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Gong, X.[Xun],
Zhang, Z.[Zhemin],
Rotated and Masked Image Modeling:
A Superior Self-Supervised Method for Classification,
SPLetters(30), 2023, pp. 1477-1481.
IEEE DOI
2311
BibRef
He, Q.[Qibin],
Sun, X.[Xian],
Yan, Z.Y.[Zhi-Yuan],
Wang, B.[Bing],
Zhu, Z.[Zicong],
Diao, W.H.[Wen-Hui],
Yang, M.Y.[Michael Ying],
AST: Adaptive Self-supervised Transformer for optical remote sensing
representation,
PandRS(200), 2023, pp. 41-54.
Elsevier DOI
2306
Cross-scale transformer, Interpretation, Masked image modeling,
Optical remote sensing, Representation learning
BibRef
Chen, X.K.[Xiao-Kang],
Ding, M.Y.[Ming-Yu],
Wang, X.D.[Xiao-Di],
Xin, Y.[Ying],
Mo, S.T.[Shen-Tong],
Wang, Y.H.[Yun-Hao],
Han, S.M.[Shu-Min],
Luo, P.[Ping],
Zeng, G.[Gang],
Wang, J.D.[Jing-Dong],
Context Autoencoder for Self-supervised Representation Learning,
IJCV(132), No. 1, January 2024, pp. 208-223.
Springer DOI
2402
Code:
WWW Link. Masked image modeling (MIM) approach.
BibRef
Huang, Z.C.[Zhi-Cheng],
Jin, X.J.[Xiao-Jie],
Lu, C.Z.[Cheng-Ze],
Hou, Q.[Qibin],
Cheng, M.M.[Ming-Ming],
Fu, D.M.[Dong-Mei],
Shen, X.H.[Xiao-Hui],
Feng, J.S.[Jia-Shi],
Contrastive Masked Autoencoders are Stronger Vision Learners,
PAMI(46), No. 4, April 2024, pp. 2506-2517.
IEEE DOI
2403
Decoding, Image reconstruction, Training, Task analysis, Semantics,
Head, Masked image modeling (MIM), self-supervised learning
BibRef
Xu, J.[Junde],
Lin, Z.K.[Zi-Kai],
Zhou, D.H.[Dong-Hao],
Yang, Y.[Yaodong],
Liao, X.Y.[Xiang-Yun],
Wang, Q.[Qiong],
Wu, B.[Bian],
Chen, G.Y.[Guang-Yong],
Heng, P.A.[Pheng-Ann],
DPPMask: Masked Image Modeling with Determinantal Point Processes,
WACV24(2255-2265)
IEEE DOI
2404
Training, Semantics, Force, Random processes, Task analysis,
Image reconstruction, Algorithms, Machine learning architectures
BibRef
Xie, Z.[Zhenda],
Zhang, Z.[Zheng],
Cao, Y.[Yue],
Lin, Y.T.[Yu-Tong],
Wei, Y.X.[Yi-Xuan],
Dai, Q.[Qi],
Hu, H.[Han],
On Data Scaling in Masked Image Modeling,
CVPR23(10365-10374)
IEEE DOI
2309
WWW Link.
BibRef
Zhu, S.J.[Sheng-Jie],
Liu, X.M.[Xiao-Ming],
PMatch: Paired Masked Image Modeling for Dense Geometric Matching,
CVPR23(21909-21918)
IEEE DOI
2309
BibRef
Kong, X.W.[Xiang-Wen],
Zhang, X.Y.[Xiang-Yu],
Understanding Masked Image Modeling via Learning Occlusion Invariant
Feature,
CVPR23(6241-6251)
IEEE DOI
2309
BibRef
Fang, Y.X.[Yu-Xin],
Yang, S.[Shusheng],
Wang, S.J.[Shi-Jie],
Ge, Y.X.[Yi-Xiao],
Shan, Y.[Ying],
Wang, X.G.[Xing-Gang],
Unleashing Vanilla Vision Transformer with Masked Image Modeling for
Object Detection,
ICCV23(6221-6230)
IEEE DOI Code:
WWW Link.
2401
BibRef
Zhang, C.[Cong],
Liu, T.S.[Tian-Shan],
Ju, Y.K.[Ya-Kun],
Lam, K.M.[Kin-Man],
Pyramid Masked Image Modeling for Transformer-Based Aerial Object
Detection,
ICIP23(1675-1679)
IEEE DOI
2312
BibRef
Xue, H.W.[Hong-Wei],
Gao, P.[Peng],
Li, H.Y.[Hong-Yang],
Qiao, Y.[Yu],
Sun, H.[Hao],
Li, H.Q.[Hou-Qiang],
Luo, J.B.[Jie-Bo],
Stare at What You See: Masked Image Modeling without Reconstruction,
CVPR23(22732-22741)
IEEE DOI
2309
WWW Link. masked autoencoder
BibRef
Wang, H.Q.[Hao-Qing],
Tang, Y.[Yehui],
Wang, Y.H.[Yun-He],
Guo, J.[Jianyuan],
Deng, Z.H.[Zhi-Hong],
Han, K.[Kai],
Masked Image Modeling with Local Multi-Scale Reconstruction,
CVPR23(2122-2131)
IEEE DOI
2309
BibRef
Wang, H.C.[Hao-Chen],
Song, K.[Kaiyou],
Fan, J.S.[Jun-Song],
Wang, Y.X.[Yu-Xi],
Xie, J.[Jin],
Zhang, Z.X.[Zhao-Xiang],
Hard Patches Mining for Masked Image Modeling,
CVPR23(10375-10385)
IEEE DOI
2309
WWW Link.
BibRef
Bashkirova, D.[Dina],
Lezama, J.[José],
Sohn, K.[Kihyuk],
Saenko, K.[Kate],
Essa, I.[Irfan],
MaskSketch: Unpaired Structure-guided Masked Image Generation,
CVPR23(1879-1889)
IEEE DOI
2309
WWW Link. Plus a sketch for guidance.
BibRef
Liu, Y.[Yuan],
Zhang, S.Y.[Song-Yang],
Chen, J.C.[Jia-Cheng],
Yu, Z.H.[Zhao-Hui],
Chen, K.[Kai],
Lin, D.[Dahua],
Improving Pixel-based MIM by Reducing Wasted Modeling Capability,
ICCV23(5338-5349)
IEEE DOI
2401
Masked Image Modeling.
BibRef
Chen, Z.[Zekai],
Agarwal, D.[Devansh],
Aggarwal, K.[Kshitij],
Safta, W.[Wiem],
Balan, M.M.[Mariann Micsinai],
Brown, K.[Kevin],
Masked Image Modeling Advances 3D Medical Image Analysis,
WACV23(1969-1979)
IEEE DOI
2302
WWW Link. Training, Solid modeling, Analytical models, Image segmentation,
Self-supervised learning, Predictive models.
BibRef
Zhan, Y.C.[Yu-Cheng],
Zhao, Y.C.[Yu-Cheng],
Luo, C.[Chong],
Zhang, Y.Y.[Yue-Yi],
Sun, X.Y.[Xiao-Yan],
Attention-Guided Contrastive Masked Image Modeling for
Transformer-Based Self-Supervised Learning,
ICIP23(2490-2494)
IEEE DOI Code:
WWW Link.
2312
BibRef
Xie, Z.D.[Zhen-Da],
Zhang, Z.[Zheng],
Cao, Y.[Yue],
Lin, Y.T.[Yu-Tong],
Bao, J.M.[Jian-Min],
Yao, Z.L.[Zhu-Liang],
Dai, Q.[Qi],
Hu, H.[Han],
SimMIM: a Simple Framework for Masked Image Modeling,
CVPR22(9643-9653)
IEEE DOI
2210
WWW Link. Representation learning, Training, Head, Self-supervised learning,
Predictive models, Data models, Self- semi- meta- Representation learning
BibRef
Kakogeorgiou, I.[Ioannis],
Gidaris, S.[Spyros],
Psomas, B.[Bill],
Avrithis, Y.[Yannis],
Bursuc, A.[Andrei],
Karantzalos, K.[Konstantinos],
Komodakis, N.[Nikos],
What to Hide from Your Students: Attention-Guided Masked Image Modeling,
ECCV22(XXX:300-318).
Springer DOI
2211
WWW Link.
BibRef
Zhao, Y.C.[Yu-Cheng],
Wang, G.T.[Guang-Ting],
Luo, C.[Chong],
Zeng, W.J.[Wen-Jun],
Zha, Z.J.[Zheng-Jun],
Self-Supervised Visual Representations Learning by Contrastive Mask
Prediction,
ICCV21(10140-10149)
IEEE DOI
2203
Training, Representation learning, Visualization, Head, Semantics,
Performance gain, Representation learning,
Transfer/Low-shot/Semi/Unsupervised Learning
BibRef
Xie, Z.[Zhenda],
Geng, Z.[Zigang],
Hu, J.C.[Jing-Cheng],
Zhang, Z.[Zheng],
Hu, H.[Han],
Cao, Y.[Yue],
Revealing the Dark Secrets of Masked Image Modeling,
CVPR23(14475-14485)
IEEE DOI
2309
WWW Link. Masked image modeling (MIM) as pre-training
BibRef
Hoyer, L.[Lukas],
Dai, D.X.[Deng-Xin],
Wang, H.R.[Hao-Ran],
Van Gool, L.J.[Luc J.],
MIC: Masked Image Consistency for Context-Enhanced Domain Adaptation,
CVPR23(11721-11732)
IEEE DOI
2309
BibRef
Li, J.Y.[Jing-Yao],
Chen, P.G.[Peng-Guang],
He, Z.X.[Ze-Xin],
Yu, S.[Shaozuo],
Liu, S.[Shu],
Jia, J.Y.[Jia-Ya],
Rethinking Out-of-distribution (OOD) Detection: Masked Image Modeling
is All You Need,
CVPR23(11578-11589)
IEEE DOI
2309
BibRef
Chapter on 2-D Feature Analysis, Extraction and Representations, Shape, Skeletons, Texture continues in
Interest Operators, Interest Points, Feature Points, Salient Points .