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        AUTHOR = "Guo, J.M. and Yuan, L.D. and Huang, C. and Zeng, Y.C.",
        TITLE = "Advanced Defect Analysis With Self-Supervised Pretraining and
Knowledge Distillation",
        JOURNAL = MultMedMag,
        VOLUME = "32",
        YEAR = "2025",
        NUMBER = "3",
        MONTH = "July",
        PAGES = "15-26",
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@article{bb253956,
        AUTHOR = "Gao, M. and Zhou, Z.Y. and Huang, J.J. and Ding, K.W.",
        TITLE = "PECT Composite Defect Detection Algorithm Based on DualGAN",
        JOURNAL = IJIG,
        VOLUME = "26",
        YEAR = "2026",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "2550070",
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@article{bb253957,
        AUTHOR = "Wang, C. and Tang, J.",
        TITLE = "Reliable Crack Evolution Monitoring from UAV Remote Sensing:
Bridging  Detection and Temporal Dynamics",
        JOURNAL = RS,
        VOLUME = "18",
        YEAR = "2026",
        NUMBER = "1",
        PAGES = "51",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248789"}

@article{bb253958,
        AUTHOR = "Yan, F. and Jiang, X.H. and Lu, Y. and Cui, L. and Cao, J. and Xu, M.L.",
        TITLE = "Global context guided refinement and aggregation network for
lightweight surface defect detection",
        JOURNAL = PR,
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@inproceedings{bb253959,
        AUTHOR = "Minamoto, G. and Ito, S. and Yamaguchi, O. and Takimoto, T.",
        TITLE = "Weakly Supervised Defect Localization with Residual Features",
        BOOKTITLE = ICIP25,
        YEAR = "2025",
        PAGES = "881-886",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248791"}

@inproceedings{bb253960,
        AUTHOR = "Liu, H. and Jia, C. and Shi, F. and Cheng, X. and Chen, S.Y.",
        TITLE = "SCSegamba: Lightweight Structure-Aware Vision Mamba for Crack
Segmentation in Structures",
        BOOKTITLE = CVPR25,
        YEAR = "2025",
        PAGES = "29406-29416",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248792"}

@inproceedings{bb253961,
        AUTHOR = "Yan, F. and Jiang, X.H. and Lu, Y. and Cao, J. and Chen, D. and Xu, M.L.",
        TITLE = "Wavelet and Prototype Augmented Query-based Transformer for
Pixel-level Surface Defect Detection",
        BOOKTITLE = CVPR25,
        YEAR = "2025",
        PAGES = "23860-23869",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248793"}

@inproceedings{bb253962,
        AUTHOR = "Song, J. and Park, D. and Baek, K. and Lee, S. and Choi, J.Y. and Kim, E. and Yoon, S.",
        TITLE = "DefectFill: Realistic Defect Generation with Inpainting Diffusion
Model for Visual Inspection",
        BOOKTITLE = CVPR25,
        YEAR = "2025",
        PAGES = "18718-18727",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248794"}

@inproceedings{bb253963,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Crackstructures and Crackensembles: The Power of Multi-View for 2.5D
Crack Detection",
        BOOKTITLE = WACV25,
        YEAR = "2025",
        PAGES = "5990-5999",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248795"}

@inproceedings{bb253964,
        AUTHOR = "Zim, A.H. and Iqbal, A. and Al Huda, Z. and Malik, A. and Kuribayashi, M.",
        TITLE = "EfficientCrackNet: A Lightweight Model for Crack Segmentation",
        BOOKTITLE = WACV25,
        YEAR = "2025",
        PAGES = "6279-6289",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248796"}

@inproceedings{bb253965,
        AUTHOR = "Chen, X.R. and Li, S. and Yang, W.",
        TITLE = "L-RTDETR: A Lightweight Real-Time Object Detection Algorithm for
Defect Detection",
        BOOKTITLE = ICIVC24,
        YEAR = "2024",
        PAGES = "141-146",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248797"}

@inproceedings{bb253966,
        AUTHOR = "Yang, S. and Chen, Z.F. and Chen, P.G. and Fang, X. and Liang, Y.X. and Liu, S. and Chen, Y.C.",
        TITLE = "Defect Spectrum: A Granular Look of Large-scale Defect Datasets with
Rich Semantics",
        BOOKTITLE = ECCV24,
        YEAR = "2024",
        PAGES = "VII: 187-203",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248798"}

@inproceedings{bb253967,
        AUTHOR = "Shi, Q.F. and Wei, J. and Shen, F. and Zhang, Z.T.",
        TITLE = "Few-shot Defect Image Generation Based on Consistency Modeling",
        BOOKTITLE = ECCV24,
        YEAR = "2024",
        PAGES = "LXXVI: 360-376",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248799"}

@inproceedings{bb253968,
        AUTHOR = "Tang, J.Q. and Lu, H. and Xu, X.G. and Wu, R.Z. and Hu, S. and Zhang, T. and Cheng, T.W. and Ge, M. and Chen, Y.C. and Tsung, F.",
        TITLE = "An Incremental Unified Framework for Small Defect Inspection",
        BOOKTITLE = ECCV24,
        YEAR = "2024",
        PAGES = "XXXI: 307-324",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248800"}

@inproceedings{bb253969,
        AUTHOR = "Cogranne, R.",
        TITLE = "Detectability of Defects in the Presence of Linear Nuisance
Parameters and Images Signal-Dependent Noise",
        BOOKTITLE = ICIP24,
        YEAR = "2024",
        PAGES = "1357-1363",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248801"}

@inproceedings{bb253970,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "MVCrackViT: Robust Multi-View Crack Detection For Point Cloud
Segmentation Using View Attention",
        BOOKTITLE = ICIP24,
        YEAR = "2024",
        PAGES = "3443-3449",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248802"}

@inproceedings{bb253971,
        AUTHOR = "Banerjee, P. and Saxena, P. and Kalimullah, N.M.M. and Shelke, A. and Habib, A.",
        TITLE = "Damage Detection and Localization by Learning Deep Features of
Elastic Waves in Piezoelectric Ceramic Using Point Contact Method",
        BOOKTITLE = Materials24,
        YEAR = "2024",
        PAGES = "63-70",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248803"}

@inproceedings{bb253972,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Omni-Crack30k: A Benchmark for Crack Segmentation and the Reasonable
Effectiveness of Transfer Learning",
        BOOKTITLE = VAND24,
        YEAR = "2024",
        PAGES = "3876-3886",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248804"}

@inproceedings{bb253973,
        AUTHOR = "Chen, Z.Z. and Lai, Z. and Chen, J. and Li, J.Q.",
        TITLE = "Mind marginal non-crack regions: Clustering-inspired representation
learning for crack segmentation",
        BOOKTITLE = CVPR24,
        YEAR = "2024",
        PAGES = "12698-12708",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248805"}

@inproceedings{bb253974,
        AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z.N. and Zhu, G.M. and Liu, Z. and Chen, J. and Li, J.Q.",
        TITLE = "The Devil is in the Crack Orientation: A New Perspective for Crack
Detection",
        BOOKTITLE = ICCV23,
        YEAR = "2023",
        PAGES = "6630-6640",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248806"}

@inproceedings{bb253975,
        AUTHOR = "Tao, H.Q. and Liu, B.X. and Cui, J.Q. and Zhang, H.",
        TITLE = "A Convolutional-Transformer Network for Crack Segmentation with
Boundary Awareness",
        BOOKTITLE = ICIP23,
        YEAR = "2023",
        PAGES = "86-90",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248807"}

@inproceedings{bb253976,
        AUTHOR = "Lei, J.R. and Hu, X.B. and Wang, Y. and Liu, D.",
        TITLE = "PyramidFlow: High-Resolution Defect Contrastive Localization Using
Pyramid Normalizing Flow",
        BOOKTITLE = CVPR23,
        YEAR = "2023",
        PAGES = "14143-14152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248808"}

@inproceedings{bb253977,
        AUTHOR = "Lee, X.Y. and Vidyaratne, L. and Alam, M. and Farahat, A. and Ghosh, D. and Diaz, T.G. and Gupta, C.",
        TITLE = "XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual
Inspection",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4375-4384",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248809"}

@inproceedings{bb253978,
        AUTHOR = "Liu, W.Z. and Liu, C. and Liu, Q. and Yu, D.",
        TITLE = "Assigned MURA Defect Generation Based on Diffusion Model",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4395-4402",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248810"}

@inproceedings{bb253979,
        AUTHOR = "Xu, L. and Zou, H. and Okatani, T.",
        TITLE = "How Do Label Errors Affect Thin Crack Detection by DNNs",
        BOOKTITLE = VISION23,
        YEAR = "2023",
        PAGES = "4414-4423",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248811"}

@inproceedings{bb253980,
        AUTHOR = "Kulkarni, S. and Singh, S. and Balakrishnan, D. and Sharma, S. and Devunuri, S. and Korlapati, S.C.R.",
        TITLE = "Crackseg9k: A Collection and Benchmark for Crack Segmentation Datasets
and Frameworks",
        BOOKTITLE = CVCivil22,
        YEAR = "2022",
        PAGES = "179-195",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248812"}

@inproceedings{bb253981,
        AUTHOR = "Zhang, X. and Huang, H.F.",
        TITLE = "LightAUNet: A Lightweight Fusing Attention Based UNet for Crack
Detection",
        BOOKTITLE = ICIVC22,
        YEAR = "2022",
        PAGES = "178-182",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248813"}

@inproceedings{bb253982,
        AUTHOR = "Orti, J. and Moreno Noguer, F. and Puig, V.",
        TITLE = "Guided-Crop Image Augmentation for Small Defect Classification",
        BOOKTITLE = "ICPR22",
        YEAR = "2022",
        PAGES = "104-110",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248814"}

@inproceedings{bb253983,
        AUTHOR = "Fang, F. and Xu, Q.L. and Lim, J.H.",
        TITLE = "Hierarchical Defect Detection Based On Reinforcement Learning",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "791-795",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248815"}

@inproceedings{bb253984,
        AUTHOR = "Wang, B. and Zhou, H. and Luo, W.R. and Li, C.Y. and Li, Z.B. and Tian, Z.Q.",
        TITLE = "psi-Net is an Efficient Tiny Defect Detector",
        BOOKTITLE = ICIP22,
        YEAR = "2022",
        PAGES = "796-800",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248816"}

@inproceedings{bb253985,
        AUTHOR = "Chen, Z.Z. and Zhang, J. and Lai, Z. and Chen, J. and Liu, Z. and Li, J.Q.",
        TITLE = "Geometry-Aware Guided Loss for Deep Crack Recognition",
        BOOKTITLE = CVPR22,
        YEAR = "2022",
        PAGES = "4693-4702",
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@inproceedings{bb253986,
        AUTHOR = "Liu, H.J. and Miao, X.Y. and Mertz, C. and Xu, C.Z. and Kong, H.",
        TITLE = "CrackFormer: Transformer Network for Fine-Grained Crack Detection",
        BOOKTITLE = ICCV21,
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        PAGES = "3763-3772",
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@inproceedings{bb253987,
        AUTHOR = "Rudolph, M. and Wehrbein, T. and Rosenhahn, B. and Wandt, B.",
        TITLE = "Fully Convolutional Cross-Scale-Flows for Image-based Defect
Detection",
        BOOKTITLE = WACV22,
        YEAR = "2022",
        PAGES = "1829-1838",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248819"}

@inproceedings{bb253988,
        AUTHOR = "Park, J.H. and Chen, Y.C. and Li, Y.J. and Kitani, K.",
        TITLE = "Crack Detection and Refinement Via Deep Reinforcement Learning",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "529-533",
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@inproceedings{bb253989,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and del Bue, A.",
        TITLE = "Multi-Illumination Fusion With Crack Enhancement Using
Cycle-Consistent Losses",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "2898-2902",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248821"}

@inproceedings{bb253990,
        AUTHOR = "Sindel, A. and Maier, A. and Christlein, V.",
        TITLE = "Craquelurenet: Matching the Crack Structure In Historical Paintings
for Multi-Modal Image Registration",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "994-998",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248822"}

@inproceedings{bb253991,
        AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.",
        TITLE = "Defect Inspection using Gravitation Loss and Soft Labels",
        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "1184-1188",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248823"}

@inproceedings{bb253992,
        AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.",
        TITLE = "Cam-Guided U-Net With Adversarial Regularization for Defect
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        BOOKTITLE = ICIP21,
        YEAR = "2021",
        PAGES = "1054-1058",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248824"}

@inproceedings{bb253993,
        AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.",
        TITLE = "Normal Image Generation-Based Defect Detection by Generative
Adversarial Network with Chaotic Random Images",
        BOOKTITLE = ISVC21,
        YEAR = "2021",
        PAGES = "I:353-365",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248825"}

@inproceedings{bb253994,
        AUTHOR = "Benz, C. and Rodehorst, V.",
        TITLE = "Model-based Crack Width Estimation using Rectangle Transform",
        BOOKTITLE = MVA21,
        YEAR = "2021",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248826"}

@inproceedings{bb253995,
        AUTHOR = "Kondo, Y. and Ukita, N.",
        TITLE = "Crack Segmentation for Low-Resolution Images using Joint Learning
with Super- Resolution",
        BOOKTITLE = MVA21,
        YEAR = "2021",
        PAGES = "1-6",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248827"}

@inproceedings{bb253996,
        AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.",
        TITLE = "Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect
Inspection",
        BOOKTITLE = WACV21,
        YEAR = "2021",
        PAGES = "2523-2533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248828"}

@inproceedings{bb253997,
        AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and Bustreo, M. and del Bue, A. and Murino, V.",
        TITLE = "A Versatile Crack Inspection Portable System based on Classifier
Ensemble and Controlled Illumination",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "4009-4016",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248829"}

@inproceedings{bb253998,
        AUTHOR = "Guo, T.Y. and Zhang, L.L. and Ding, R.W. and Yang, G.",
        TITLE = "EDD-Net: An Efficient Defect Detection Network",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "8899-8905",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT248830"}

@inproceedings{bb253999,
        AUTHOR = "Bozic, J. and Tabernik, D. and Skocaj, D.",
        TITLE = "End-to-end training of a two-stage neural network for defect
detection",
        BOOKTITLE = ICPR21,
        YEAR = "2021",
        PAGES = "5619-5626",
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Last update:Jan 23, 2026 at 20:54:10