9.1.3.1 Translucent Surfaces, Translucent Materials, Translucency Analysis

Chapter Contents (Back)
Translucent.

Rushmeier, H.E., Torrance, K.E.,
Extending the Radiosity Method to Include Specularly Reflecting and Translucent Materials,
TOG(9), 1990, pp. 1-27. BibRef 9000

Moore, K.D.[Kathleen D.], Peers, P.[Pieter],
An empirical study on the effects of translucency on photometric stereo,
VC(29), No. 6-8, June 2013, pp. 817-824.
WWW Link. 1306
Photometric Stereo. BibRef

Lee, S.K.[Seung-Kyu], Shim, H.J.[Hyun-Jung],
Skewed stereo time-of-flight camera for translucent object imaging,
IVC(43), No. 1, 2015, pp. 27-38.
Elsevier DOI 1512
Translucent object imaging BibRef

Shim, H.J.[Hyun-Jung], Lee, S.K.[Seung-Kyu],
Recovering Translucent Objects Using a Single Time-of-Flight Depth Camera,
CirSysVideo(26), No. 5, May 2016, pp. 841-854.
IEEE DOI 1605
Cameras BibRef

Song, S.J.[Seong-Jong], Shim, H.J.[Hyun-Jung],
Depth Reconstruction of Translucent Objects from a Single Time-of-Flight Camera Using Deep Residual Networks,
ACCV18(V:641-657).
Springer DOI 1906
BibRef

Tanaka, K.[Kenichiro], Mukaigawa, Y.[Yasuhiro], Kubo, H.[Hiroyuki], Matsushita, Y.[Yasuyuki], Yagi, Y.S.[Yasu-Shi],
Recovering Inner Slices of Layered Translucent Objects by Multi-Frequency Illumination,
PAMI(39), No. 4, April 2017, pp. 746-757.
IEEE DOI 1703
BibRef
Earlier:
Recovering inner slices of translucent objects by multi-frequency illumination,
CVPR15(5464-5472)
IEEE DOI 1510
Cameras BibRef

Tian, J., Philpot, W.,
Spectral Transmittance of a Translucent Sand Sample With Directional Illumination,
GeoRS(56), No. 8, August 2018, pp. 4307-4317.
IEEE DOI 1808
drying, infrared spectra, light transmission, quartz, reflectivity, refractive index, remote sensing, sand, soil, ultraviolet spectra, wet BibRef

Todo, H.[Hideki], Yatagawa, T.[Tatsuya], Sawayama, M.[Masataka], Dobashi, Y.[Yoshinori], Kakimoto, M.[Masanori],
Image-based translucency transfer through correlation analysis over multi-scale spatial color distribution,
VC(35), No. 6-8, June 2018, pp. 811-822.
Springer DOI 1906
BibRef


Gkioulekas, I.[Ioannis], Walter, B.[Bruce], Adelson, E.H.[Edward H.], Bala, K.[Kavita], Zickler, T.E.[Todd E.],
On the appearance of translucent edges,
CVPR15(5528-5536)
IEEE DOI 1510
BibRef

Einakian, S.[Sussan], Newman, T.S.[Timothy S.],
Examining Classic Color Harmony Versus Translucency Color Guidelines for Layered Surface Visualization,
ISVC15(I: 318-327).
Springer DOI 1601
BibRef

Dong, B.[Bo], Moore, K.D.[Kathleen D.], Zhang, W.[Weiyi], Peers, P.[Pieter],
Scattering Parameters and Surface Normals from Homogeneous Translucent Materials Using Photometric Stereo,
CVPR14(2299-2306)
IEEE DOI 1409
photometric stereo; subsurface scattering BibRef

Fiaschi, L.[Luca], Diego, F.[Ferran], Gregor, K.[Konstantin], Schiegg, M.[Martin], Koethe, U.[Ullrich], Zlatic, M.[Marta], Hamprecht, F.A.[Fred A.],
Tracking Indistinguishable Translucent Objects over Time Using Weakly Supervised Structured Learning,
CVPR14(2736-2743)
IEEE DOI 1409
latent variables BibRef

Inoshita, C.[Chika], Mukaigawa, Y.[Yasuhiro], Matsushita, Y.[Yasuyuki], Yagi, Y.S.[Yasu-Shi],
Surface Normal Deconvolution: Photometric Stereo for Optically Thick Translucent Objects,
ECCV14(II: 346-359).
Springer DOI 1408
BibRef
Earlier:
Shape from Single Scattering for Translucent Objects,
ECCV12(II: 371-384).
Springer DOI 1210
BibRef

Holroyd, M.[Michael], Lawrence, J.[Jason],
An analysis of using high-frequency sinusoidal illumination to measure the 3D shape of translucent objects,
CVPR11(2985-2991).
IEEE DOI 1106
BibRef

Chen, T.B.[Tong-Bo], Lensch, H.P.A.[Hendrik P. A.], Fuchs, C.[Christian], Seidel, H.P.[Hans-Peter],
Polarization and Phase-Shifting for 3D Scanning of Translucent Objects,
CVPR07(1-8).
IEEE DOI 0706
Deal with translucent objects with structured light system. BibRef

Dey, N., Boucher, A., Thonnat, M.,
Image formation model of a 3-d translucent object observed in light microscopy,
ICIP02(II: 469-472).
IEEE DOI 0210
BibRef

Chapter on 3-D Shape from X -- Shading, Textures, Lasers, Structured Light, Focus, Line Drawings continues in
Surface Roughness, Rough Surfaces .


Last update:Aug 20, 2019 at 20:38:45