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@inproceedings{bb154203,
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optical lithography",
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@article{bb154204,
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        TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning",
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@article{bb154205,
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@article{bb154206,
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        TITLE = "Automatic optical phase identification of micro-drill bits based on
improved ASM and bag of shape segment in PCB production",
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        YEAR = "2014",
        NUMBER = "6",
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@article{bb154207,
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        TITLE = "Custom-modified three-dimensional periodic microstructures by
pattern-integrated interference lithography",
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@article{bb154208,
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        TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography",
        JOURNAL = IP,
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@article{bb154209,
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        TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic
Capacitance Extraction in Non-Manhattan Geometries",
        JOURNAL = SIIMS,
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        NUMBER = "4",
        PAGES = "2657-2674",
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@article{bb154210,
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        TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the
Attentive Vision Method Using an Infrared Camera",
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        NUMBER = "2",
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@article{bb154211,
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A comparative analysis",
        JOURNAL = IJCVR,
        VOLUME = "7",
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@article{bb154212,
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        TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
        JOURNAL = IJCV,
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@article{bb154215,
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@article{bb154216,
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@inproceedings{bb154217,
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@inproceedings{bb154219,
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@inproceedings{bb154220,
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@inproceedings{bb154222,
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@inproceedings{bb154226,
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@inproceedings{bb154227,
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@inproceedings{bb154228,
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@inproceedings{bb154229,
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@inproceedings{bb154230,
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@inproceedings{bb154231,
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@inproceedings{bb154232,
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@inproceedings{bb154233,
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