20.7.3.1 Inspection Systems -- General, Survey, Review

Chapter Contents (Back)
Application, Inspection. Survey, Inspection.

Chin, R.T.[Roland T.],
Automated Visual Inspection Techniques and Applications: A Bibliography,
PR(15), No. 4, 1982, pp. 343-357.
Elsevier DOI Survey, Inspection. A bibliography of inspection papers broken into various categories. Overview, general, rationales for automating inspection, system components and design considerations, commercially available, pc patterns, microcircuit photomasks, chip inspection and alignment for bonding, inspection of other electrical and electronic assemblies, auto parts, metal processing industry, fabric, radiographic imaging, other applications. There is no evaluation of the various papers. BibRef 8200

Chin, R.T.[Roland T.],
Automated Visual Inspection: 1981 to 1987,
CVGIP(41), No. 3, March 1988, pp. 346-381.
Elsevier DOI Survey, Inspection. Updated papers from the first one. BibRef 8803

Chin, R.T., and Harlow, C.A.,
Automated Visual Inspection: A Survey,
PAMI(4), No. 6, November, 1982, pp. 557-573. Survey, Inspection. A large number (200) of references to work in the mid to late 1970s. BibRef 8211

Chin, R.T.,
Algorithms and Techniques for Automated Visual Inspection,
HPRIP86(587-612). BibRef 8600

Jarvis, J.F.,
Visual Inspection Automation,
Computer(13), No. 5, May 1980, pp. 32-38. BibRef 8005

Fu, K.S.,
Pictorial Pattern Recognition for Industrial Inspection,
PDA83(335-349). BibRef 8300

Porter, III, G.B., and Mundy, J.L.,
Visual Inspection System Design,
Computer(13), No. 5, May 1980, pp. 40-48. BibRef 8005

Meyers, W.,
Industry Begins to Use Visual Pattern Recognition,
Computer(13), No. 5, May 1980, pp. 21-31. BibRef 8005

Agin, G.J.,
Computer Vision Systems for Industrial Inspection and Assembly,
Computer(13), No. 5, May 1980, pp. 11-20. BibRef 8005

Yachida, M., Tsuji, S.,
Industrial Computer Vision in Japan,
Computer(13), No. 5, May 1980, pp. 50-63. BibRef 8005

Newman, T.S., Jain, A.K.,
A Survey of Automated Visual Inspection,
CVIU(61), No. 2, March 1995, pp. 231-262.
DOI Link Survey, Inspection. An extensive survey of how to do visual inspection and how to analyze the results. BibRef 9503

Marshall, A.D., and Martin, R.R.,
Computer Vision, Models and Inspection,
River Edge, NJ: World Scientific1992, ISBN 981-02-0772-7. BibRef 9200

Pau, L.F.,
Computer Vision in Electronics Applications,
New York: PlenumPress, 1990. BibRef 9000 Book BibRef

Asundi, A.,
Special Issue on Computer-Aided Measurement and Inspection,
OptLas(22), No. 3, 1995, pp. 159-160. BibRef 9500

Chen, Y.H.,
Computer Vision for General-Purpose Visual Inspection: A Fuzzy-Logic Approach,
OptLas(22), No. 3, 1995, pp. 181-192. BibRef 9500

Sobh, T.M., Owen, J., Jaynes, C., Dekhil, M., Henderson, T.C.,
Industrial Inspection and Reverse Engineering,
CVIU(61), No. 3, May 1995, pp. 468-474.
DOI Link BibRef 9505

Chen, F.L., Su, C.T.,
Vision-Based Automated Inspection System in Computer-Integrated Manufacturing,
IJAMT(11), No. 3, 1996, pp. 206-213. BibRef 9600

Davies, E.R., Ip, H.H.S.[Horace H.S.],
Guest Editorial: Special Issue on Real-Time Visual Monitoring and Inspection,
RealTimeImg(4), No. 5, October 1998, pp. 313-315. BibRef 9810

Davies, E.R.,
Principles Emerging from the Design of Visual Search Algorithms for Practical Inspection Tasks,
IMVIP08(3-20).
IEEE DOI 0809
BibRef

Sablatnig, R.[Robert],
Increasing flexibility for automatic visual inspection: the general analysis graph,
MVA(12), No. 4, 2000, pp. 158-169.
Springer DOI 0101
BibRef

da Fontoura Costa, L.[Luciano], Meriaudeau, F.[Fabrice],
Special Issue on Applied Visual Inspection,
JASP(2002), No. 7, July 2002, pp. 647-648. 0208
BibRef

Shirvaikar, M.V.[Mukul V.],
Trends in automated visual inspection,
RealTimeIP(1), No. 1, October 2006, pp. 41-43.
Springer DOI 0001
Survey, Inspection. BibRef


Sannen, D.[Davy], van Brussel, H.[Hendrik], Nuttin, M.[Marnix],
Learning Visual Quality Inspection from Multiple Humans Using Ensembles of Classifiers,
CVS08(xx-yy).
Springer DOI 0805
BibRef

Hata, S.,
Practical Visual Inspection Techniques: Optics, Micro-electronics and Advanced Software Technology,
ICPR00(Vol IV: 114-117).
IEEE DOI 0009
Review, references are in Japanese so not given. BibRef

Flinchbaugh, B.E.,
Industry Needs for Computer Vision and Pattern Recognition: Panel,
CVPR96(Panel). BibRef 9600

Petkovic, D.,
Human Assisted Computer Vision and Artificial Intelligence -- Why Not?,
CVPR96(Invited Talk). 100% automated inspection is not always possible. Do the easy part automatically. BibRef 9600

Noble, J.A., and Mundy, J.L.,
Constraint Processing Applied to Industrial Inspection and Continuous Product Improvement,
DARPA93(801-809). Software issues for inspection. BibRef 9300

Shapiro, L.G., Haralick, R.M., Pong, T.C.,
The Visual Components of an Automated Inspection Task,
CAIA84(207-210). BibRef 8400

Chapter on Implementations and Applications, Databases, QBIC, Video Analysis, Hardware and Software, Inspection continues in
Inspection -- Chips, Wafers, PCB, PWB, VLSI, IC, Disks, etc. .


Last update:Mar 16, 2024 at 20:36:19