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TITLE = "A Design for Testability of Open Defects at Interconnects in 3D Stacked
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JOURNAL = IEICE,
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YEAR = "2018",
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MONTH = "August",
PAGES = "2053-2063",
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AUTHOR = "Cheng, D. and Shi, Y.Q. and Gwee, B.H. and Toh, K.A. and Lin, T.",
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PAGES = "36-43",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT245642"}
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AUTHOR = "Han, H. and Gao, C.Q. and Zhao, Y. and Liao, S.S. and Tang, L. and Li, X.D.",
TITLE = "Polycrystalline silicon wafer defect segmentation based on deep
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YEAR = "2020",
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AUTHOR = "Shen, J.Q. and Liu, N.Z. and Sun, H.",
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JOURNAL = IET-IPR,
VOLUME = "14",
YEAR = "2020",
NUMBER = "15",
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AUTHOR = "Mitic, V. and Serpa, C. and Ilic, I. and Mohr, M. and Fecht, H.J.",
TITLE = "Fractal Nature of Advanced Ni-Based Superalloys Solidified on Board
the International Space Station",
JOURNAL = RS,
VOLUME = "13",
YEAR = "2021",
NUMBER = "9",
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AUTHOR = "Frittoli, L. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.",
TITLE = "Deep open-set recognition for silicon wafer production monitoring",
JOURNAL = PR,
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TITLE = "EU-Net: A novel semantic segmentation architecture for surface defect
detection of mobile phone screens",
JOURNAL = IET-IPR,
VOLUME = "16",
YEAR = "2022",
NUMBER = "10",
PAGES = "2568-2576",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT245647"}
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AUTHOR = "Lin, G. and Kong, L.F. and Liu, T.J. and Qiu, L. and Chen, X.",
TITLE = "An antagonistic training algorithm for TFT-LCD module mura defect
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JOURNAL = SP:IC,
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YEAR = "2022",
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BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT245648"}
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AUTHOR = "Liu, Q.P. and Wang, M.K. and Wang, H.X. and Hanajima, N.",
TITLE = "MPGI-Terminal defect detection based on M-FRCNN",
JOURNAL = IET-IPR,
VOLUME = "17",
YEAR = "2023",
NUMBER = "2",
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BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT245649"}
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AUTHOR = "Kim, B.J. and Choi, H. and Jang, H. and Lee, D.G. and Jeong, W. and Kim, S.W.",
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JOURNAL = PRL,
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YEAR = "2023",
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TITLE = "Integrated Inspection on PCB Manufacturing in Cyber-Physical-Social
Systems",
JOURNAL = SMCS,
VOLUME = "53",
YEAR = "2023",
NUMBER = "4",
MONTH = "April",
PAGES = "2098-2106",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT245651"}
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AUTHOR = "Zhao, J. and Zhu, B.L. and Peng, M. and Li, L.L.",
TITLE = "Mobile phone screen surface scratch detection based on optimized
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JOURNAL = IET-IPR,
VOLUME = "17",
YEAR = "2023",
NUMBER = "5",
PAGES = "1364-1374",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT245652"}
@article{bb250813,
AUTHOR = "Boubaker, S. and Kamel, S. and Ghazouani, N. and Mellit, A.",
TITLE = "Assessment of Machine and Deep Learning Approaches for Fault
Diagnosis in Photovoltaic Systems Using Infrared Thermography",
JOURNAL = RS,
VOLUME = "15",
YEAR = "2023",
NUMBER = "6",
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AUTHOR = "He, F. and Tan, J. and Wang, W.B. and Liu, S. and Zhu, Y. and Liu, Z.J.",
TITLE = "EFFNet: Element-wise feature fusion network for defect detection of
display panels",
JOURNAL = SP:IC,
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YEAR = "2023",
PAGES = "117043",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT245654"}
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TITLE = "An active learning method based on result quality evaluation for
printed circuit board computed tomography image segmentation",
JOURNAL = IET-IPR,
VOLUME = "17",
YEAR = "2023",
NUMBER = "13",
PAGES = "3688-3701",
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TITLE = "You-Only-Look-Once Multiple-Strategy Printed Circuit Board Defect
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JOURNAL = MultMedMag,
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AUTHOR = "Shen, J. and Lyu, S. and Lu, Y.",
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