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PAGES = "63-70",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235977"}
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AUTHOR = "Benz, C. and Rodehorst, V.",
TITLE = "Omni-Crack30k: A Benchmark for Crack Segmentation and the Reasonable
Effectiveness of Transfer Learning",
BOOKTITLE = VAND24,
YEAR = "2024",
PAGES = "3876-3886",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235978"}
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AUTHOR = "Chen, Z.Z. and Lai, Z. and Chen, J. and Li, J.Q.",
TITLE = "Mind marginal non-crack regions: Clustering-inspired representation
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BOOKTITLE = CVPR24,
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PAGES = "12698-12708",
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@inproceedings{bb241061,
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TITLE = "The Devil is in the Crack Orientation: A New Perspective for Crack
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BOOKTITLE = ICCV23,
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AUTHOR = "Tao, H.Q. and Liu, B.X. and Cui, J.Q. and Zhang, H.",
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Boundary Awareness",
BOOKTITLE = ICIP23,
YEAR = "2023",
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BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235981"}
@inproceedings{bb241063,
AUTHOR = "Lei, J.R. and Hu, X.B. and Wang, Y. and Liu, D.",
TITLE = "PyramidFlow: High-Resolution Defect Contrastive Localization Using
Pyramid Normalizing Flow",
BOOKTITLE = CVPR23,
YEAR = "2023",
PAGES = "14143-14152",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235982"}
@inproceedings{bb241064,
AUTHOR = "Lee, X.Y. and Vidyaratne, L. and Alam, M. and Farahat, A. and Ghosh, D. and Diaz, T.G. and Gupta, C.",
TITLE = "XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual
Inspection",
BOOKTITLE = VISION23,
YEAR = "2023",
PAGES = "4375-4384",
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@inproceedings{bb241065,
AUTHOR = "Liu, W.Z. and Liu, C. and Liu, Q. and Yu, D.",
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BOOKTITLE = VISION23,
YEAR = "2023",
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@inproceedings{bb241066,
AUTHOR = "Xu, L. and Zou, H. and Okatani, T.",
TITLE = "How Do Label Errors Affect Thin Crack Detection by DNNs",
BOOKTITLE = VISION23,
YEAR = "2023",
PAGES = "4414-4423",
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@inproceedings{bb241067,
AUTHOR = "Kulkarni, S. and Singh, S. and Balakrishnan, D. and Sharma, S. and Devunuri, S. and Korlapati, S.C.R.",
TITLE = "Crackseg9k: A Collection and Benchmark for Crack Segmentation Datasets
and Frameworks",
BOOKTITLE = CVCivil22,
YEAR = "2022",
PAGES = "179-195",
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@inproceedings{bb241068,
AUTHOR = "Zhang, X. and Huang, H.F.",
TITLE = "LightAUNet: A Lightweight Fusing Attention Based UNet for Crack
Detection",
BOOKTITLE = ICIVC22,
YEAR = "2022",
PAGES = "178-182",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235987"}
@inproceedings{bb241069,
AUTHOR = "Orti, J. and Moreno Noguer, F. and Puig, V.",
TITLE = "Guided-Crop Image Augmentation for Small Defect Classification",
BOOKTITLE = "ICPR22",
YEAR = "2022",
PAGES = "104-110",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235988"}
@inproceedings{bb241070,
AUTHOR = "Fang, F. and Xu, Q.L. and Lim, J.H.",
TITLE = "Hierarchical Defect Detection Based On Reinforcement Learning",
BOOKTITLE = ICIP22,
YEAR = "2022",
PAGES = "791-795",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235989"}
@inproceedings{bb241071,
AUTHOR = "Wang, B. and Zhou, H. and Luo, W.R. and Li, C.Y. and Li, Z.B. and Tian, Z.Q.",
TITLE = "psi-Net is an Efficient Tiny Defect Detector",
BOOKTITLE = ICIP22,
YEAR = "2022",
PAGES = "796-800",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235990"}
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AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z. and Chen, J. and Liu, Z. and Li, J.Q.",
TITLE = "Geometry-Aware Guided Loss for Deep Crack Recognition",
BOOKTITLE = CVPR22,
YEAR = "2022",
PAGES = "4693-4702",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT235991"}
@inproceedings{bb241073,
AUTHOR = "Liu, H.J. and Miao, X.Y. and Mertz, C. and Xu, C.Z. and Kong, H.",
TITLE = "CrackFormer: Transformer Network for Fine-Grained Crack Detection",
BOOKTITLE = ICCV21,
YEAR = "2021",
PAGES = "3763-3772",
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@inproceedings{bb241074,
AUTHOR = "Rudolph, M. and Wehrbein, T. and Rosenhahn, B. and Wandt, B.",
TITLE = "Fully Convolutional Cross-Scale-Flows for Image-based Defect
Detection",
BOOKTITLE = WACV22,
YEAR = "2022",
PAGES = "1829-1838",
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@inproceedings{bb241075,
AUTHOR = "Park, J.H. and Chen, Y.C. and Li, Y.J. and Kitani, K.",
TITLE = "Crack Detection and Refinement Via Deep Reinforcement Learning",
BOOKTITLE = ICIP21,
YEAR = "2021",
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AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and del Bue, A.",
TITLE = "Multi-Illumination Fusion With Crack Enhancement Using
Cycle-Consistent Losses",
BOOKTITLE = ICIP21,
YEAR = "2021",
PAGES = "2898-2902",
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@inproceedings{bb241077,
AUTHOR = "Sindel, A. and Maier, A. and Christlein, V.",
TITLE = "Craquelurenet: Matching the Crack Structure In Historical Paintings
for Multi-Modal Image Registration",
BOOKTITLE = ICIP21,
YEAR = "2021",
PAGES = "994-998",
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@inproceedings{bb241078,
AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.",
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BOOKTITLE = ICIP21,
YEAR = "2021",
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AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
TITLE = "Cam-Guided U-Net With Adversarial Regularization for Defect
Segmentation",
BOOKTITLE = ICIP21,
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AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.",
TITLE = "Normal Image Generation-Based Defect Detection by Generative
Adversarial Network with Chaotic Random Images",
BOOKTITLE = ISVC21,
YEAR = "2021",
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@inproceedings{bb241081,
AUTHOR = "Benz, C. and Rodehorst, V.",
TITLE = "Model-based Crack Width Estimation using Rectangle Transform",
BOOKTITLE = MVA21,
YEAR = "2021",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236000"}
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AUTHOR = "Kondo, Y. and Ukita, N.",
TITLE = "Crack Segmentation for Low-Resolution Images using Joint Learning
with Super- Resolution",
BOOKTITLE = MVA21,
YEAR = "2021",
PAGES = "1-6",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT236001"}
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AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.",
TITLE = "Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect
Inspection",
BOOKTITLE = WACV21,
YEAR = "2021",
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Ensemble and Controlled Illumination",
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AUTHOR = "Guo, T.Y. and Zhang, L.L. and Ding, R. and Yang, G.",
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BOOKTITLE = ICPR21,
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AUTHOR = "Bozic, J. and Tabernik, D. and Skocaj, D.",
TITLE = "End-to-end training of a two-stage neural network for defect
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BOOKTITLE = ICPR21,
YEAR = "2021",
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AUTHOR = "Nava, R. and Fehr, D. and Petry, F. and Tamisier, T.",
TITLE = "Tire Surface Segmentation in Infrared Imaging with Convolutional Neural
Networks",
BOOKTITLE = IMTA20,
YEAR = "2020",
PAGES = "51-62",
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AUTHOR = "Luan, C. and Cui, R. and Sun, L. and Lin, Z.",
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Cross-Category Defect Detection",
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AUTHOR = "Lin, D. and Li, Y. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
TITLE = "CAM-UNET: Class Activation MAP Guided UNET with Feedback Refinement
for Defect Segmentation",
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YEAR = "2020",
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YEAR = "2020",
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Images",
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YEAR = "2020",
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Neural Networks to the Description of Fracture Patterns",
BOOKTITLE = eHeritage19,
YEAR = "2019",
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Stripping Defects Using Convolutional Neural Network",
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