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Semiconductor Industry",
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automatic optical inspection",
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LED Inspection",
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@article{bb185863,
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        TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using
anisotropic diffusion",
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@article{bb185864,
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        TITLE = "Defect detection in patterned wafers using anisotropic kernels",
        JOURNAL = MVA,
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        YEAR = "2010",
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@article{bb185865,
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        TITLE = "Electric contacts inspection using machine vision",
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@article{bb185866,
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        TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression
diagnostics",
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        PAGES = "2397-2404",
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@article{bb185867,
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        TITLE = "Illumination artifacts in hyper-NA vector imaging",
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@article{bb185868,
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        TITLE = "Flat-Panel Color Filter Inspection",
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@article{bb185869,
        AUTHOR = "Benedek, C.",
        TITLE = "Detection of soldering defects in Printed Circuit Boards with
Hierarchical Marked Point Processes",
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@article{bb185870,
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@article{bb185871,
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@article{bb185872,
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application",
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@inproceedings{bb185873,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Spectral Invariant Representation for Spectral Reflectance Image",
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@inproceedings{bb185874,
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System",
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@inproceedings{bb185876,
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application",
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@inproceedings{bb185877,
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@inproceedings{bb185878,
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        TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher
Discriminant Analysis",
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Optical Projection Lithography",
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@inproceedings{bb185880,
        AUTHOR = "Jia, N.N. and Lam, E.Y.",
        TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in
optical lithography",
        BOOKTITLE = ICIP10,
        YEAR = "2010",
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@article{bb185881,
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improved ASM and bag of shape segment in PCB production",
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        NUMBER = "6",
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pattern-integrated interference lithography",
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@article{bb185885,
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Capacitance Extraction in Non-Manhattan Geometries",
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        NUMBER = "4",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT181149"}

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Attentive Vision Method Using an Infrared Camera",
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        NUMBER = "2",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT181150"}

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A comparative analysis",
        JOURNAL = IJCVR,
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        NUMBER = "1/2",
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@article{bb185889,
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Adaptive Support Vector Data Description",
        JOURNAL = IJCV,
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        MONTH = "April",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT181152"}

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neural network and graph cut model",
        JOURNAL = IET-IPR,
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@article{bb185891,
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        TITLE = "Automatic localization of signal sources in photon emission images for
integrated circuit analysis",
        JOURNAL = SIViP,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT181154"}

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        NUMBER = "4",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT181155"}

@article{bb185893,
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        NUMBER = "8",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT181156"}

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        MONTH = "March",
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@article{bb185896,
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convolution network",
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@article{bb185897,
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the International Space Station",
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@inproceedings{bb185898,
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of Liquid Crystal Displays in Array Process",
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@inproceedings{bb185899,
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