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micro-crack image detection", JOURNAL = PRL, VOLUME = "189", YEAR = "2025", PAGES = "157-165", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236183"} @inproceedings{bb241265, AUTHOR = "Yang, S. and Chen, Z.F. and Chen, P.G. and Fang, X. and Liang, Y.X. and Liu, S. and Chen, Y.C.", TITLE = "Defect Spectrum: A Granular Look of Large-scale Defect Datasets with Rich Semantics", BOOKTITLE = ECCV24, YEAR = "2024", PAGES = "VII: 187-203", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236184"} @inproceedings{bb241266, AUTHOR = "Shi, Q.F. and Wei, J. and Shen, F. and Zhang, Z.T.", TITLE = "Few-shot Defect Image Generation Based on Consistency Modeling", BOOKTITLE = ECCV24, YEAR = "2024", PAGES = "LXXVI: 360-376", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236185"} @inproceedings{bb241267, AUTHOR = "Tang, J.Q. and Lu, H. and Xu, X.G. and Wu, R.Z. and Hu, S. and Zhang, T. and Cheng, T.W. and Ge, M. and Chen, Y.C. and Tsung, F.", TITLE = "An Incremental Unified Framework for Small Defect Inspection", BOOKTITLE = ECCV24, YEAR = "2024", PAGES = "XXXI: 307-324", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236186"} @inproceedings{bb241268, AUTHOR = "Cogranne, R.", TITLE = "Detectability of Defects in the Presence of Linear Nuisance Parameters and Images Signal-Dependent Noise", BOOKTITLE = ICIP24, YEAR = "2024", PAGES = "1357-1363", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236187"} @inproceedings{bb241269, AUTHOR = "Benz, C. and Rodehorst, V.", TITLE = "MVCrackViT: Robust Multi-View Crack Detection For Point Cloud Segmentation Using View Attention", BOOKTITLE = ICIP24, YEAR = "2024", PAGES = "3443-3449", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236188"} @inproceedings{bb241270, AUTHOR = "Banerjee, P. and Saxena, P. and Kalimullah, N.M.M. and Shelke, A. and Habib, A.", TITLE = "Damage Detection and Localization by Learning Deep Features of Elastic Waves in Piezoelectric Ceramic Using Point Contact Method", BOOKTITLE = Materials24, YEAR = "2024", PAGES = "63-70", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236189"} @inproceedings{bb241271, AUTHOR = "Benz, C. and Rodehorst, V.", TITLE = "Omni-Crack30k: A Benchmark for Crack Segmentation and the Reasonable Effectiveness of Transfer Learning", BOOKTITLE = VAND24, YEAR = "2024", PAGES = "3876-3886", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236190"} @inproceedings{bb241272, AUTHOR = "Chen, Z.Z. and Lai, Z. and Chen, J. and Li, J.Q.", TITLE = "Mind marginal non-crack regions: Clustering-inspired representation learning for crack segmentation", BOOKTITLE = CVPR24, YEAR = "2024", PAGES = "12698-12708", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236191"} @inproceedings{bb241273, AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z.N. and Zhu, G.M. and Liu, Z. and Chen, J. and Li, J.Q.", TITLE = "The Devil is in the Crack Orientation: A New Perspective for Crack Detection", BOOKTITLE = ICCV23, YEAR = "2023", PAGES = "6630-6640", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236192"} @inproceedings{bb241274, AUTHOR = "Tao, H.Q. and Liu, B.X. and Cui, J.Q. and Zhang, H.", TITLE = "A Convolutional-Transformer Network for Crack Segmentation with Boundary Awareness", BOOKTITLE = ICIP23, YEAR = "2023", PAGES = "86-90", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236193"} @inproceedings{bb241275, AUTHOR = "Lei, J.R. and Hu, X.B. and Wang, Y. and Liu, D.", TITLE = "PyramidFlow: High-Resolution Defect Contrastive Localization Using Pyramid Normalizing Flow", BOOKTITLE = CVPR23, YEAR = "2023", PAGES = "14143-14152", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236194"} @inproceedings{bb241276, AUTHOR = "Lee, X.Y. and Vidyaratne, L. and Alam, M. and Farahat, A. and Ghosh, D. and Diaz, T.G. and Gupta, C.", TITLE = "XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual Inspection", BOOKTITLE = VISION23, YEAR = "2023", PAGES = "4375-4384", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236195"} @inproceedings{bb241277, AUTHOR = "Liu, W.Z. and Liu, C. and Liu, Q. and Yu, D.", TITLE = "Assigned MURA Defect Generation Based on Diffusion Model", BOOKTITLE = VISION23, YEAR = "2023", PAGES = "4395-4402", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236196"} @inproceedings{bb241278, AUTHOR = "Xu, L. and Zou, H. and Okatani, T.", TITLE = "How Do Label Errors Affect Thin Crack Detection by DNNs", BOOKTITLE = VISION23, YEAR = "2023", PAGES = "4414-4423", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236197"} @inproceedings{bb241279, AUTHOR = "Kulkarni, S. and Singh, S. and Balakrishnan, D. and Sharma, S. and Devunuri, S. and Korlapati, S.C.R.", TITLE = "Crackseg9k: A Collection and Benchmark for Crack Segmentation Datasets and Frameworks", BOOKTITLE = CVCivil22, YEAR = "2022", PAGES = "179-195", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236198"} @inproceedings{bb241280, AUTHOR = "Zhang, X. and Huang, H.F.", TITLE = "LightAUNet: A Lightweight Fusing Attention Based UNet for Crack Detection", BOOKTITLE = ICIVC22, YEAR = "2022", PAGES = "178-182", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236199"} @inproceedings{bb241281, AUTHOR = "Orti, J. and Moreno Noguer, F. and Puig, V.", TITLE = "Guided-Crop Image Augmentation for Small Defect Classification", BOOKTITLE = "ICPR22", YEAR = "2022", PAGES = "104-110", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236200"} @inproceedings{bb241282, AUTHOR = "Fang, F. and Xu, Q.L. and Lim, J.H.", TITLE = "Hierarchical Defect Detection Based On Reinforcement Learning", BOOKTITLE = ICIP22, YEAR = "2022", PAGES = "791-795", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236201"} @inproceedings{bb241283, AUTHOR = "Wang, B. and Zhou, H. and Luo, W.R. and Li, C.Y. and Li, Z.B. and Tian, Z.Q.", TITLE = "psi-Net is an Efficient Tiny Defect Detector", BOOKTITLE = ICIP22, YEAR = "2022", PAGES = "796-800", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236202"} @inproceedings{bb241284, AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z. and Chen, J. and Liu, Z. and Li, J.Q.", TITLE = "Geometry-Aware Guided Loss for Deep Crack Recognition", BOOKTITLE = CVPR22, YEAR = "2022", PAGES = "4693-4702", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236203"} @inproceedings{bb241285, AUTHOR = "Liu, H.J. and Miao, X.Y. and Mertz, C. and Xu, C.Z. and Kong, H.", TITLE = "CrackFormer: Transformer Network for Fine-Grained Crack Detection", BOOKTITLE = ICCV21, YEAR = "2021", PAGES = "3763-3772", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236204"} 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Christlein, V.", TITLE = "Craquelurenet: Matching the Crack Structure In Historical Paintings for Multi-Modal Image Registration", BOOKTITLE = ICIP21, YEAR = "2021", PAGES = "994-998", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236208"} @inproceedings{bb241290, AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.", TITLE = "Defect Inspection using Gravitation Loss and Soft Labels", BOOKTITLE = ICIP21, YEAR = "2021", PAGES = "1184-1188", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236209"} @inproceedings{bb241291, AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.", TITLE = "Cam-Guided U-Net With Adversarial Regularization for Defect Segmentation", BOOKTITLE = ICIP21, YEAR = "2021", PAGES = "1054-1058", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236210"} @inproceedings{bb241292, AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.", TITLE = "Normal Image Generation-Based Defect Detection by Generative Adversarial Network with Chaotic Random Images", BOOKTITLE = ISVC21, YEAR = "2021", PAGES = "I:353-365", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236211"} @inproceedings{bb241293, AUTHOR = "Benz, C. and Rodehorst, V.", TITLE = "Model-based Crack Width Estimation using Rectangle Transform", BOOKTITLE = MVA21, YEAR = "2021", PAGES = "1-5", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236212"} @inproceedings{bb241294, AUTHOR = "Kondo, Y. and Ukita, N.", TITLE = "Crack Segmentation for Low-Resolution Images using Joint Learning with Super- Resolution", BOOKTITLE = MVA21, YEAR = "2021", PAGES = "1-6", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236213"} @inproceedings{bb241295, AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.", TITLE = "Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection", BOOKTITLE = WACV21, YEAR = "2021", 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