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@article{bb190306,
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and Application to the Built-In Self-Test for Integrated Circuits",
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@article{bb190309,
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        TITLE = "Content-Based Image Retrieval for Semiconductor Process
Characterization",
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        TITLE = "A fast focus measure for video display inspection",
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@article{bb190311,
        AUTHOR = "Roh, Y.J. and Park, W.S. and Cho, H.S.",
        TITLE = "Correcting image distortion in the X-ray digital tomosynthesis system
for PCB solder joint inspection",
        JOURNAL = IVC,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185537"}

@article{bb190312,
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        TITLE = "Flat image recognition in the process of microdevice assembly",
        JOURNAL = PRL,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185538"}

@article{bb190313,
        AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185539"}

@article{bb190314,
        AUTHOR = "Toledo, G.K. and Kussul, E. and Baidyk, T.",
        TITLE = "Work piece recognition based on the permutation neural classifier
technique",
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@article{bb190315,
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        TITLE = "Signature analysis and defect detection in layered manufacturing of
ceramic sensors and actuators",
        JOURNAL = MVA,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185541"}

@article{bb190316,
        AUTHOR = "Zervakis, M.E. and Goumas, S.K. and Rovithakis, G.A.",
        TITLE = "A Bayesian Framework for Multilead SMD Post-Placement Quality
Inspection",
        JOURNAL = SMC-B,
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        MONTH = "February",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185542"}

@inproceedings{bb190317,
        AUTHOR = "Goumas, S.K. and Rovithakis, G.A. and Zervakis, M.E.",
        TITLE = "A Bayesian image analysis framework for post-placement quality
inspection of components",
        BOOKTITLE = ICIP02,
        YEAR = "2002",
        PAGES = "II: 549-552",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185543"}

@article{bb190318,
        AUTHOR = "Kubota, T. and Talekar, P. and Ma, X.Y. and Sudarshan, T.S.",
        TITLE = "A nondestructive automated defect detection system for silicon carbide
wafers",
        JOURNAL = MVA,
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185544"}

@article{bb190319,
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        TITLE = "Unsupervised spatial pattern classification of electrical-wafer-sorting
maps in semiconductor manufacturing",
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@article{bb190320,
        AUTHOR = "Shankar, N.G. and Zhong, Z.W.",
        TITLE = "Improved segmentation of semiconductor defects using area sieves",
        JOURNAL = MVA,
        VOLUME = "17",
        YEAR = "2006",
        NUMBER = "1",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185546"}

@article{bb190321,
        AUTHOR = "Lin, H.D.",
        TITLE = "Tiny surface defect inspection of electronic passive components using
discrete cosine transform decomposition and cumulative sum techniques",
        JOURNAL = IVC,
        VOLUME = "26",
        YEAR = "2008",
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        MONTH = "May",
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        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185547"}

@article{bb190322,
        AUTHOR = "Watanabe, T. and Kusano, A. and Fujiwara, T. and Koshimizu, H.",
        TITLE = "3D Precise Inspection of Terminal Lead for Electronic Devices by Single
Camera Stereo Vision",
        JOURNAL = IEICE,
        VOLUME = "E91-D",
        YEAR = "2008",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "1885-1892",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185548"}

@inproceedings{bb190323,
        AUTHOR = "Kusano, A. and Watanabe, T. and Funahashi, T. and Koshimizu, H.",
        TITLE = "Defect detection of terminal lead by single stereo vision",
        BOOKTITLE = FCV13,
        YEAR = "2013",
        PAGES = "237-241",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185549"}

@article{bb190324,
        AUTHOR = "Last, M. and Kandel, A.",
        TITLE = "Perception-based Analysis Of Engineering Experiments In The
Semiconductor Industry",
        JOURNAL = IJIG,
        VOLUME = "2",
        YEAR = "2002",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "107-126",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185550"}

@article{bb190325,
        AUTHOR = "Ng, A.N.Y. and Lam, E.Y. and Chung, R. and Fung, K.S.M. and Leung, W.H.",
        TITLE = "Reference-free Machine Vision Inspection Of Semiconductor Die Images",
        JOURNAL = IJIG,
        VOLUME = "9",
        YEAR = "2009",
        NUMBER = "1",
        MONTH = "January",
        PAGES = "133-152",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185551"}

@article{bb190326,
        AUTHOR = "Chen, C.S. and Yeh, C.W. and Yin, P.Y.",
        TITLE = "A novel Fourier descriptor based image alignment algorithm for
automatic optical inspection",
        JOURNAL = JVCIR,
        VOLUME = "20",
        YEAR = "2009",
        NUMBER = "3",
        MONTH = "April",
        PAGES = "178-189",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185552"}

@article{bb190327,
        AUTHOR = "Chang, C.Y. and Li, C.H. and Lin, S.Y. and Jeng, M.",
        TITLE = "Application of Two Hopfield Neural Networks for Automatic Four-Element
LED Inspection",
        JOURNAL = SMC-C,
        VOLUME = "39",
        YEAR = "2009",
        NUMBER = "3",
        MONTH = "May",
        PAGES = "352-365",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185553"}

@article{bb190328,
        AUTHOR = "Tsai, D.M. and Chang, C.C. and Chao, S.M.",
        TITLE = "Micro-crack inspection in heterogeneously textured solar wafers using
anisotropic diffusion",
        JOURNAL = IVC,
        VOLUME = "28",
        YEAR = "2010",
        NUMBER = "3",
        MONTH = "March",
        PAGES = "491-501",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185554"}

@article{bb190329,
        AUTHOR = "Zontak, M. and Cohen, I.",
        TITLE = "Defect detection in patterned wafers using anisotropic kernels",
        JOURNAL = MVA,
        VOLUME = "21",
        YEAR = "2010",
        NUMBER = "2",
        MONTH = "February",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185555"}

@article{bb190330,
        AUTHOR = "Sun, T.H. and Tseng, C.C. and Chen, M.S.",
        TITLE = "Electric contacts inspection using machine vision",
        JOURNAL = IVC,
        VOLUME = "28",
        YEAR = "2010",
        NUMBER = "6",
        MONTH = "June",
        PAGES = "890-901",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185556"}

@article{bb190331,
        AUTHOR = "Fan, S.K.S. and Chuang, Y.C.A.",
        TITLE = "Automatic detection of Mura defect in TFT-LCD based on regression
diagnostics",
        JOURNAL = PRL,
        VOLUME = "31",
        YEAR = "2010",
        NUMBER = "15",
        MONTH = "November",
        PAGES = "2397-2404",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185557"}

@article{bb190332,
        AUTHOR = "Zhang, J. and Kim, Y. and Yang, S.H. and Milster, T.D.",
        TITLE = "Illumination artifacts in hyper-NA vector imaging",
        JOURNAL = JOSA-A,
        VOLUME = "27",
        YEAR = "2010",
        NUMBER = "10",
        MONTH = "October",
        PAGES = "2272-2284",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185558"}

@article{bb190333,
        AUTHOR = "He, X.F. and Fang, F.",
        TITLE = "Flat-Panel Color Filter Inspection",
        JOURNAL = VisSys,
        VOLUME = "16",
        YEAR = "2011",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185559"}

@article{bb190334,
        AUTHOR = "Benedek, C.",
        TITLE = "Detection of soldering defects in Printed Circuit Boards with
Hierarchical Marked Point Processes",
        JOURNAL = PRL,
        VOLUME = "32",
        YEAR = "2011",
        NUMBER = "13",
        MONTH = "October",
        PAGES = "1535-1543",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185560"}

@article{bb190335,
        AUTHOR = "Peng, Y. and Zhang, J. and Wang, Y. and Yu, Z.P.",
        TITLE = "Gradient-Based Source and Mask Optimization in Optical Lithography",
        JOURNAL = IP,
        VOLUME = "20",
        YEAR = "2011",
        NUMBER = "10",
        MONTH = "October",
        PAGES = "2856-2864",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185561"}

@article{bb190336,
        AUTHOR = "Long, T. and Wang, H. and Long, B.",
        TITLE = "Test generation algorithm for analog systems based on support vector
machine",
        JOURNAL = SIViP,
        VOLUME = "5",
        YEAR = "2011",
        NUMBER = "4",
        MONTH = "November",
        PAGES = "527-533",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185562"}

@article{bb190337,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Invariant representation for spectral reflectance images and its
application",
        JOURNAL = JIVP,
        VOLUME = "2011",
        YEAR = "2011",
        NUMBER = "1 2011",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185563"}

@inproceedings{bb190338,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Spectral Invariant Representation for Spectral Reflectance Image",
        BOOKTITLE = ICPR10,
        YEAR = "2010",
        PAGES = "2776-2779",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185564"}

@inproceedings{bb190339,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Material Classification for Printed Circuit Boards by Spectral Imaging
System",
        BOOKTITLE = CCIW09,
        YEAR = "2009",
        PAGES = "216-225",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185565"}

@inproceedings{bb190340,
        AUTHOR = "Horiuchi, T. and Ibrahim, A. and Kadoi, H. and Tominaga, S.",
        TITLE = "An Effective Method for Illumination-Invariant Representation of Color
Images",
        BOOKTITLE = Color12,
        YEAR = "2012",
        PAGES = "II: 401-410",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185566"}

@inproceedings{bb190341,
        AUTHOR = "Ibrahim, A. and Horiuchi, T. and Tominaga, S.",
        TITLE = "Illumination-invariant representation for natural color images and its
application",
        BOOKTITLE = Southwest12,
        YEAR = "2012",
        PAGES = "157-160",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185567"}

@inproceedings{bb190342,
        AUTHOR = "Tominaga, S. and Okamoto, S.",
        TITLE = "Reflectance-based material classification for printed circuit boards",
        BOOKTITLE = CIAP03,
        YEAR = "2003",
        PAGES = "238-243",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185568"}

@inproceedings{bb190343,
        AUTHOR = "Horiuchi, T. and Suzuki, Y. and Tominaga, S.",
        TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher
Discriminant Analysis",
        BOOKTITLE = CCIW11,
        YEAR = "2011",
        PAGES = "152-164",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185569"}

@article{bb190344,
        AUTHOR = "Choy, S.K. and Jia, N.N. and Tong, C.S. and Tang, M.L. and Lam, E.Y.",
        TITLE = "A Robust Computational Algorithm for Inverse Photomask Synthesis in
Optical Projection Lithography",
        JOURNAL = SIIMS,
        VOLUME = "5",
        YEAR = "2012",
        NUMBER = "1 2012",
        PAGES = "625-651",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185570"}

@inproceedings{bb190345,
        AUTHOR = "Jia, N.N. and Lam, E.Y.",
        TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in
optical lithography",
        BOOKTITLE = ICIP10,
        YEAR = "2010",
        PAGES = "4173-4176",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185571"}

@article{bb190346,
        AUTHOR = "Yu, J.C. and Yu, P. and Chao, H.Y.",
        TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning",
        JOURNAL = IP,
        VOLUME = "22",
        YEAR = "2013",
        NUMBER = "7",
        PAGES = "2811-2821",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185572"}

@article{bb190347,
        AUTHOR = "Xu, S. and Cheng, Z. and Gao, Y. and Pan, Q.",
        TITLE = "Visual wafer dies counting using geometrical characteristics",
        JOURNAL = IET-IPR,
        VOLUME = "8",
        YEAR = "2014",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "280-288",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185573"}

@article{bb190348,
        AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.",
        TITLE = "Automatic optical phase identification of micro-drill bits based on
improved ASM and bag of shape segment in PCB production",
        JOURNAL = MVA,
        VOLUME = "25",
        YEAR = "2014",
        NUMBER = "6",
        PAGES = "1411-1422",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185574"}

@article{bb190349,
        AUTHOR = "Leibovici, M.C.R. and Gaylord, T.K.",
        TITLE = "Custom-modified three-dimensional periodic microstructures by
pattern-integrated interference lithography",
        JOURNAL = JOSA-A,
        VOLUME = "31",
        YEAR = "2014",
        NUMBER = "7",
        MONTH = "July",
        PAGES = "1515-1519",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185575"}

@article{bb190350,
        AUTHOR = "Estellers, V. and Thiran, J.P. and Gabrani, M.",
        TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography",
        JOURNAL = IP,
        VOLUME = "23",
        YEAR = "2014",
        NUMBER = "8",
        MONTH = "August",
        PAGES = "3560-3573",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185576"}

@article{bb190351,
        AUTHOR = "Bernal, F. and Acebron, J.A. and Anjam, I.",
        TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic
Capacitance Extraction in Non-Manhattan Geometries",
        JOURNAL = SIIMS,
        VOLUME = "7",
        YEAR = "2014",
        NUMBER = "4",
        PAGES = "2657-2674",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185577"}

@article{bb190352,
        AUTHOR = "Lakhssassi, A. and Palenychka, R. and Savaria, Y. and Sayde, M. and Zaremba, M.",
        TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the
Attentive Vision Method Using an Infrared Camera",
        JOURNAL = CirSysVideo,
        VOLUME = "26",
        YEAR = "2016",
        NUMBER = "2",
        MONTH = "February",
        PAGES = "412-424",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185578"}

@article{bb190353,
        AUTHOR = "Chebolu, A. and Nagahanumaiah",
        TITLE = "Contact angle measurement techniques on micro-patterned surfaces:
A comparative analysis",
        JOURNAL = IJCVR,
        VOLUME = "7",
        YEAR = "2017",
        NUMBER = "1/2",
        PAGES = "148-159",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185579"}

@article{bb190354,
        AUTHOR = "Sindagi, V.A. and Srivastava, S.",
        TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
        JOURNAL = IJCV,
        VOLUME = "122",
        YEAR = "2017",
        NUMBER = "2",
        MONTH = "April",
        PAGES = "193-211",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185580"}

@article{bb190355,
        AUTHOR = "Qiao, K. and Zeng, L. and Chen, J. and Hai, J. and Yan, B.",
        TITLE = "Wire segmentation for printed circuit board using deep convolutional
neural network and graph cut model",
        JOURNAL = IET-IPR,
        VOLUME = "12",
        YEAR = "2018",
        NUMBER = "5",
        MONTH = "May",
        PAGES = "793-800",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185581"}

@article{bb190356,
        AUTHOR = "Boscaro, A. and Jacquir, S. and Chef, S. and Sanchez, K. and Perdu, P. and Binczak, S.",
        TITLE = "Automatic localization of signal sources in photon emission images for
integrated circuit analysis",
        JOURNAL = SIViP,
        VOLUME = "12",
        YEAR = "2018",
        NUMBER = "4",
        MONTH = "May",
        PAGES = "775-782",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185582"}

@article{bb190357,
        AUTHOR = "Kaur, B. and Kaur, G. and Kaur, A.",
        TITLE = "Detection of defective printed circuit boards using image processing",
        JOURNAL = IJCVR,
        VOLUME = "8",
        YEAR = "2018",
        NUMBER = "4",
        PAGES = "418-434",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185583"}

@article{bb190358,
        AUTHOR = "Ashikin, F. and Hashizume, M. and Yotsuyanagi, H. and Lu, S.K. and Roth, Z.",
        TITLE = "A Design for Testability of Open Defects at Interconnects in 3D Stacked
ICs",
        JOURNAL = IEICE,
        VOLUME = "E101-D",
        YEAR = "2018",
        NUMBER = "8",
        MONTH = "August",
        PAGES = "2053-2063",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185584"}

@article{bb190359,
        AUTHOR = "Cheng, D. and Shi, Y.Q. and Gwee, B.H. and Toh, K.A. and Lin, T.",
        TITLE = "A Hierarchical Multiclassifier System for Automated Analysis of
Delayered IC Images",
        JOURNAL = IEEE_Int_Sys,
        VOLUME = "34",
        YEAR = "2019",
        NUMBER = "2",
        MONTH = "March",
        PAGES = "36-43",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185585"}

@article{bb190360,
        AUTHOR = "Han, H. and Gao, C.Q. and Zhao, Y. and Liao, S.S. and Tang, L. and Li, X.D.",
        TITLE = "Polycrystalline silicon wafer defect segmentation based on deep
convolutional neural networks",
        JOURNAL = PRL,
        VOLUME = "130",
        YEAR = "2020",
        PAGES = "234-241",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185586"}

@article{bb190361,
        AUTHOR = "Shen, J.Q. and Liu, N.Z. and Sun, H.",
        TITLE = "Defect detection of printed circuit board based on lightweight deep
convolution network",
        JOURNAL = IET-IPR,
        VOLUME = "14",
        YEAR = "2020",
        NUMBER = "15",
        MONTH = "December",
        PAGES = "3932-3940",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185587"}

@article{bb190362,
        AUTHOR = "Mitic, V. and Serpa, C. and Ilic, I. and Mohr, M. and Fecht, H.J.",
        TITLE = "Fractal Nature of Advanced Ni-Based Superalloys Solidified on Board
the International Space Station",
        JOURNAL = RS,
        VOLUME = "13",
        YEAR = "2021",
        NUMBER = "9",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185588"}

@inproceedings{bb190363,
        AUTHOR = "Li, F. and Hu, G. and Zhu, S.",
        TITLE = "Weakly-Supervised Defect Segmentation Within Visual Inspection Images
of Liquid Crystal Displays in Array Process",
        BOOKTITLE = ICIP20,
        YEAR = "2020",
        PAGES = "743-747",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185589"}

@inproceedings{bb190364,
        AUTHOR = "El Bakkali, M. and Elkhaldi, S. and Elftouh, H. and Touhami, N.A.",
        TITLE = "Small-Signal Modeling of GaAs: pHEMT Using Direct Extraction Method",
        BOOKTITLE = ISCV20,
        YEAR = "2020",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185590"}

@inproceedings{bb190365,
        AUTHOR = "Mahalingam, G. and Gay, K.M. and Ricanek, K.",
        TITLE = "PCB-METAL: A PCB Image Dataset for Advanced Computer Vision Machine
Learning Component Analysis",
        BOOKTITLE = MVA19,
        YEAR = "2019",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185591"}

@inproceedings{bb190366,
        AUTHOR = "di Bella, R. and Carrera, D. and Rossi, B. and Fragneto, P. and Boracchi, G.",
        TITLE = "Wafer Defect Map Classification Using Sparse Convolutional Networks",
        BOOKTITLE = CIAP19,
        YEAR = "2019",
        PAGES = "II:125-136",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185592"}

@inproceedings{bb190367,
        AUTHOR = "Kuo, C. and Ashmore, J. and Huggins, D. and Kira, Z.",
        TITLE = "Data-Efficient Graph Embedding Learning for PCB Component Detection",
        BOOKTITLE = WACV19,
        YEAR = "2019",
        PAGES = "551-560",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185593"}

@inproceedings{bb190368,
        AUTHOR = "Alagic, D. and Bluder, O. and Pilz, J.",
        TITLE = "Quantification and Prediction of Damage in SAM Images of Semiconductor
Devices",
        BOOKTITLE = ICIAR18,
        YEAR = "2018",
        PAGES = "490-496",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185594"}

@inproceedings{bb190369,
        AUTHOR = "Schrunner, S. and Bluder, O. and Zernig, A. and Kaestner, A. and Kern, R.",
        TITLE = "Markov random fields for pattern extraction in analog wafer test data",
        BOOKTITLE = IPTA17,
        YEAR = "2017",
        PAGES = "1-6",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185595"}

@inproceedings{bb190370,
        AUTHOR = "Park, Y. and Kang, K. and Kim, S.",
        TITLE = "A Visual Inspection Method Based on Periodic Feature for Wheel Mark
Defect on Wafer Backside",
        BOOKTITLE = CAIP17,
        YEAR = "2017",
        PAGES = "I: 219-227",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185596"}

@inproceedings{bb190371,
        AUTHOR = "Wang, W. and Lei, X. and Ding, S.T. and He, X.F. and Li, H.R.",
        TITLE = "Optimal layout algorithm for reusing solar cell fragments",
        BOOKTITLE = ICIVC17,
        YEAR = "2017",
        PAGES = "277-280",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185597"}

@inproceedings{bb190372,
        AUTHOR = "Pramerdorfer, C. and Kampel, M.",
        TITLE = "A dataset for computer-vision-based PCB analysis",
        BOOKTITLE = MVA15,
        YEAR = "2015",
        PAGES = "378-381",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185598"}

@inproceedings{bb190373,
        AUTHOR = "Sindagi, V.A. and Srivastava, S.",
        TITLE = "OLED panel defect detection using local inlier-outlier ratios and
modified LBP",
        BOOKTITLE = MVA15,
        YEAR = "2015",
        PAGES = "214-217",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185599"}

@inproceedings{bb190374,
        AUTHOR = "Fuksis, R. and Pudzs, M. and Kravtsov, A. and Kravtsov, A.",
        TITLE = "Measuring the Radius of Meniscus Ring During the Growth of Silicon Rods",
        BOOKTITLE = SCIA15,
        YEAR = "2015",
        PAGES = "462-471",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185600"}

@inproceedings{bb190375,
        AUTHOR = "Matlin, E. and Troy, N. and Stoker, D.",
        TITLE = "Imaging activity in integrated circuits",
        BOOKTITLE = ICIP14,
        YEAR = "2014",
        PAGES = "5821-5825",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185601"}

@inproceedings{bb190376,
        AUTHOR = "Xie, F. and Dau, A.H. and Uitdenbogerd, A.L. and Song, A.",
        TITLE = "Evolving PCB visual inspection programs using genetic programming",
        BOOKTITLE = IVCNZ13,
        YEAR = "2013",
        PAGES = "406-411",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185602"}

@inproceedings{bb190377,
        AUTHOR = "Schwarzbauer, T. and Welk, M. and Mayrhofer, C. and Schubert, R.",
        TITLE = "Automated Quality Inspection of Microfluidic Chips Using Morphologic
Techniques",
        BOOKTITLE = ISMM13,
        YEAR = "2013",
        PAGES = "508-519",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185603"}

@inproceedings{bb190378,
        AUTHOR = "Kimura, Y. and Takauji, H. and Kaneko, S. and Domae, Y. and Okuda, H.",
        TITLE = "Shape recognition of flexible cables by Outer Edge FCM clustering",
        BOOKTITLE = FCV11,
        YEAR = "2011",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185604"}

@inproceedings{bb190379,
        AUTHOR = "Takagi, Y. and Asano, T. and Liu, W. and Yao, J.",
        TITLE = "Color uniformity evaluation of electronic displays based on visual
sensitivity",
        BOOKTITLE = FCV11,
        YEAR = "2011",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185605"}

@inproceedings{bb190380,
        AUTHOR = "Buddhachan, V. and KaewTrakulPong, P.",
        TITLE = "Machine Vision for Excess Gluing Inspection in Spindle Motor Assembly",
        BOOKTITLE = MVA09,
        YEAR = "2009",
        PAGES = "304-",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185606"}

@inproceedings{bb190381,
        AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
        TITLE = "Unsupervised Material Classification of Printed Circuit Boards Using
Dimension-Reduced Spectral Information",
        BOOKTITLE = MVA09,
        YEAR = "2009",
        PAGES = "435-",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185607"}

@inproceedings{bb190382,
        AUTHOR = "Kryszczuk, K. and Hurley, P. and Sayah, R.",
        TITLE = "Direct Printability Prediction in VLSI Using Features from Orthogonal
Transforms",
        BOOKTITLE = ICPR10,
        YEAR = "2010",
        PAGES = "2764-2767",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185608"}

@inproceedings{bb190383,
        AUTHOR = "Lichtenauer, M.S. and Avelar, S. and Toporek, G.",
        TITLE = "Segmentation of Images of Lead Free Solder",
        BOOKTITLE = ICISP10,
        YEAR = "2010",
        PAGES = "165-172",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185609"}

@inproceedings{bb190384,
        AUTHOR = "Duan, G.F. and Chen, Y.W.",
        TITLE = "Improved Active Shape Model for automatic optical phase identification
of microdrill bits in Printed Circuit Board production",
        BOOKTITLE = ICIP09,
        YEAR = "2009",
        PAGES = "425-428",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185610"}

@inproceedings{bb190385,
        AUTHOR = "Li, T.Z. and Wen, F. and Lu, H.W. and Ma, L.X.",
        TITLE = "Study on the Treatment Technology and Application of Charge Coupled
Device",
        BOOKTITLE = CISP09,
        YEAR = "2009",
        PAGES = "1-5",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185611"}

@inproceedings{bb190386,
        AUTHOR = "Pieters, R. and Jonker, P.P. and Nijmeijer, H.",
        TITLE = "Real-Time Center Detection of an OLED Structure",
        BOOKTITLE = ACIVS09,
        YEAR = "2009",
        PAGES = "400-409",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185612"}

@inproceedings{bb190387,
        AUTHOR = "Liu, X. and Yang, L.X.",
        TITLE = "Study on virtual simulation of chip during manufacturing",
        BOOKTITLE = IASP09,
        YEAR = "2009",
        PAGES = "346-350",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185613"}

@inproceedings{bb190388,
        AUTHOR = "Nedzved, A. and Ablameyko, S. and Belotserkovsky, A. and Maziewski, A. and Dobrogowski, W.",
        TITLE = "The structure analysis of ultra thin magnetic film images",
        BOOKTITLE = ICPR08,
        YEAR = "2008",
        PAGES = "1-4",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185614"}

@inproceedings{bb190389,
        AUTHOR = "Huttunen, H. and Ruusuvuori, P. and Manninen, T. and Rutanen, K. and Ronkka, R. and Visa, A.",
        TITLE = "Object detection for dynamic adaptation of interconnections in inkjet
printed electronics",
        BOOKTITLE = ICIP08,
        YEAR = "2008",
        PAGES = "2364-2367",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185615"}

@inproceedings{bb190390,
        AUTHOR = "Leta, F.R. and Feliciano, F.F.",
        TITLE = "Computational system to detect defects in mounted and bare PCB Based on
connectivity and image correlation",
        BOOKTITLE = WSSIP08,
        YEAR = "2008",
        PAGES = "331-334",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185616"}

@inproceedings{bb190391,
        AUTHOR = "Shortis, M.R. and Johnston, G.H.G. and Pottler, K. and Lupfert, E.",
        TITLE = "Photogrammetric Analysis of Solar Collectors",
        BOOKTITLE = ISPRS08,
        YEAR = "2008",
        PAGES = "B5: 81 ff",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185617"}

@inproceedings{bb190392,
        AUTHOR = "Wang, D.Z. and Wu, C.H. and Ip, A. and Chan, C.Y. and Wang, D.W.",
        TITLE = "Fast Multi-template Matching Using a Particle Swarm Optimization
Algorithm for PCB Inspection",
        BOOKTITLE = EvoIASP08,
        YEAR = "2008",
        PAGES = "xx-yy",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185618"}

@inproceedings{bb190393,
        AUTHOR = "Lin, H.D. and Chiu, S.W.",
        TITLE = "Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid
Crystal Displays",
        BOOKTITLE = PSIVT06,
        YEAR = "2006",
        PAGES = "442-452",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185619"}

@inproceedings{bb190394,
        AUTHOR = "Oda, M. and Nishio, Y. and Ushida, A.",
        TITLE = "Spatial-temporal Analysis Method of Plane Circuits Based on Two-Layer
Cellular Neural Networks",
        BOOKTITLE = IWICPAS06,
        YEAR = "2006",
        PAGES = "195-204",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185620"}

@inproceedings{bb190395,
        AUTHOR = "Bourgeat, P. and Meriaudeau, F.",
        TITLE = "Classifier Vote and Gabor Filter Banks for Wafer Segmentation",
        BOOKTITLE = ICIP05,
        YEAR = "2005",
        PAGES = "I: 369-372",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185621"}

@inproceedings{bb190396,
        AUTHOR = "Ho, W.K. and Tay, A. and Zhou, Y. and Yang, K. and Hu, N.",
        TITLE = "Detection of wafer warpages during thermal processing in
microlithography",
        BOOKTITLE = ICARCV04,
        YEAR = "2004",
        PAGES = "I: 485-490",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185622"}

@inproceedings{bb190397,
        AUTHOR = "El Doker, T.A. and King, J. and Scott, D.R.",
        TITLE = "Initial results on the development of a new wafer inspection paradigm",
        BOOKTITLE = Southwest04,
        YEAR = "2004",
        PAGES = "124-127",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185623"}

@inproceedings{bb190398,
        AUTHOR = "Choi, K.S. and Pyun, J.Y. and Kim, N.H. and Choi, B.D. and Ko, S.J.",
        TITLE = "Real-Time Inspection System for Printed Circuit Boards",
        BOOKTITLE = DAGM03,
        YEAR = "2003",
        PAGES = "458-465",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185624"}

@inproceedings{bb190399,
        AUTHOR = "Hiroi, T. and Shishido, C. and Watanabe, M.",
        TITLE = "Pattern alignment method based on consistency among local registration
candidates for LSI wafer pattern inspection",
        BOOKTITLE = WACV02,
        YEAR = "2002",
        PAGES = "257-263",
        BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT185625"}

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