Op de Beeck, M.
Co Author Listing * global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy, A
* How image processing can push electron microscopy to its limits
* Object wavefunction reconstruction in high resolution electron microscopy
op den Akker, H.[Harm]
Co Author Listing * Supporting Engagement and Floor Control in Hybrid Meetings
op den Akker, R.[Rieks]
Co Author Listing * Supporting Engagement and Floor Control in Hybrid Meetings