7.1.9 Masked Image Modeling

Chapter Contents (Back)
Masked Image Modeling. Learning.
See also MAE, Masked Autoencoder.

Yan, D.S.[Dai-Song], Gong, X.[Xun], Zhang, Z.[Zhemin],
Rotated and Masked Image Modeling: A Superior Self-Supervised Method for Classification,
SPLetters(30), 2023, pp. 1477-1481.
IEEE DOI 2311
BibRef

He, Q.B.[Qi-Bin], Sun, X.[Xian], Yan, Z.Y.[Zhi-Yuan], Wang, B.[Bing], Zhu, Z.C.[Zi-Cong], Diao, W.H.[Wen-Hui], Yang, M.Y.[Michael Ying],
AST: Adaptive Self-supervised Transformer for optical remote sensing representation,
PandRS(200), 2023, pp. 41-54.
Elsevier DOI 2306
Cross-scale transformer, Interpretation, Masked image modeling, Optical remote sensing, Representation learning BibRef

Chen, X.K.[Xiao-Kang], Ding, M.Y.[Ming-Yu], Wang, X.D.[Xiao-Di], Xin, Y.[Ying], Mo, S.T.[Shen-Tong], Wang, Y.H.[Yun-Hao], Han, S.M.[Shu-Min], Luo, P.[Ping], Zeng, G.[Gang], Wang, J.D.[Jing-Dong],
Context Autoencoder for Self-supervised Representation Learning,
IJCV(132), No. 1, January 2024, pp. 208-223.
Springer DOI 2402
Code:
WWW Link. Masked image modeling (MIM) approach. BibRef

Huang, Z.C.[Zhi-Cheng], Jin, X.J.[Xiao-Jie], Lu, C.Z.[Cheng-Ze], Hou, Q.[Qibin], Cheng, M.M.[Ming-Ming], Fu, D.M.[Dong-Mei], Shen, X.H.[Xiao-Hui], Feng, J.S.[Jia-Shi],
Contrastive Masked Autoencoders are Stronger Vision Learners,
PAMI(46), No. 4, April 2024, pp. 2506-2517.
IEEE DOI 2403
Decoding, Image reconstruction, Training, Task analysis, Semantics, Head, Masked image modeling (MIM), self-supervised learning BibRef

Zhang, X.Y.[Xin-Yi], Zhuang, Y.[Yin], Zhang, T.[Tong], Li, C.[Can], Chen, H.[He],
Masked Image Modeling Auxiliary Pseudo-Label Propagation with a Clustering Central Rectification Strategy for Cross-Scene Classification,
RS(16), No. 11, 2024, pp. 1983.
DOI Link 2406
BibRef

Li, J.Y.[Jing-Yao], Chen, P.G.[Peng-Guang], Yu, S.Z.[Shao-Zuo], Liu, S.[Shu], Jia, J.Y.[Jia-Ya],
MOODv2: Masked Image Modeling for Out-of-Distribution Detection,
PAMI(46), No. 12, December 2024, pp. 8994-9003.
IEEE DOI 2411
Task analysis, Image reconstruction, Feature extraction, Training, Data models, Dogs, Computational modeling, masked image modeling, outlier detection BibRef

Gao, J.[Jin], Lin, S.[Shubo], Wang, S.R.[Shao-Ru], Kou, Y.T.[Yu-Tong], Li, Z.M.[Ze-Ming], Li, L.[Liang], Zhang, C.X.[Cong-Xuan], Zhang, X.Q.[Xiao-Qin], Wang, Y.Z.[Yi-Zheng], Hu, W.M.[Wei-Ming],
An Experimental Study on Exploring Strong Lightweight Vision Transformers via Masked Image Modeling Pre-training,
IJCV(133), No. 7, July 2025, pp. 3918-3950.
Springer DOI 2506
BibRef

Gui, J.[Jie], Chen, T.[Tuo], Dong, M.J.[Min-Jing], Liu, Z.Q.[Zheng-Qi], Luo, H.[Hao], Kwok, J.T.Y.[James Tin-Yau], Tang, Y.Y.[Yuan Yan],
Exploring the Coordination of Frequency and Attention in Masked Image Modeling,
IP(34), 2025, pp. 6564-6576.
IEEE DOI 2510
Semantics, Frequency-domain analysis, Training, Visualization, Computational modeling, Image segmentation, Data mining, self-supervised learning BibRef


Lin, J.H.[Jin-Hong], Wu, C.E.[Cheng-En], Li, H.R.[Huan-Ran], Zhang, J.F.[Ji-Fan], Hu, Y.H.[Yu Hen], Morgado, P.[Pedro],
From Prototypes to General Distributions: An Efficient Curriculum for Masked Image Modeling,
CVPR25(20028-20038)
IEEE DOI 2508
Training, Visualization, Annealing, Computational modeling, Prototypes, Predictive models, Computational efficiency, training efficiency BibRef

Zhang, Y.F.[Yi-Fei], Liu, C.[Chang], Wei, J.[Jin], Yang, X.M.[Xiao-Meng], Zhou, Y.[Yu], Ma, C.[Can], Ji, X.Y.[Xiang-Yang],
Linguistics-aware Masked Image Modeling for Self-supervised Scene Text Recognition,
CVPR25(9318-9328)
IEEE DOI Code:
WWW Link. 2508
Visualization, Text recognition, Semantics, Contrastive learning, Linguistics, Benchmark testing, Feature extraction, Decoding, masked image modeling BibRef

Shikhar, S.[Sambal], Sobti, A.[Anupam],
Label-free Anomaly Detection in Aerial Agricultural Images with Masked Image Modeling,
AgriVision24(5440-5449)
IEEE DOI 2410
Training, Productivity, Shape, Computational modeling, Supervised learning, Self-supervised learning, Masked Image Modelling BibRef

Mansour, Y.[Youssef], Zhong, X.Y.[Xu-Yang], Caglar, S.[Serdar], Heckel, R.[Reinhard],
TTT-MIM: Test-time Training with Masked Image Modeling for Denoising Distribution Shifts,
ECCV24(XII: 341-357).
Springer DOI 2412
Code:
WWW Link. BibRef

Marathe, K.[Kalyani], Bigverdi, M.[Mahtab], Khan, N.[Nishat], Kundu, T.[Tuhin], Howe, P.[Patrick], Ranjit, S.S.[S. Sharan], Bhattad, A.[Anand], Kembhavi, A.[Aniruddha], Shapiro, L.G.[Linda G.], Krishna, R.[Ranjay],
MIMIC: Masked Image Modeling with Image Correspondences,
L3D24(718-727)
IEEE DOI 2410
Representation learning, Point cloud compression, Soft sensors, Image edge detection, MIMICs, Buildings, Masked Image Modeling, Dense representation learning BibRef

Wei, Y.B.[Yi-Bing], Gupta, A.[Abhinav], Morgado, P.[Pedro],
Towards Latent Masked Image Modeling for Self-supervised Visual Representation Learning,
ECCV24(XXXIX: 1-17).
Springer DOI 2412
Code:
WWW Link. BibRef

Wang, W.X.[Wen-Xuan], Wang, J.[Jing], Chen, C.[Chen], Jiao, J.B.[Jian-Bo], Cai, Y.X.[Yuan-Xiu], Song, S.S.[Shan-Shan], Li, J.Y.[Jiang-Yun],
FreMIM: Fourier Transform Meets Masked Image Modeling for Medical Image Segmentation,
WACV24(7845-7855)
IEEE DOI Code:
WWW Link. 2404
Representation learning, Image segmentation, Visualization, Frequency-domain analysis, Semantics, Benchmark testing, Image recognition and understanding BibRef

Xu, J.[Junde], Lin, Z.K.[Zi-Kai], Zhou, D.H.[Dong-Hao], Yang, Y.D.[Yao-Dong], Liao, X.Y.[Xiang-Yun], Wang, Q.[Qiong], Wu, B.[Bian], Chen, G.Y.[Guang-Yong], Heng, P.A.[Pheng-Ann],
DPPMask: Masked Image Modeling with Determinantal Point Processes,
WACV24(2255-2265)
IEEE DOI 2404
Training, Semantics, Force, Random processes, Task analysis, Image reconstruction, Algorithms, Machine learning architectures BibRef

Xie, Z.[Zhenda], Zhang, Z.[Zheng], Cao, Y.[Yue], Lin, Y.T.[Yu-Tong], Wei, Y.X.[Yi-Xuan], Dai, Q.[Qi], Hu, H.[Han],
On Data Scaling in Masked Image Modeling,
CVPR23(10365-10374)
IEEE DOI 2309

WWW Link. BibRef

Zhu, S.J.[Sheng-Jie], Liu, X.M.[Xiao-Ming],
PMatch: Paired Masked Image Modeling for Dense Geometric Matching,
CVPR23(21909-21918)
IEEE DOI 2309
BibRef

Kong, X.W.[Xiang-Wen], Zhang, X.Y.[Xiang-Yu],
Understanding Masked Image Modeling via Learning Occlusion Invariant Feature,
CVPR23(6241-6251)
IEEE DOI 2309
BibRef

Fang, Y.X.[Yu-Xin], Yang, S.S.[Shu-Sheng], Wang, S.J.[Shi-Jie], Ge, Y.X.[Yi-Xiao], Shan, Y.[Ying], Wang, X.G.[Xing-Gang],
Unleashing Vanilla Vision Transformer with Masked Image Modeling for Object Detection,
ICCV23(6221-6230)
IEEE DOI Code:
WWW Link. 2401
BibRef

Zhang, C.[Cong], Liu, T.S.[Tian-Shan], Ju, Y.K.[Ya-Kun], Lam, K.M.[Kin-Man],
Pyramid Masked Image Modeling for Transformer-Based Aerial Object Detection,
ICIP23(1675-1679)
IEEE DOI 2312
BibRef

Xue, H.W.[Hong-Wei], Gao, P.[Peng], Li, H.Y.[Hong-Yang], Qiao, Y.[Yu], Sun, H.[Hao], Li, H.Q.[Hou-Qiang], Luo, J.B.[Jie-Bo],
Stare at What You See: Masked Image Modeling without Reconstruction,
CVPR23(22732-22741)
IEEE DOI 2309

WWW Link. masked autoencoder BibRef

Wang, H.Q.[Hao-Qing], Tang, Y.H.[Ye-Hui], Wang, Y.H.[Yun-He], Guo, J.Y.[Jian-Yuan], Deng, Z.H.[Zhi-Hong], Han, K.[Kai],
Masked Image Modeling with Local Multi-Scale Reconstruction,
CVPR23(2122-2131)
IEEE DOI 2309
BibRef

Wang, H.C.[Hao-Chen], Song, K.[Kaiyou], Fan, J.S.[Jun-Song], Wang, Y.X.[Yu-Xi], Xie, J.[Jin], Zhang, Z.X.[Zhao-Xiang],
Hard Patches Mining for Masked Image Modeling,
CVPR23(10375-10385)
IEEE DOI 2309

WWW Link. BibRef

Bashkirova, D.[Dina], Lezama, J.[José], Sohn, K.[Kihyuk], Saenko, K.[Kate], Essa, I.[Irfan],
MaskSketch: Unpaired Structure-guided Masked Image Generation,
CVPR23(1879-1889)
IEEE DOI 2309

WWW Link. Plus a sketch for guidance. BibRef

Liu, Y.[Yuan], Zhang, S.Y.[Song-Yang], Chen, J.C.[Jia-Cheng], Yu, Z.H.[Zhao-Hui], Chen, K.[Kai], Lin, D.[Dahua],
Improving Pixel-based MIM by Reducing Wasted Modeling Capability,
ICCV23(5338-5349)
IEEE DOI 2401
Masked Image Modeling. BibRef

Chen, Z.[Zekai], Agarwal, D.[Devansh], Aggarwal, K.[Kshitij], Safta, W.[Wiem], Balan, M.M.[Mariann Micsinai], Brown, K.[Kevin],
Masked Image Modeling Advances 3D Medical Image Analysis,
WACV23(1969-1979)
IEEE DOI 2302

WWW Link. Training, Solid modeling, Analytical models, Image segmentation, Self-supervised learning, Predictive models. BibRef

Zhan, Y.C.[Yu-Cheng], Zhao, Y.C.[Yu-Cheng], Luo, C.[Chong], Zhang, Y.Y.[Yue-Yi], Sun, X.Y.[Xiao-Yan],
Attention-Guided Contrastive Masked Image Modeling for Transformer-Based Self-Supervised Learning,
ICIP23(2490-2494)
IEEE DOI Code:
WWW Link. 2312
BibRef

Xie, Z.D.[Zhen-Da], Zhang, Z.[Zheng], Cao, Y.[Yue], Lin, Y.T.[Yu-Tong], Bao, J.M.[Jian-Min], Yao, Z.L.[Zhu-Liang], Dai, Q.[Qi], Hu, H.[Han],
SimMIM: a Simple Framework for Masked Image Modeling,
CVPR22(9643-9653)
IEEE DOI 2210

WWW Link. Representation learning, Training, Head, Self-supervised learning, Predictive models, Data models, Self- semi- meta- Representation learning BibRef

Kakogeorgiou, I.[Ioannis], Gidaris, S.[Spyros], Psomas, B.[Bill], Avrithis, Y.[Yannis], Bursuc, A.[Andrei], Karantzalos, K.[Konstantinos], Komodakis, N.[Nikos],
What to Hide from Your Students: Attention-Guided Masked Image Modeling,
ECCV22(XXX:300-318).
Springer DOI 2211

WWW Link. BibRef

Zhao, Y.C.[Yu-Cheng], Wang, G.T.[Guang-Ting], Luo, C.[Chong], Zeng, W.J.[Wen-Jun], Zha, Z.J.[Zheng-Jun],
Self-Supervised Visual Representations Learning by Contrastive Mask Prediction,
ICCV21(10140-10149)
IEEE DOI 2203
Training, Representation learning, Visualization, Head, Semantics, Performance gain, Representation learning, Transfer/Low-shot/Semi/Unsupervised Learning BibRef

Xie, Z.[Zhenda], Geng, Z.[Zigang], Hu, J.C.[Jing-Cheng], Zhang, Z.[Zheng], Hu, H.[Han], Cao, Y.[Yue],
Revealing the Dark Secrets of Masked Image Modeling,
CVPR23(14475-14485)
IEEE DOI 2309

WWW Link. Masked image modeling (MIM) as pre-training BibRef

Hoyer, L.[Lukas], Dai, D.X.[Deng-Xin], Wang, H.R.[Hao-Ran], Van Gool, L.J.[Luc J.],
MIC: Masked Image Consistency for Context-Enhanced Domain Adaptation,
CVPR23(11721-11732)
IEEE DOI 2309
BibRef

Li, J.Y.[Jing-Yao], Chen, P.G.[Peng-Guang], He, Z.X.[Ze-Xin], Yu, S.[Shaozuo], Liu, S.[Shu], Jia, J.Y.[Jia-Ya],
Rethinking Out-of-distribution (OOD) Detection: Masked Image Modeling is All You Need,
CVPR23(11578-11589)
IEEE DOI 2309
BibRef

Chapter on 2-D Feature Analysis, Extraction and Representations, Shape, Skeletons, Texture continues in
Interest Operators, Interest Points, Feature Points, Salient Points .


Last update:Nov 2, 2025 at 14:03:07