9.1.3.2 Translucent Surfaces, Translucent Materials, Translucency Analysis

Chapter Contents (Back)
Translucent.
See also Transparent Surfaces, Transparent Materials.

Rushmeier, H.E., Torrance, K.E.,
Extending the Radiosity Method to Include Specularly Reflecting and Translucent Materials,
TOG(9), 1990, pp. 1-27. BibRef 9000

Moore, K.D.[Kathleen D.], Peers, P.[Pieter],
An empirical study on the effects of translucency on photometric stereo,
VC(29), No. 6-8, June 2013, pp. 817-824.
WWW Link. 1306
Photometric Stereo. BibRef

Bruni, V.[Vittoria], Crawford, A.J.[Andrew J.], Kokaram, A.C.[Anil C.], Vitulano, D.[Domenico],
Semi-transparent blotches removal from sepia images exploiting visibility laws,
SIViP(7), No. 1, January 2013, pp. 11-26.
WWW Link. 1301
BibRef
Earlier:
Digital Removal of Blotches with Variable Semi-transparency Using Visibility Laws,
BVAI07(254-263).
Springer DOI 0710
BibRef
And: A2, A1, A3, A4:
Multi-Scale Semi-Transparent Blotch Removal on Archived Photographs using Bayesian Matting Techniques and Visibility Laws,
ICIP07(I: 561-564).
IEEE DOI 0709
BibRef

Seo, M.K.[Myoung Kook], Kim, H.M.[Hoe-Min], Lee, K.H.[Kwan H.],
Solid texture synthesis for heterogeneous translucent materials,
VC(30), No. 3, March 2014, pp. 271-283.
WWW Link. 1403
BibRef

Lee, S.K.[Seung-Kyu], Shim, H.J.[Hyun-Jung],
Skewed stereo time-of-flight camera for translucent object imaging,
IVC(43), No. 1, 2015, pp. 27-38.
Elsevier DOI 1512
Translucent object imaging BibRef

Shim, H.J.[Hyun-Jung], Lee, S.K.[Seung-Kyu],
Recovering Translucent Objects Using a Single Time-of-Flight Depth Camera,
CirSysVideo(26), No. 5, May 2016, pp. 841-854.
IEEE DOI 1605
Cameras BibRef

Song, S.J.[Seong-Jong], Shim, H.J.[Hyun-Jung],
Depth Reconstruction of Translucent Objects from a Single Time-of-Flight Camera Using Deep Residual Networks,
ACCV18(V:641-657).
Springer DOI 1906
BibRef

Tanaka, K.[Kenichiro], Mukaigawa, Y.[Yasuhiro], Kubo, H.[Hiroyuki], Matsushita, Y.[Yasuyuki], Yagi, Y.S.[Yasu-Shi],
Recovering Inner Slices of Layered Translucent Objects by Multi-Frequency Illumination,
PAMI(39), No. 4, April 2017, pp. 746-757.
IEEE DOI 1703
BibRef
Earlier:
Recovering inner slices of translucent objects by multi-frequency illumination,
CVPR15(5464-5472)
IEEE DOI 1510
Cameras BibRef

Tian, J., Philpot, W.,
Spectral Transmittance of a Translucent Sand Sample With Directional Illumination,
GeoRS(56), No. 8, August 2018, pp. 4307-4317.
IEEE DOI 1808
drying, infrared spectra, light transmission, quartz, reflectivity, refractive index, remote sensing, sand, soil, ultraviolet spectra, wet BibRef

Todo, H.[Hideki], Yatagawa, T.[Tatsuya], Sawayama, M.[Masataka], Dobashi, Y.[Yoshinori], Kakimoto, M.[Masanori],
Image-based translucency transfer through correlation analysis over multi-scale spatial color distribution,
VC(35), No. 6-8, June 2018, pp. 811-822.
Springer DOI 1906
BibRef

Rogers, G.[Geoffrey], Corblet, O.[Olympe], Fournel, T.[Thierry], Hebert, M.[Mathieu],
Measurement of the diffusion of light within paper,
JOSA-A(36), No. 4, April 2019, pp. 636-640.
DOI Link 1912
Fourier transforms, Frequency measurement, Image quality, Modulation transfer function, Photon diffusion, Total internal reflection BibRef


Chen, Z.Y.[Zhen-Yu], Guo, J.[Jie], Lai, S.[Shuichang], Fu, R.[Ruoyu], Kong, M.X.[Meng-Xun], Wang, C.[Chen], Sun, H.Y.[Hong-Yu], Zhang, Z.[Zhebin], Li, C.[Chen], Guo, Y.[Yanwen],
Practical Measurements of Translucent Materials with Inter-Pixel Translucency Prior,
CVPR24(20932-20942)
IEEE DOI 2410
Visualization, Photorealism, Shape, Scattering, Optical variables measurement, Cameras, Optical materials BibRef

Nakath, D.[David], Weng, X.Y.[Xiang-Yu], She, M.[Mengkun], Köser, K.[Kevin],
Visual Tomography: Physically Faithful Volumetric Models of Partially Translucent Objects,
3DV24(1605-1615)
IEEE DOI 2408
Solid modeling, Computational modeling, Plankton, Training data, Tomography, Rendering (computer graphics), translucent objects BibRef

Kessy, S.J.[Suzan Joseph], Funatomi, T.[Takuya], Kitano, K.[Kazuya], Fujimura, Y.[Yuki], Caron, G.[Guillaume], Mouaddib, E.[El_Mustapha], Mukaigawa, Y.[Yasuhiro],
Hyperspectral Imaging of In-Site Stained Glasses: Illumination Variation Compensation Using Two Perpendicular Scans,
eHeritage23(1654-1662)
IEEE DOI 2401
BibRef

Li, C.H.[Chen-Hao], Ngo, T.T.[Trung Thanh], Nagahara, H.[Hajime],
Inverse Rendering of Translucent Objects using Physical and Neural Renderers,
CVPR23(12510-12520)
IEEE DOI 2309
BibRef

Zolfi, A.[Alon], Kravchik, M.[Moshe], Elovici, Y.[Yuval], Shabtai, A.[Asaf],
The Translucent Patch: A Physical and Universal Attack on Object Detectors,
CVPR21(15227-15236)
IEEE DOI 2111
Face recognition, Optimization methods, Detectors, Object detection, Cameras, Autonomous vehicles BibRef

Gkioulekas, I.[Ioannis], Walter, B.[Bruce], Adelson, E.H.[Edward H.], Bala, K.[Kavita], Zickler, T.E.[Todd E.],
On the appearance of translucent edges,
CVPR15(5528-5536)
IEEE DOI 1510
BibRef

Einakian, S.[Sussan], Newman, T.S.[Timothy S.],
Examining Classic Color Harmony Versus Translucency Color Guidelines for Layered Surface Visualization,
ISVC15(I: 318-327).
Springer DOI 1601
BibRef

Dong, B.[Bo], Moore, K.D.[Kathleen D.], Zhang, W.[Weiyi], Peers, P.[Pieter],
Scattering Parameters and Surface Normals from Homogeneous Translucent Materials Using Photometric Stereo,
CVPR14(2299-2306)
IEEE DOI 1409
photometric stereo; subsurface scattering BibRef

Fiaschi, L.[Luca], Diego, F.[Ferran], Gregor, K.[Konstantin], Schiegg, M.[Martin], Koethe, U.[Ullrich], Zlatic, M.[Marta], Hamprecht, F.A.[Fred A.],
Tracking Indistinguishable Translucent Objects over Time Using Weakly Supervised Structured Learning,
CVPR14(2736-2743)
IEEE DOI 1409
latent variables BibRef

Inoshita, C.[Chika], Mukaigawa, Y.[Yasuhiro], Matsushita, Y.[Yasuyuki], Yagi, Y.S.[Yasu-Shi],
Surface Normal Deconvolution: Photometric Stereo for Optically Thick Translucent Objects,
ECCV14(II: 346-359).
Springer DOI 1408
BibRef
Earlier:
Shape from Single Scattering for Translucent Objects,
ECCV12(II: 371-384).
Springer DOI 1210
BibRef

Holroyd, M.[Michael], Lawrence, J.[Jason],
An analysis of using high-frequency sinusoidal illumination to measure the 3D shape of translucent objects,
CVPR11(2985-2991).
IEEE DOI 1106
BibRef

Chen, T.B.[Tong-Bo], Lensch, H.P.A.[Hendrik P. A.], Fuchs, C.[Christian], Seidel, H.P.[Hans-Peter],
Polarization and Phase-Shifting for 3D Scanning of Translucent Objects,
CVPR07(1-8).
IEEE DOI 0706
Deal with translucent objects with structured light system. BibRef

Queiroz-Neto, J.P.[José P.], Carceroni, R.L.[Rodrigo L.], Coelho, L.C.R.[Lara C. R.],
Recovering Photometric Properties of Multiple Strongly-Reflective, Partially-Transparent Surfaces from a Single Image,
ICCV05(II: 1409-1416).
IEEE DOI 0510
BibRef

Dey, N., Boucher, A., Thonnat, M.,
Image formation model of a 3-d translucent object observed in light microscopy,
ICIP02(II: 469-472).
IEEE DOI 0210
BibRef

Chapter on 3-D Shape from X -- Shading, Textures, Lasers, Structured Light, Focus, Line Drawings continues in
Transparent Surfaces, Transparent Materials .


Last update:Nov 26, 2024 at 16:40:19