@inproceedings{bb154200,
AUTHOR = "Tominaga, S. and Okamoto, S.",
TITLE = "Reflectance-based material classification for printed circuit boards",
BOOKTITLE = CIAP03,
YEAR = "2003",
PAGES = "238-243",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149776"}
@inproceedings{bb154201,
AUTHOR = "Horiuchi, T. and Suzuki, Y. and Tominaga, S.",
TITLE = "Material Classification for Printed Circuit Boards by Kernel Fisher
Discriminant Analysis",
BOOKTITLE = CCIW11,
YEAR = "2011",
PAGES = "152-164",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149777"}
@article{bb154202,
AUTHOR = "Choy, S.K. and Jia, N.N. and Tong, C.S. and Tang, M.L. and Lam, E.Y.",
TITLE = "A Robust Computational Algorithm for Inverse Photomask Synthesis in
Optical Projection Lithography",
JOURNAL = SIIMS,
VOLUME = "5",
YEAR = "2012",
NUMBER = "1 2012",
PAGES = "625-651",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149778"}
@inproceedings{bb154203,
AUTHOR = "Jia, N.N. and Lam, E.Y.",
TITLE = "Stochastic gradient descent for robust inverse photomask synthesis in
optical lithography",
BOOKTITLE = ICIP10,
YEAR = "2010",
PAGES = "4173-4176",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149779"}
@article{bb154204,
AUTHOR = "Yu, J.C. and Yu, P. and Chao, H.Y.",
TITLE = "Library-Based Illumination Synthesis for Critical CMOS Patterning",
JOURNAL = IP,
VOLUME = "22",
YEAR = "2013",
NUMBER = "7",
PAGES = "2811-2821",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149780"}
@article{bb154205,
AUTHOR = "Xu, S. and Cheng, Z. and Gao, Y. and Pan, Q.",
TITLE = "Visual wafer dies counting using geometrical characteristics",
JOURNAL = IET-IPR,
VOLUME = "8",
YEAR = "2014",
NUMBER = "5",
MONTH = "May",
PAGES = "280-288",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149781"}
@article{bb154206,
AUTHOR = "Duan, G.F. and Wang, H.C. and Liu, Z.Y. and Tan, J.R. and Chen, Y.W.",
TITLE = "Automatic optical phase identification of micro-drill bits based on
improved ASM and bag of shape segment in PCB production",
JOURNAL = MVA,
VOLUME = "25",
YEAR = "2014",
NUMBER = "6",
PAGES = "1411-1422",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149782"}
@article{bb154207,
AUTHOR = "Leibovici, M.C.R. and Gaylord, T.K.",
TITLE = "Custom-modified three-dimensional periodic microstructures by
pattern-integrated interference lithography",
JOURNAL = JOSA-A,
VOLUME = "31",
YEAR = "2014",
NUMBER = "7",
MONTH = "July",
PAGES = "1515-1519",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149783"}
@article{bb154208,
AUTHOR = "Estellers, V. and Thiran, J.P. and Gabrani, M.",
TITLE = "Surface Reconstruction From Microscopic Images in Optical Lithography",
JOURNAL = IP,
VOLUME = "23",
YEAR = "2014",
NUMBER = "8",
MONTH = "August",
PAGES = "3560-3573",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149784"}
@article{bb154209,
AUTHOR = "Bernal, F. and Acebron, J.A. and Anjam, I.",
TITLE = "A Stochastic Algorithm Based on Fast Marching for Automatic
Capacitance Extraction in Non-Manhattan Geometries",
JOURNAL = SIIMS,
VOLUME = "7",
YEAR = "2014",
NUMBER = "4",
PAGES = "2657-2674",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149785"}
@article{bb154210,
AUTHOR = "Lakhssassi, A. and Palenychka, R. and Savaria, Y. and Sayde, M. and Zaremba, M.",
TITLE = "Monitoring Thermal Stress in Wafer-Scale Integrated Circuits by the
Attentive Vision Method Using an Infrared Camera",
JOURNAL = CirSysVideo,
VOLUME = "26",
YEAR = "2016",
NUMBER = "2",
MONTH = "February",
PAGES = "412-424",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149786"}
@article{bb154211,
AUTHOR = "Chebolu, A. and Nagahanumaiah",
TITLE = "Contact angle measurement techniques on micro-patterned surfaces:
A comparative analysis",
JOURNAL = IJCVR,
VOLUME = "7",
YEAR = "2017",
NUMBER = "1/2",
PAGES = "148-159",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149787"}
@article{bb154212,
AUTHOR = "Sindagi, V.A. and Srivastava, S.",
TITLE = "Domain Adaptation for Automatic OLED Panel Defect Detection Using
Adaptive Support Vector Data Description",
JOURNAL = IJCV,
VOLUME = "122",
YEAR = "2017",
NUMBER = "2",
MONTH = "April",
PAGES = "193-211",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149788"}
@article{bb154213,
AUTHOR = "Qiao, K. and Zeng, L. and Chen, J. and Hai, J. and Yan, B.",
TITLE = "Wire segmentation for printed circuit board using deep convolutional
neural network and graph cut model",
JOURNAL = IET-IPR,
VOLUME = "12",
YEAR = "2018",
NUMBER = "5",
MONTH = "May",
PAGES = "793-800",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149789"}
@article{bb154214,
AUTHOR = "Boscaro, A. and Jacquir, S. and Chef, S. and Sanchez, K. and Perdu, P. and Binczak, S.",
TITLE = "Automatic localization of signal sources in photon emission images for
integrated circuit analysis",
JOURNAL = SIViP,
VOLUME = "12",
YEAR = "2018",
NUMBER = "4",
MONTH = "May",
PAGES = "775-782",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149790"}
@article{bb154215,
AUTHOR = "Kaur, B. and Kaur, G. and Kaur, A.",
TITLE = "Detection of defective printed circuit boards using image processing",
JOURNAL = IJCVR,
VOLUME = "8",
YEAR = "2018",
NUMBER = "4",
PAGES = "418-434",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149791"}
@article{bb154216,
AUTHOR = "Ashikin, F. and Hashizume, M. and Yotsuyanagi, H. and Lu, S.K. and Roth, Z.",
TITLE = "A Design for Testability of Open Defects at Interconnects in 3D Stacked
ICs",
JOURNAL = IEICE,
VOLUME = "E101-D",
YEAR = "2018",
NUMBER = "8",
MONTH = "August",
PAGES = "2053-2063",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149792"}
@inproceedings{bb154217,
AUTHOR = "Alagic, D. and Bluder, O. and Pilz, J.",
TITLE = "Quantification and Prediction of Damage in SAM Images of Semiconductor
Devices",
BOOKTITLE = ICIAR18,
YEAR = "2018",
PAGES = "490-496",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149793"}
@inproceedings{bb154218,
AUTHOR = "Schrunner, S. and Bluder, O. and Zernig, A. and Kaestner, A. and Kern, R.",
TITLE = "Markov random fields for pattern extraction in analog wafer test data",
BOOKTITLE = IPTA17,
YEAR = "2017",
PAGES = "1-6",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149794"}
@inproceedings{bb154219,
AUTHOR = "Park, Y. and Kang, K. and Kim, S.",
TITLE = "A Visual Inspection Method Based on Periodic Feature for Wheel Mark
Defect on Wafer Backside",
BOOKTITLE = CAIP17,
YEAR = "2017",
PAGES = "I: 219-227",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149795"}
@inproceedings{bb154220,
AUTHOR = "Wang, W. and Lei, X. and Ding, S.T. and He, X.F. and Li, H.R.",
TITLE = "Optimal layout algorithm for reusing solar cell fragments",
BOOKTITLE = ICIVC17,
YEAR = "2017",
PAGES = "277-280",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149796"}
@inproceedings{bb154221,
AUTHOR = "Pramerdorfer, C. and Kampel, M.",
TITLE = "A dataset for computer-vision-based PCB analysis",
BOOKTITLE = MVA15,
YEAR = "2015",
PAGES = "378-381",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149797"}
@inproceedings{bb154222,
AUTHOR = "Sindagi, V.A. and Srivastava, S.",
TITLE = "OLED panel defect detection using local inlier-outlier ratios and
modified LBP",
BOOKTITLE = MVA15,
YEAR = "2015",
PAGES = "214-217",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149798"}
@inproceedings{bb154223,
AUTHOR = "Fuksis, R. and Pudzs, M. and Kravtsov, A. and Kravtsov, A.",
TITLE = "Measuring the Radius of Meniscus Ring During the Growth of Silicon Rods",
BOOKTITLE = SCIA15,
YEAR = "2015",
PAGES = "462-471",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149799"}
@inproceedings{bb154224,
AUTHOR = "Matlin, E. and Troy, N. and Stoker, D.",
TITLE = "Imaging activity in integrated circuits",
BOOKTITLE = ICIP14,
YEAR = "2014",
PAGES = "5821-5825",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149800"}
@inproceedings{bb154225,
AUTHOR = "Xie, F. and Dau, A.H. and Uitdenbogerd, A.L. and Song, A.",
TITLE = "Evolving PCB visual inspection programs using genetic programming",
BOOKTITLE = IVCNZ13,
YEAR = "2013",
PAGES = "406-411",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149801"}
@inproceedings{bb154226,
AUTHOR = "Schwarzbauer, T. and Welk, M. and Mayrhofer, C. and Schubert, R.",
TITLE = "Automated Quality Inspection of Microfluidic Chips Using Morphologic
Techniques",
BOOKTITLE = ISMM13,
YEAR = "2013",
PAGES = "508-519",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149802"}
@inproceedings{bb154227,
AUTHOR = "Kimura, Y. and Takauji, H. and Kaneko, S. and Domae, Y. and Okuda, H.",
TITLE = "Shape recognition of flexible cables by Outer Edge FCM clustering",
BOOKTITLE = FCV11,
YEAR = "2011",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149803"}
@inproceedings{bb154228,
AUTHOR = "Takagi, Y. and Asano, T. and Liu, W. and Yao, J.",
TITLE = "Color uniformity evaluation of electronic displays based on visual
sensitivity",
BOOKTITLE = FCV11,
YEAR = "2011",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149804"}
@inproceedings{bb154229,
AUTHOR = "Buddhachan, V. and KaewTrakulPong, P.",
TITLE = "Machine Vision for Excess Gluing Inspection in Spindle Motor Assembly",
BOOKTITLE = MVA09,
YEAR = "2009",
PAGES = "304-",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149805"}
@inproceedings{bb154230,
AUTHOR = "Ibrahim, A. and Tominaga, S. and Horiuchi, T.",
TITLE = "Unsupervised Material Classification of Printed Circuit Boards Using
Dimension-Reduced Spectral Information",
BOOKTITLE = MVA09,
YEAR = "2009",
PAGES = "435-",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149806"}
@inproceedings{bb154231,
AUTHOR = "Kryszczuk, K. and Hurley, P. and Sayah, R.",
TITLE = "Direct Printability Prediction in VLSI Using Features from Orthogonal
Transforms",
BOOKTITLE = ICPR10,
YEAR = "2010",
PAGES = "2764-2767",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149807"}
@inproceedings{bb154232,
AUTHOR = "Lichtenauer, M.S. and Avelar, S. and Toporek, G.",
TITLE = "Segmentation of Images of Lead Free Solder",
BOOKTITLE = ICISP10,
YEAR = "2010",
PAGES = "165-172",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149808"}
@inproceedings{bb154233,
AUTHOR = "Duan, G.F. and Chen, Y.W.",
TITLE = "Improved Active Shape Model for automatic optical phase identification
of microdrill bits in Printed Circuit Board production",
BOOKTITLE = ICIP09,
YEAR = "2009",
PAGES = "425-428",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149809"}
@inproceedings{bb154234,
AUTHOR = "Li, T.Z. and Wen, F. and Lu, H.W. and Ma, L.X.",
TITLE = "Study on the Treatment Technology and Application of Charge Coupled
Device",
BOOKTITLE = CISP09,
YEAR = "2009",
PAGES = "1-5",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149810"}
@inproceedings{bb154235,
AUTHOR = "Pieters, R. and Jonker, P.P. and Nijmeijer, H.",
TITLE = "Real-Time Center Detection of an OLED Structure",
BOOKTITLE = ACIVS09,
YEAR = "2009",
PAGES = "400-409",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149811"}
@inproceedings{bb154236,
AUTHOR = "Liu, X. and Yang, L.X.",
TITLE = "Study on virtual simulation of chip during manufacturing",
BOOKTITLE = IASP09,
YEAR = "2009",
PAGES = "346-350",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149812"}
@inproceedings{bb154237,
AUTHOR = "Nedzved, A. and Ablameyko, S. and Belotserkovsky, A. and Maziewski, A. and Dobrogowski, W.",
TITLE = "The structure analysis of ultra thin magnetic film images",
BOOKTITLE = ICPR08,
YEAR = "2008",
PAGES = "1-4",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149813"}
@inproceedings{bb154238,
AUTHOR = "Huttunen, H. and Ruusuvuori, P. and Manninen, T. and Rutanen, K. and Ronkka, R. and Visa, A.",
TITLE = "Object detection for dynamic adaptation of interconnections in inkjet
printed electronics",
BOOKTITLE = ICIP08,
YEAR = "2008",
PAGES = "2364-2367",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149814"}
@inproceedings{bb154239,
AUTHOR = "Leta, F.R. and Feliciano, F.F.",
TITLE = "Computational system to detect defects in mounted and bare PCB Based on
connectivity and image correlation",
BOOKTITLE = WSSIP08,
YEAR = "2008",
PAGES = "331-334",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149815"}
@inproceedings{bb154240,
AUTHOR = "Shortis, M.R. and Johnston, G.H.G. and Pottler, K. and Lupfert, E.",
TITLE = "Photogrammetric Analysis of Solar Collectors",
BOOKTITLE = ISPRS08,
YEAR = "2008",
PAGES = "B5: 81 ff",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149816"}
@inproceedings{bb154241,
AUTHOR = "Wang, D.Z. and Wu, C.H. and Ip, A. and Chan, C.Y. and Wang, D.W.",
TITLE = "Fast Multi-template Matching Using a Particle Swarm Optimization
Algorithm for PCB Inspection",
BOOKTITLE = EvoIASP08,
YEAR = "2008",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149817"}
@inproceedings{bb154242,
AUTHOR = "Lin, H.D. and Chiu, S.W.",
TITLE = "Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid
Crystal Displays",
BOOKTITLE = PSIVT06,
YEAR = "2006",
PAGES = "442-452",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149818"}
@inproceedings{bb154243,
AUTHOR = "Oda, M. and Nishio, Y. and Ushida, A.",
TITLE = "Spatial-temporal Analysis Method of Plane Circuits Based on Two-Layer
Cellular Neural Networks",
BOOKTITLE = IWICPAS06,
YEAR = "2006",
PAGES = "195-204",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149819"}
@inproceedings{bb154244,
AUTHOR = "Bourgeat, P. and Meriaudeau, F.",
TITLE = "Classifier Vote and Gabor Filter Banks for Wafer Segmentation",
BOOKTITLE = ICIP05,
YEAR = "2005",
PAGES = "I: 369-372",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149820"}
@inproceedings{bb154245,
AUTHOR = "Ho, W.K. and Tay, A. and Zhou, Y. and Yang, K. and Hu, N.",
TITLE = "Detection of wafer warpages during thermal processing in
microlithography",
BOOKTITLE = ICARCV04,
YEAR = "2004",
PAGES = "I: 485-490",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149821"}
@inproceedings{bb154246,
AUTHOR = "El Doker, T.A. and King, J. and Scott, D.R.",
TITLE = "Initial results on the development of a new wafer inspection paradigm",
BOOKTITLE = Southwest04,
YEAR = "2004",
PAGES = "124-127",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149822"}
@inproceedings{bb154247,
AUTHOR = "Choi, K.S. and Pyun, J.Y. and Kim, N.H. and Choi, B.D. and Ko, S.J.",
TITLE = "Real-Time Inspection System for Printed Circuit Boards",
BOOKTITLE = DAGM03,
YEAR = "2003",
PAGES = "458-465",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149823"}
@inproceedings{bb154248,
AUTHOR = "Hiroi, T. and Shishido, C. and Watanabe, M.",
TITLE = "Pattern alignment method based on consistency among local registration
candidates for LSI wafer pattern inspection",
BOOKTITLE = WACV02,
YEAR = "2002",
PAGES = "257-263",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149824"}
@inproceedings{bb154249,
AUTHOR = "Shimoda, A. and Iwata, H. and Shibata, Y. and Ikeda, H.",
TITLE = "Thin Film Magnetic Head Wafer Inspection Technique Using
Geometrical Feature Based Image Comparison",
BOOKTITLE = MVA98,
YEAR = "1998",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149825"}
@inproceedings{bb154250,
AUTHOR = "Chang, M.C. and Chen, H.Y. and Fuh, C.S.",
TITLE = "Fast Search Algorithms for IC Printed Mark Quality Inspection",
BOOKTITLE = MVA98,
YEAR = "1998",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149826"}
@inproceedings{bb154251,
AUTHOR = "Marino, P. and Dominguez, M.A.",
TITLE = "Feature Extraction for Electronic Equipment Manufacturing",
BOOKTITLE = MVA98,
YEAR = "1998",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149827"}
@inproceedings{bb154252,
AUTHOR = "Gleason, S.S. and Tobin, K.W.",
TITLE = "Directional dilation for the connection of piece-wise objects:
A semiconductor manufacturing case study",
BOOKTITLE = ICIP96,
YEAR = "1996",
PAGES = "III: 9-12",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149828"}
@inproceedings{bb154253,
AUTHOR = "Lu, Y. and Tisler, A.",
TITLE = "Machine Vision Inspection of VF Display Boards",
BOOKTITLE = ICPR96,
YEAR = "1996",
PAGES = "III: 839-843",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149829"}
@inproceedings{bb154254,
AUTHOR = "Doi, H. and Suzuki, Y. and Hara, Y. and Iida, T. and Fujishita, Y. and Karasaki, K.",
TITLE = "Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns",
BOOKTITLE = ICCV95,
YEAR = "1995",
PAGES = "575-582",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149830"}
@inproceedings{bb154255,
AUTHOR = "Duin, R.P.W. and Hoek, E.T.G.",
TITLE = "SMD position measurement by a Kohonen network compared with image
processing",
BOOKTITLE = CAIP95,
YEAR = "1995",
PAGES = "606-611",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149831"}
@inproceedings{bb154256,
AUTHOR = "Darboux, M. and Dinten, J.M.",
TITLE = "Development of an automated bond verification system for advanced
electronic packages",
BOOKTITLE = CIAP95,
YEAR = "1995",
PAGES = "737-742",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149832"}
@inproceedings{bb154257,
AUTHOR = "Cook, B.D. and Lee, S.Y.",
TITLE = "Fast exposure simulation for large circuit patterns in electron beam
lithography",
BOOKTITLE = ICIP95,
YEAR = "1995",
PAGES = "I: 442-445",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149833"}
@inproceedings{bb154258,
AUTHOR = "Hiroi, T. and Maeda, S. and Kubota, H. and Watanabe, K. and Nakagawa, Y.",
TITLE = "Precise visual inspection for LSI wafer patterns using subpixel image
alignment",
BOOKTITLE = WACV94,
YEAR = "1994",
PAGES = "26-34",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149834"}
@inproceedings{bb154259,
AUTHOR = "Thibadeau, R.H.",
TITLE = "Printed Circuit Board inspection",
BOOKTITLE = CMU-RI-TR,
YEAR = "1981",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149835"}
@inproceedings{bb154260,
AUTHOR = "Thibadeau, R.H. and Friedman, M. and Seto, J.",
TITLE = "Automatic Inspection for Printed Wiring",
BOOKTITLE = CMU-RI-TR,
YEAR = "1982",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149836"}
@inproceedings{bb154261,
AUTHOR = "Ninomiya, T. and Yoshimura, K. and Nomoto, M. and Nakagawa, Y.",
TITLE = "Automatic Printed Circuit Pattern Inspection Using Connectivity
Preserving Image Reduction and Connectivity Comparison",
BOOKTITLE = ICPR92,
YEAR = "1992",
PAGES = "I:53-56",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149837"}
@inproceedings{bb154262,
AUTHOR = "Chehdi, K. and Corazza, M.",
TITLE = "Automatic System of Quality Control of Hybrid Circuits by
Image Analysis",
BOOKTITLE = ICPR92,
YEAR = "1992",
PAGES = "I:433-436",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149838"}
@inproceedings{bb154263,
AUTHOR = "Khotanzad, A. and Banerjee, H. and Srinath, M.",
TITLE = "A vision system for inspection of ball bonds in integrated circuits",
BOOKTITLE = WACV92,
YEAR = "1992",
PAGES = "290-297",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149839"}
@inproceedings{bb154264,
AUTHOR = "Khalaj, B.H. and Aghajan, H.K. and Kailath, T.",
TITLE = "Automated direct patterned wafer inspection",
BOOKTITLE = WACV92,
YEAR = "1992",
PAGES = "266-273",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149840"}
@inproceedings{bb154265,
AUTHOR = "Dainis, G.A. and Ward, M.O.",
TITLE = "Rule-Based Inspection of Leadframes",
BOOKTITLE = CVPR88,
YEAR = "1988",
PAGES = "580-585",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat837.html#TT149841"}
@article{bb154266,
AUTHOR = "Clocksin, W.F. and Bromley, J.S.E. and Davey, P.G. and Vidler, A.R. and Morgan, C.G.",
TITLE = "An Implementation of Model-Based Visual Feedback for
Robot Arc Welding of Thin Sheet Steel",
JOURNAL = IJRR,
VOLUME = "4",
YEAR = "1985",
NUMBER = "1",
PAGES = "13-26",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149842"}
@article{bb154267,
AUTHOR = "Bartlett, S.L. and Besl, P.J. and Cole, C.L. and Jain, R.C. and Mukherjee, D. and Skifstad, K.D.",
TITLE = "Automatic Solder Joint Inspection",
JOURNAL = PAMI,
VOLUME = "10",
YEAR = "1988",
NUMBER = "1",
MONTH = "January",
PAGES = "31-43",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149843"}
@inproceedings{bb154268,
AUTHOR = "Besl, P.J. and Delp, E.J. and Jain, R.C.",
TITLE = "Automatic Visual Solder Joint Inspection",
BOOKTITLE = RA,
VOLUME = "1",
YEAR = "1985",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149844"}
@article{bb154269,
AUTHOR = "Agapakis, J.E. and Katz, J.M. and Friedman, J.M. and Epstein, G.N.",
TITLE = "Vision-Aided Robotic Welding: An Approach and a Flexible Implementation",
JOURNAL = IJRR,
VOLUME = "9",
YEAR = "1990",
NUMBER = "5",
PAGES = "17-34",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149845"}
@article{bb154270,
AUTHOR = "Kim, J.H. and Cho, H.S.",
TITLE = "Neural-Network-Based Inspection of Solder Joints Using a
Circular Illumination",
JOURNAL = IVC,
VOLUME = "13",
YEAR = "1995",
NUMBER = "6",
MONTH = "August",
PAGES = "479-490",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149846"}
@article{bb154271,
AUTHOR = "Ruiz del Solar, J. and Koppen, M.",
TITLE = "Sewage Pipe Image Segmentation Using a Neural-Based Architecture",
JOURNAL = PRL,
VOLUME = "17",
YEAR = "1996",
NUMBER = "4",
MONTH = "April",
PAGES = "363-368",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149847"}
@article{bb154272,
AUTHOR = "Presern, S. and Gyergyek, L.",
TITLE = "An Intelligent Tactile Sensor:
An On-Line Hierarchical Object and Seam Analyzer",
JOURNAL = PAMI,
VOLUME = "5",
YEAR = "1983",
NUMBER = "2",
MONTH = "March",
PAGES = "217-220",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149848"}
@article{bb154273,
AUTHOR = "Ryu, Y.K. and Cho, H.S.",
TITLE = "New Optical Measuring System for Solder Joint Inspection",
JOURNAL = OptLas,
VOLUME = "26",
YEAR = "1997",
NUMBER = "6",
PAGES = "487-514",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149849"}
@article{bb154274,
AUTHOR = "Kim, J.H. and Cho, H.S. and Kim, S.",
TITLE = "Pattern-Classification of Solder Joint Images Using a
Correlation Neural-Network",
JOURNAL = EngAAI,
VOLUME = "9",
YEAR = "1996",
NUMBER = "6",
MONTH = "December",
PAGES = "655-669",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149850"}
@article{bb154275,
AUTHOR = "Tarng, Y.S. and Yeh, S.S. and Juang, S.C.",
TITLE = "Fuzzy Pattern-Recognition of Tungsten Inert-Gas Weld Quality",
JOURNAL = IJAMT,
VOLUME = "13",
YEAR = "1997",
NUMBER = "6",
PAGES = "387-392",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149851"}
@article{bb154276,
AUTHOR = "Yu, J.Y. and Na, S.J.",
TITLE = "A Study on Vision Sensors for Seam Tracking of Height-Varying Weldment:
Part 1: Mathematical-Model",
JOURNAL = "Mechatronics",
VOLUME = "7",
YEAR = "1997",
NUMBER = "7",
MONTH = "October",
PAGES = "599-612",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149852"}
@article{bb154277,
AUTHOR = "Cooper, D. and Pridmore, T.P. and Taylor, N.",
TITLE = "Towards the Recovery of Extrinsic Camera Parameters from
Video Records of Sewer Surveys",
JOURNAL = MVA,
VOLUME = "11",
YEAR = "1998",
NUMBER = "2",
MONTH = "October",
PAGES = "53-63",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149853"}
@article{bb154278,
AUTHOR = "Zingaretti, P. and Zanoli, S.M.",
TITLE = "Robust Real Time Detection of an Underwater Pipeline",
JOURNAL = EngAAI,
VOLUME = "11",
YEAR = "1998",
NUMBER = "2",
MONTH = "April",
PAGES = "257-268",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149854"}
@article{bb154279,
AUTHOR = "Xu, K. and Luxmoore, A.R. and Davies, T.",
TITLE = "Sewer Pipe Deformation Assessment by Image-Analysis of Video Surveys",
JOURNAL = PR,
VOLUME = "31",
YEAR = "1998",
NUMBER = "2",
MONTH = "February",
PAGES = "169-180",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149855"}
@article{bb154280,
AUTHOR = "Kim, T.H. and Cho, T.H. and Moon, Y.S. and Park, S.H.",
TITLE = "Visual inspection system for the classification of solder joints",
JOURNAL = PR,
VOLUME = "32",
YEAR = "1999",
NUMBER = "4",
MONTH = "April",
PAGES = "565-575",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149856"}
@article{bb154281,
AUTHOR = "Boyer, K.L. and Ozguner, T.",
TITLE = "Robust online detection of pipeline corrosion from range data",
JOURNAL = MVA,
VOLUME = "12",
YEAR = "2001",
NUMBER = "6",
PAGES = "291-304",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149857"}
@article{bb154282,
AUTHOR = "Aluze, D. and Merienne, F. and Dumont, C. and Gorria, P.",
TITLE = "Vision system for defect imaging, detection, and characterization on a
specular surface of a 3D object",
JOURNAL = IVC,
VOLUME = "20",
YEAR = "2002",
NUMBER = "8",
MONTH = "June",
PAGES = "569-580",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149858"}
@article{bb154283,
AUTHOR = "Kaftandjian, V. and Dupuis, O. and Babot, D. and Zhu, Y.M.",
TITLE = "Uncertainty modelling using Dempster-Shafer theory for improving
detection of weld defects",
JOURNAL = PRL,
VOLUME = "24",
YEAR = "2003",
NUMBER = "1-3",
MONTH = "January",
PAGES = "547-564",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149859"}
@article{bb154284,
AUTHOR = "Shirai, Y.",
TITLE = "Automatic inspection of x-ray photograph of welding",
JOURNAL = PR,
VOLUME = "1",
YEAR = "1969",
NUMBER = "4",
MONTH = "July",
PAGES = "257-258",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149860"}
@inproceedings{bb154285,
AUTHOR = "Kim, J.H.",
TITLE = "Method and apparatus for inspecting solder joints",
BOOKTITLE = US_Patent,
YEAR = "2000",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149861"}
@inproceedings{bb154286,
AUTHOR = "Michael, D.J. and Wallack, A.S.",
TITLE = "Machine vision method using search models to find features
in three-dimensional images",
BOOKTITLE = US_Patent,
YEAR = "2003",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149862"}
@article{bb154287,
AUTHOR = "Iyer, S. and Sinha, S.I.K.",
TITLE = "A robust approach for automatic detection and segmentation of cracks in
underground pipeline images",
JOURNAL = IVC,
VOLUME = "23",
YEAR = "2005",
NUMBER = "10",
MONTH = "September",
PAGES = "921-933",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149863"}
@article{bb154288,
AUTHOR = "Sinha, S.I.K. and Fieguth, P.W.",
TITLE = "Morphological segmentation and classification of underground pipe
images",
JOURNAL = MVA,
VOLUME = "17",
YEAR = "2006",
NUMBER = "1",
MONTH = "April",
PAGES = "21-31",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149864"}
@inproceedings{bb154289,
AUTHOR = "Fieguth, P.W. and Sinha, S.I.K.",
TITLE = "Automated analysis and detection of cracks in underground scanned pipes",
BOOKTITLE = ICIP99,
YEAR = "1999",
PAGES = "IV:395-399",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149865"}
@article{bb154290,
AUTHOR = "Pachidis, T.P. and Tarchanidis, K.N. and Lygouras, J.N. and Tsalides, P.G.",
TITLE = "Robot Path Generation Method for a Welding System Based on Pseudo
Stereo Visual Servo Control",
JOURNAL = JASP,
VOLUME = "2005",
YEAR = "2005",
NUMBER = "14",
PAGES = "2268-2280",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149866"}
@article{bb154291,
AUTHOR = "Felisberto, M.K. and Lopes, H.S. and Centeno, T.M. and Ramos de Arruda, L.V.",
TITLE = "An object detection and recognition system for weld bead extraction
from digital radiographs",
JOURNAL = CVIU,
VOLUME = "102",
YEAR = "2006",
NUMBER = "3",
MONTH = "June",
PAGES = "238-249",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149867"}
@article{bb154292,
AUTHOR = "Chiu, S.N. and Perng, M.H.",
TITLE = "Reflection-area-based feature descriptor for solder joint inspection",
JOURNAL = MVA,
VOLUME = "18",
YEAR = "2007",
NUMBER = "2",
MONTH = "April",
PAGES = "95-106",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149868"}
@article{bb154293,
AUTHOR = "Schalk, P. and Ofner, R. and O'Leary, P.",
TITLE = "Pipe eccentricity measurement using laser triangulation",
JOURNAL = IVC,
VOLUME = "25",
YEAR = "2007",
NUMBER = "7",
MONTH = "July",
PAGES = "1194-1203",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149869"}
@article{bb154294,
AUTHOR = "Kannala, J.H. and Brandt, S.S. and Heikkila, J.",
TITLE = "Measuring and modelling sewer pipes from video",
JOURNAL = MVA,
VOLUME = "19",
YEAR = "2008",
NUMBER = "2",
MONTH = "March",
PAGES = "73-83",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149870"}
@article{bb154295,
AUTHOR = "Fennander, H. and Kyrki, V. and Fellman, A. and Salminen, A. and Kalviainen, H.",
TITLE = "Visual measurement and tracking in laser hybrid welding",
JOURNAL = MVA,
VOLUME = "20",
YEAR = "2009",
NUMBER = "2",
MONTH = "February",
PAGES = "xx-yy",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149871"}
@article{bb154296,
AUTHOR = "Gao, X. and Ding, D. and Bai, T. and Katayama, S.",
TITLE = "Weld-pool image centroid algorithm for seam-tracking vision model in
arc-welding process",
JOURNAL = IET-IPR,
VOLUME = "5",
YEAR = "2011",
NUMBER = "5",
PAGES = "410-419",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149872"}
@article{bb154297,
AUTHOR = "Herakovic, N. and Simic, M. and Trdic, F. and Skvarc, J.",
TITLE = "A machine-vision system for automated quality control of welded rings",
JOURNAL = MVA,
VOLUME = "22",
YEAR = "2011",
NUMBER = "6",
MONTH = "November",
PAGES = "967-981",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149873"}
@article{bb154298,
AUTHOR = "Yun, J.P. and Jeon, Y.J. and Choi, D.C. and Kim, S.W.",
TITLE = "Real-time defect detection of steel wire rods using wavelet filters
optimized by univariate dynamic encoding algorithm for searches",
JOURNAL = JOSA-A,
VOLUME = "29",
YEAR = "2012",
NUMBER = "5",
MONTH = "May",
PAGES = "797-807",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149874"}
@article{bb154299,
AUTHOR = "Jeon, Y.J. and Choi, D.C. and Lee, S.J. and Yun, J.P. and Kim, S.W.",
TITLE = "Defect detection for corner cracks in steel billets using a wavelet
reconstruction method",
JOURNAL = JOSA-A,
VOLUME = "31",
YEAR = "2014",
NUMBER = "2",
MONTH = "February",
PAGES = "227-237",
BIBSOURCE = "http://www.visionbib.com/bibliography/applicat838.html#TT149875"}
Last update:Oct 15, 2018 at 09:19:25