, M.[Michihiko],
3D Acquisition of Occluded Surfaces from Scattering in Participating
Media,
ICPR14(2095-2100)
IEEE DOI
1412
Cameras
BibRef
Evrenci, D.,
Iiyama, M.,
Funatomi, T.,
Minoh, M.,
Shape and Reflectance from Scattering in Participating Media,
3DV13(183-190)
IEEE DOI
1311
cameras
BibRef
Filip, J.[Jiri],
Vavra, R.[Radomir],
Havlicek, M.[Michal],
Effective Acquisition of Dense Anisotropic BRDF,
ICPR14(2047-2052)
IEEE DOI
1412
Analytical models
BibRef
Filip, J.[Jiri],
Vavra, R.[Radomir],
Haindl, M.[Michal],
Id, P.[Pavel],
Krupika, M.[Mikula],
Havran, V.[Vlastimil],
BRDF Slices: Accurate Adaptive Anisotropic Appearance Acquisition,
CVPR13(1468-1473)
IEEE DOI
1309
Bidirectional Reflectance Distribution Function: BRDF;
adaptive; measurement; sampling
BibRef
Ali, M.A.[Muhammad Asad],
Sato, I.[Imari],
Okabe, T.[Takahiro],
Sato, Y.[Yoichi],
Toward Efficient Acquisition of BRDFs with Fewer Samples,
ACCV12(IV:54-67).
Springer DOI
1304
Bidirectional Reflectance Distribution Function (BDRF).
BibRef
Komatsu, H.[Hidehiko],
Nishio, A.[Akiko],
Okazawa, G.[Gouki],
Goda, N.[Naokazu],
'Yellow' or 'Gold'?: Neural Processing of Gloss Information,
CCIW13(1-12).
Springer DOI
1304
BibRef
Abe, T.[Takashi],
Okatani, T.[Takayuki],
Deguchi, K.[Koichiro],
Recognizing surface qualities from natural images based on learning to
rank,
ICPR12(3712-3715).
WWW Link.
1302
glossiness and transparency
BibRef
Nurzynska, K.[Karolina],
Haraszczuk, R.[Ryszard],
Detection and Normalization of Blown-out Illumination Areas in
Grey-scale Images,
ISVC12(I: 282-291).
Springer DOI
1209
BibRef
Schwartz, G.,
Nishino, K.,
Visual Material Traits: Recognizing Per-Pixel Material Context,
CVPV13(883-890)
IEEE DOI
1403
image segmentation
BibRef
Lombardi, S.[Stephen],
Nishino, K.[Ko],
Single image multimaterial estimation,
CVPR12(238-245).
IEEE DOI
1208
Reflectance and illumination from a single
image.
BibRef
Jiang, J.[Jun],
Gu, J.W.[Jin-Wei],
Recovering spectral reflectance under commonly available lighting
conditions,
CCD12(1-8).
IEEE DOI
1207
BibRef
Ihrke, I.[Ivo],
Reshetouski, I.[Ilya],
Manakov, A.[Alkhazur],
Tevs, A.[Art],
Wand, M.[Michael],
Seidel, H.P.[Hans-Peter],
A kaleidoscopic approach to surround geometry and reflectance
acquisition,
CCD12(29-36).
IEEE DOI
1207
BibRef
Tomaszewska, A.[Anna],
Stefanowski, K.[Krzysztof],
Real-Time Spherical Harmonics Based Subsurface Scattering,
ICIAR12(I: 402-409).
Springer DOI
1206
BibRef
Xiong, Y.[Ying],
Saenko, K.[Kate],
Darrell, T.J.[Trevor J.],
Zickler, T.E.[Todd E.],
From pixels to physics: Probabilistic color de-rendering,
CVPR12(358-365).
IEEE DOI
1208
BibRef
Owens, T.[Trevor],
Saenko, K.[Kate],
Chakrabarti, A.[Ayan],
Xiong, Y.[Ying],
Zickler, T.E.[Todd E.],
Darrell, T.J.[Trevor J.],
Learning object color models from multi-view constraints,
CVPR11(169-176).
IEEE DOI
1106
BibRef
Jehle, M.[Markus],
Sommer, C.[Christoph],
Jähne, B.[Bernd],
Learning of Optimal Illumination for Material Classification,
DAGM10(563-572).
Springer DOI
1009
BibRef
Hirose, S.[Shun],
Takemura, K.[Kentaro],
Takamatsu, J.[Jun],
Suenaga, T.[Tsuyoshi],
Kawakami, R.[Rei],
Ogasawara, T.[Tsukasa],
Surface color estimation based on inter- and intra-pixel relationships
in outdoor scenes,
CVPR10(271-278).
IEEE DOI
1006
BibRef
Hsieh, S.H.[Sung-Hsien],
Fang, C.W.[Chih-Wei],
Wang, T.H.[Te-Hsun],
Chu, C.H.[Chien-Hung],
Lien, J.J.J.[Jenn-Jier James],
Weighted Map for Reflectance and Shading Separation Using a Single
Image,
ACCV09(III: 85-95).
Springer DOI
0909
BibRef
Li, C.M.[Chun-Ming],
Li, F.[Fang],
Kao, C.Y.[Chiu-Yen],
Xu, C.Y.[Chen-Yang],
Image segmentation with simultaneous illumination and reflectance
estimation: An energy minimization approach,
ICCV09(702-708).
IEEE DOI
0909
BibRef
Kratz, L.[Louis],
Nishino, K.[Ko],
Factorizing Scene Albedo and Depth from a Single Foggy Image,
ICCV09(1701-1708).
IEEE DOI
0909
BibRef
Nishino, K.[Ko],
Directional statistics BRDF model,
ICCV09(476-483).
IEEE DOI
0909
Bidirectional Reflectance Distribution Function
BibRef
Toque, J.A.[Jay Arre],
Sakatoku, Y.J.[Yu-Ji],
Ide-Ektessabi, A.[Ari],
Pigment identification by analytical imaging using multispectral images,
ICIP09(2861-2864).
IEEE DOI
0911
On paintings. Identify Japanese pigments.
BibRef
Moriuchi, Y.[Yusuke],
Tominaga, S.[Shoji],
Horiuchi, T.[Takahiko],
Precise Analysis of Spectral Reflectance Properties of Cosmetic
Foundation,
SCIA09(138-148).
Springer DOI
0906
BibRef
Le Moan, S.[Steven],
Mansouri, A.[Alamin],
Hardeberg, J.Y.[Jon Y.],
Voisin, Y.[Yvon],
A class-separability-based method for multi/hyperspectral image color
visualization,
ICIP10(1321-1324).
IEEE DOI
1009
BibRef
Mansouri, A.[Alamin],
Sliwa, T.[Tadeusz],
Hardeberg, J.Y.[Jon Yngve],
Voisin, Y.[Yvon],
An adaptive-PCA algorithm for reflectance estimation from color images,
ICPR08(1-4).
IEEE DOI
0812
BibRef
Nillius, P.[Peter],
Sullivan, J.[Josephine],
Argyros, A.A.[Antonis A.],
Shading models for illumination and reflectance invariant shape
detectors,
CVPR08(1-8).
IEEE DOI
0806
BibRef
Ben-Ezra, M.[Moshe],
Wang, J.P.[Jia-Ping],
Wilburn, B.[Bennett],
Li, X.Y.[Xiao-Yang],
Ma, L.[Le],
An LED-only BRDF measurement device,
CVPR08(1-8).
IEEE DOI
0806
Acquire Bidirectional Reflectance Distribution Function
BibRef
Yin, X.[Xin],
Cai, K.Y.[Kang-Ying],
Takeda, Y.[Yuki],
Akama, R.[Ryo],
Tanaka, H.T.[Hiromi T.],
Measurement of Reflection Properties in Ancient Japanese Drawing
Ukiyo-e,
ACCV07(I: 779-788).
Springer DOI
0711
Wood block prints. Surface structure of print and paper.
BibRef
Ogier, A.,
Dorval, T.,
Genovesio, A.,
Biased Image Correction Based on Empirical Mode Decomposition,
ICIP07(I: 533-536).
IEEE DOI
0709
Correct for illumination effects.
BibRef
Ortiz, F.[Francisco],
Real-Time Elimination of Brightness in Color Images by MS Diagram and
Mathematical Morphology,
CAIP07(458-465).
Springer DOI
0708
BibRef
Chung, Y.C.[Yun-Chung],
Chang, S.L.[Shyang-Lih],
Wang, J.M.[Jung-Ming],
Chen, S.W.[Sei-Wang],
Interference reflection separation from a single image,
WACV09(1-6).
IEEE DOI
0912
BibRef
Chung, Y.C.[Yun-Chung],
Chang, S.L.[Shyang-Lih],
Cherng, S.[Shen],
Chen, S.W.[Sei-Wang],
Dichromatic Reflection Separation from a Single Image,
EMMCVPR07(225-241).
Springer DOI
0708
BibRef
Dickens, M.P.[Matthew P.],
Hancock, E.R.[Edwin R.],
Estimating Reflectance Functions Using a Cyberware 3030 Scanner,
CAIP07(342-350).
Springer DOI
0708
BibRef
Mukaigawa, Y.[Yasuhiro],
Sumino, K.[Kohei],
Yagi, Y.S.[Yasu-Shi],
Multiplexed Illumination for Measuring BRDF Using an Ellipsoidal Mirror
and a Projector,
ACCV07(II: 246-257).
Springer DOI
0711
BibRef
And:
High-Speed Measurement of BRDF using an Ellipsoidal Mirror and a
Projector,
PROCAMS07(1-8).
IEEE DOI
0706
BibRef
Zeng, H.[Huiwen],
Trussell, H.J.,
Image Analysis Under Varying Illumination,
ICIP06(921-924).
IEEE DOI
0610
BibRef
Agarwal, V.,
Gribok, A.V.,
Koschan, A.F.,
Abidi, M.A.,
Estimating Illumination Chromaticity via Kernel Regression,
ICIP06(981-984).
IEEE DOI
0610
BibRef
Bhalerao, A.H.,
Minimum Entropy Light and Shading Approximation,
BMVC06(I:317).
PDF File.
0609
BibRef
Shen, L.[Li],
Takemura, H.[Haruo],
Spatial Reflectance Recovery under Complex Illumination from Sparse
Images,
CVPR06(II: 1833-1838).
IEEE DOI
0606
BibRef
Zou, X.[Xuan],
Kittler, J.V.[Josef V.],
Messer, K.[Kieron],
Ambient Illumination Variation Removal by Active Near-IR Imaging,
ICB06(19-25).
Springer DOI
0601
BibRef
Diamantaras, K.I.,
Papadimitriou, T.,
Blind Separation of Reflections Using the Image Mixtures Ratio,
ICIP05(II: 1034-1037).
IEEE DOI
0512
BibRef
Miao, X.P.[Xiao-Ping],
Sim, T.,
Ambient Image Recovery and Rendering from Flash Photographs,
ICIP05(II: 1038-1041).
IEEE DOI
0512
BibRef
Toro, J.,
Ziou, D.,
Auclair-Fortier, M.F.,
Recovering the shading image under known illumination,
CRV04(92-96).
IEEE DOI
0408
BibRef
Magnor, M.,
Sensitivity of reflected radiance to surface normal orientation,
ICIP03(III: 717-720).
IEEE DOI
0312
BibRef
Nillius, P.,
Eklundh, J.O.,
Low-dimensional representations of shaded surfaces under varying
illumination,
CVPR03(II: 185-192).
IEEE DOI
0307
How to best represent objects with varying light sources.
Calculate the bases for all configurations of a point plus ambient
light source and two point light sources, as well as from a database
of captured real world illumination.
See also Lambertian Reflectance and Linear Subspaces.
BibRef
Nillius, P.[Peter],
Eklundh, J.O.[Jan-Olof],
Classifying Materials from Their Reflectance Properties,
ECCV04(Vol IV: 366-376).
Springer DOI
0405
Model-based PCA.
BibRef
Nillius, P.,
Eklundh, J.O.,
Phenomenological eigenfunctions for image irradiance,
ICCV03(568-575).
IEEE DOI
0311
BibRef
Park, J.I.[Jong-Il],
Lee, M.H.[Moon-Hyun],
Grossberg, M.D.[Michael D.],
Nayar, S.K.[Shree K.],
Multispectral Imaging Using Multiplexed Illumination,
ICCV07(1-8).
IEEE DOI
0710
BibRef
Grossberg, M.D.[Michael D.],
Nayar, S.K.[Shree K.],
What Can Be Known about the Radiometric Response from Images?,
ECCV02(IV: 189 ff.).
Springer DOI
0205
Analyze ambiguity in standard approach to determine
radiometric response. Recover brightness transfer function for
pair of images.
BibRef
Nakashima, A.[Akiko],
Maki, A.[Atsuto],
Fukui, K.[Kazuhiro],
Constructing Illumination Image Basis from Object Motion,
ECCV02(III: 195 ff.).
Springer DOI
0205
Moving object. Static lighting. To use in generating new views.
BibRef
Fleming, R.W.[Roland W.],
Dror, R.O.[Ron O.],
Adelson, E.H.[Edward H.],
How do Humans Determine Reflectance Properties under Unknown
Illumination?,
MIT AIM-2001-032, October 2001.
WWW Link.
0205
BibRef
Dror, R.O.[Ron O.],
Adelson, E.H.[Edward H.],
Willsky, A.S.[Alan S.],
Recognition of Surface Reflectance Properties from a Single Image under
Unknown Real-World Illumination,
MIT AIM-2001-033, November 2001.
WWW Link.
0205
BibRef
Dror, R.O.[Ron O.],
Surface Reflectance Recognition and Real-World Illumination Statistics,
MIT AI-TRITR-2002-009, October 2002.
WWW Link.
0306
BibRef
Dror, R.O.[Ron O.],
Adelson, E.H.[Edward H.],
Willsky, A.S.[Alan S.],
Surface Reflectance Estimation and Natural Illumination Statistics,
SCTV01(xx-yy).
0106
BibRef
And:
MIT AIM-2001-023, September 2001.
WWW Link.
0205
BibRef
Dror, R.O.[Ron O.],
Leung, T.K.[Thomas K.],
Adelson, E.H.[Edward H.], and
Willsky, A.S.[Alan S.],
Statistics of Real-World Illumination,
CVPR01(II:164-171).
IEEE DOI
0110
Real light sources are complex compared to the models.
BibRef
Bell, M.[Matt],
Freeman, W.T.[William T.],
Learning Local Evidence for Shading and Reflectance,
ICCV01(I: 670-677).
IEEE DOI
0106
BibRef
Tanaka, N.[Norihiro],
Tominaga, S.[Shoji],
Kawai, T.[Toshiyuki],
Estimation of the Torrance-Sparrow Reflection Model from a Single
Multi-band Image,
ICPR00(Vol III: 596-599).
IEEE DOI
0009
BibRef
Chen, H.F.[Hansen F.],
Belhumeur, P.N.[Peter N.],
Jacobs, D.W.[David W.],
In Search of Illumination Invariants,
CVPR00(I: 254-261).
IEEE DOI
0005
Award, CVPR, HM. Applied to Faces
BibRef
Pedersini, F.[Federico],
Piccarreta, L.[Luca],
Sarti, A.[Augusuto],
Tubaro, S.[Stefano],
Estimation of Radiometric Parameters for A Realistic Rendering of 3D
Models,
ICIP99(IV:376-380).
IEEE DOI
BibRef
9900
Tominaga, S.,
Takahashi, E.,
Tanaka, N.,
Parameter Estimation of a Reflection Model from a Multi-Band Image,
PMCVG99(xx-yy).
BibRef
9900
Sato, I.,
Sato, Y.,
Ikeuchi, K.,
Acquiring a Radiance Distribution to Superimpose Virtual Objects
onto a Real Scene,
MVA98(xx-yy).
BibRef
9800
And:
MfR01(Chapter II-6).
BibRef
Angelopoulou, E.[Elli],
Williams, J.P.,
Wolff, L.B.,
A Curvature Based Descriptor Invariant to Pose and Albedo
Derived from Photometric Data,
CVPR97(165-171).
IEEE DOI
9704
From 3 illumination conditions.
BibRef
Manabe, Y.[Yoshitsugu],
Zhen, X.[Xin],
Inokuchi, S.[Seiji],
Estimation of Illuminant Spectral Distribution with
Geometrical Information from Spectral Image,
ICPR98(Vol II: 1464-1466).
IEEE DOI
9808
BibRef
Cozman, F.,
Krotkov, E.,
Depth from Scattering,
CVPR97(801-806).
IEEE DOI
9704
Depth from effects of atmospheric scattering.
BibRef
Love, R.,
Efford, N.D.,
Surface Reflectance Model Estimation from Daylight Illuminated Image
Sequences,
BMVC95(xx-yy).
PDF File.
9509
BibRef
Caillas, C.,
A Physical Approach to Infrared Image Understanding,
BMVC94(xx-yy).
PDF File.
9409
Reflectivity, emissivity from images.
BibRef
Chapter on 3-D Shape from X -- Shading, Textures, Lasers, Structured Light, Focus, Line Drawings continues in
Land Surface Albedo .