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"http://www.visionbib.com/bibliography/applicat844.html#TT220164"} @inproceedings{bb225167, AUTHOR = "Guan, Z.H. and Guo, Z.D. and Lyu, J. and Yuan, Z.", TITLE = "Defect Inspection using Gravitation Loss and Soft Labels", BOOKTITLE = ICIP21, YEAR = "2021", PAGES = "1184-1188", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220165"} @inproceedings{bb225168, AUTHOR = "Lin, D.Y. and Li, Y.Q. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.", TITLE = "Cam-Guided U-Net With Adversarial Regularization for Defect Segmentation", BOOKTITLE = ICIP21, YEAR = "2021", PAGES = "1054-1058", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220166"} @inproceedings{bb225169, AUTHOR = "Kobayashi, H. and Miyoshi, R. and Hashimoto, M.", TITLE = "Normal Image Generation-Based Defect Detection by Generative Adversarial Network with Chaotic Random Images", BOOKTITLE = ISVC21, YEAR = "2021", PAGES = "I:353-365", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220167"} @inproceedings{bb225170, AUTHOR = "Benz, C. and Rodehorst, V.", TITLE = "Model-based Crack Width Estimation using Rectangle Transform", BOOKTITLE = MVA21, YEAR = "2021", PAGES = "1-5", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220168"} @inproceedings{bb225171, AUTHOR = "Kondo, Y. and Ukita, N.", TITLE = "Crack Segmentation for Low-Resolution Images using Joint Learning with Super- Resolution", BOOKTITLE = MVA21, YEAR = "2021", PAGES = "1-6", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220169"} @inproceedings{bb225172, AUTHOR = "Tan, D.S. and Chen, Y.C. and Chen, T.P.C. and Chen, W.C.", TITLE = "TrustMAE: A Noise-Resilient Defect Classification Framework using Memory-Augmented Auto-Encoders with Trust Regions", BOOKTITLE = WACV21, YEAR = "2021", PAGES = "276-285", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220170"} @inproceedings{bb225173, AUTHOR = "Zhang, G.J. and Cui, K.W. and Hung, T.Y. and Lu, S.J.", TITLE = "Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection", BOOKTITLE = WACV21, YEAR = "2021", PAGES = "2523-2533", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220171"} @inproceedings{bb225174, AUTHOR = "Padalkar, M.G. and Beltran Gonzalez, C. and Bustreo, M. and del Bue, A. and Murino, V.", TITLE = "A Versatile Crack Inspection Portable System based on Classifier Ensemble and Controlled Illumination", BOOKTITLE = ICPR21, YEAR = "2021", PAGES = "4009-4016", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220172"} @inproceedings{bb225175, AUTHOR = "Guo, T.Y. and Zhang, L.L. and Ding, R. and Yang, G.", TITLE = "EDD-Net: An Efficient Defect Detection Network", BOOKTITLE = ICPR21, YEAR = "2021", PAGES = "8899-8905", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220173"} @inproceedings{bb225176, AUTHOR = "Bozic, J. and Tabernik, D. and Skocaj, D.", TITLE = "End-to-end training of a two-stage neural network for defect detection", BOOKTITLE = ICPR21, YEAR = "2021", PAGES = "5619-5626", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220174"} @inproceedings{bb225177, AUTHOR = "Nava, R. and Fehr, D. and Petry, F. and Tamisier, T.", TITLE = "Tire Surface Segmentation in Infrared Imaging with Convolutional Neural Networks", BOOKTITLE = IMTA20, YEAR = "2020", PAGES = "51-62", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220175"} @inproceedings{bb225178, AUTHOR = "Luan, C. and Cui, R. and Sun, L. and Lin, Z.", TITLE = "A Siamese Network Utilizing Image Structural Differences For Cross-Category Defect Detection", BOOKTITLE = ICIP20, YEAR = "2020", PAGES = "778-782", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220176"} @inproceedings{bb225179, AUTHOR = "Lin, D. and Li, Y. and Prasad, S. and Nwe, T.L. and Dong, S. and Oo, Z.M.", TITLE = "CAM-UNET: Class Activation MAP Guided UNET with Feedback Refinement for Defect Segmentation", BOOKTITLE = ICIP20, YEAR = "2020", PAGES = "2131-2135", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220177"} @inproceedings{bb225180, AUTHOR = "Boyadjian, Q. and Vanderesse, N. and Toews, M. and Bocher, P.", TITLE = "Detecting Defects in Materials Using Deep Convolutional Neural Networks", BOOKTITLE = ICIAR20, YEAR = "2020", PAGES = "I:293-306", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220178"} @inproceedings{bb225181, AUTHOR = "Xie, Y. and Zhu, F. and Fu, Y.", TITLE = "Main-Secondary Network for Defect Segmentation of Textured Surface Images", BOOKTITLE = WACV20, YEAR = "2020", PAGES = "3520-3529", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220179"} @inproceedings{bb225182, AUTHOR = "Sidorov, O. and Hardeberg, J.Y.", TITLE = "Craquelure as a Graph: Application of Image Processing and Graph Neural Networks to the Description of Fracture Patterns", BOOKTITLE = eHeritage19, YEAR = "2019", PAGES = "1429-1436", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220180"} @inproceedings{bb225183, AUTHOR = "Ting, Y.C. and Lin, D.T. and Chen, C.F. and Tsai, B.C.", TITLE = "Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping Defects Using Convolutional Neural Network", BOOKTITLE = ACIVS20, YEAR = "2020", PAGES = "360-369", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220181"} @inproceedings{bb225184, AUTHOR = "Fang, F. and Li, L. and Rice, M. and Lim, J.", TITLE = "Towards Real-Time Crack Detection Using a Deep Neural Network With a Bayesian Fusion Algorithm", BOOKTITLE = ICIP19, YEAR = "2019", PAGES = "2976-2980", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220182"} @inproceedings{bb225185, AUTHOR = "Mayr, M. and Hoffmann, M. and Maier, A. and Christlein, V.", TITLE = "Weakly Supervised Segmentation of Cracks on Solar Cells Using Normalized Lp Norm", BOOKTITLE = ICIP19, YEAR = "2019", PAGES = "1885-1889", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220183"} @inproceedings{bb225186, AUTHOR = "Jang, C. and Yun, S. and Hwang, H. and Shin, H. and Kim, S. and Park, Y.", TITLE = "A Defect Inspection Method for Machine Vision Using Defect Probability Image with Deep Convolutional Neural Network", BOOKTITLE = ACCV18, YEAR = "2018", PAGES = "I:142-154", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220184"} @inproceedings{bb225187, AUTHOR = "Kobayashi, T.", TITLE = "Spiral-Net with F1-Based Optimization for Image-Based Crack Detection", BOOKTITLE = ACCV18, YEAR = "2018", PAGES = "I:88-104", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220185"} @inproceedings{bb225188, AUTHOR = "Dong, X.H. and Taylor, C.J. and Cootes, T.F.", TITLE = "Small Defect Detection Using Convolutional Neural Network Features and Random Forests", BOOKTITLE 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@inproceedings{bb225198, AUTHOR = "Zapata, D. and Cruz Roa, A. and Jimenez, A.", TITLE = "Automatic Classification of Optical Defects of Mirrors from Ronchigram Images Using Bag of Visual Words and Support Vector Machines", BOOKTITLE = CIARP17, YEAR = "2017", PAGES = "719-726", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220196"} @inproceedings{bb225199, AUTHOR = "Yu, Z.Y. and Wu, X.J. and Gu, X.D.", TITLE = "Fully Convolutional Networks for Surface Defect Inspection in Industrial Environment", BOOKTITLE = CVS17, YEAR = "2017", PAGES = "417-426", BIBSOURCE = "http://www.visionbib.com/bibliography/applicat844.html#TT220197"}